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INSERT INTO `wp_posts` VALUES (1,2,'2018-01-12 10:57:32','2018-01-12 18:57:32','<p><strong>Channel Modeling<br /></strong>Improve EDA method and signal integrity training. Proven field solver analysis, de-embedding to 70 GHz. Wild River Technology runs this as signal integrity program<b>.</b></p>\r\n<p style=\"padding-left: 30px;\"><strong>What do industry experts think?</strong><br /><br /><em>\"CMP-28 channel modeling platform from Wild River Technology validates manufacturing, measurements and modeling of PCB interconnects up to 50 GHz. I recommend it to every SI engineer using or developing accurate and productive tools.\"</em><br /><strong>Yuriy Shlepnev, Ph.D., President, Simberian Inc.<br /><br /></strong><em>\"The CMP-28 channel modeling platform from Wild River Technology is a versatile channel modeling platform. During my recent research into modeling conductor surface roughness, I relied on trusted measurement data for simulation correlation, and achieved excellent results.\"</em><strong><br />Bert Simonovich, Consultant &amp; Founder, LAMSIM Enterprises Inc.</strong><br /><br /><em>“Users can now simulate the behavior of a high-speed channel and easily check the simulated results against real measured data. This not only gives users more confidence in their results but also helps them avoid common issues.</em><strong>\"<br />Dr. Klaus Krohne, Market Development Manager EDA, CST</strong></p>\r\n<p><strong>Custom Signal Integrity Test Vehicles Using Customer Stack-Up<br /></strong>To 70 GHz, test stack-up, mitigate risk in projects: power integrity and signal integrity, EDA optimization of all crux elements in your design, achieve Tier 1 of IEEE P370.</p>\r\n<p><strong>Serial Link Analysis<br /></strong>To 112GHz for advanced SerDes characterization.</p>\r\n<p><strong>Signal Integrity Test Fixtures<br /></strong>To 70 GHz, custom-designed test fixtures, reasonable NRE costs.</p>\r\n<p style=\"padding-left: 30px;\"><em>“I think of your team as developing the best test fixtures on the planet</em><strong>.\"<br />Jim Nadolny, Chief Technologist Officer, Samtec</strong></p>\r\n<p><strong>Signal Integrity Consulting Services<br /></strong>Connector launch design to 70GHz, backplane post layout analysis and initial design, de-embedding, serial link system debug, cable and system testing.</p>','Wild River Technology: What We Do','','publish','open','open','','what-we-do','','','2018-01-12 10:57:32','2018-01-12 18:57:32','',0,'https://testsite.wildrivertech.com/2018/01/12/what-we-do/',13,'post','',0),(2,2,'2018-01-12 11:08:23','0000-00-00 00:00:00','<p>Lorem ipsum dolor sit amet, consectetur adipiscing elit. Vivamus semper fermentum tellus vitae iaculis. Nunc ut tempus diam, vitae volutpat purus. Aliquam pretium ac nisi a scelerisque. Vestibulum eget nunc quis felis tincidunt tempor vel id eros. Morbi euismod justo et orci suscipit, nec scelerisque turpis sagittis. Nunc in placerat tortor. Praesent gravida lorem gravida, varius risus eu, fermentum ipsum. Nunc fringilla massa sem, nec iaculis massa posuere eu. Etiam a purus ac tortor vestibulum auctor. Sed congue arcu enim, a facilisis nisi accumsan ut.</p>\n<!--more-->\n<p>Etiam egestas enim fringilla tellus eleifend lobortis. Morbi mattis nisi risus, ac laoreet odio pellentesque vel. Proin congue semper massa vel efficitur. Nullam enim quam, accumsan sed lacinia et, ultrices vel sem. Duis vitae nunc at neque bibendum hendrerit ut a mauris. Suspendisse potenti. Donec at suscipit augue. Fusce nisl sem, lobortis in aliquam ac, posuere sed ligula. Aenean non vestibulum sapien, at iaculis eros. Morbi ac tellus cursus, egestas metus a, aliquam dui. Proin euismod diam eget justo fringilla, malesuada ullamcorper ex molestie. Proin ultrices dui ut sagittis sodales. Praesent est velit, ultricies sit amet magna nec, vestibulum aliquam turpis. Morbi porttitor arcu dolor, ut mattis urna cursus ut. Proin aliquet nisl sit amet tellus suscipit fringilla.</p><p>Donec quis auctor justo. Integer tristique interdum velit in egestas. Etiam nisi mauris, posuere vitae pretium sed, fermentum vitae magna. Curabitur gravida lacus et ligula efficitur sagittis. Nulla fermentum congue eros, eu posuere velit suscipit in. Nulla volutpat metus in quam porttitor tincidunt. Nam a dictum nisi, maximus rhoncus elit. Morbi ornare porta pulvinar. Aenean facilisis, tellus at lacinia bibendum, velit nisi convallis magna, viverra accumsan magna nunc rutrum magna. Pellentesque blandit mollis justo. Etiam eu pretium eros. In at metus libero. Maecenas pharetra ultricies interdum. Cras quis urna eget odio venenatis sodales. Maecenas euismod velit quis rutrum placerat. </p>','Lorem Ipsum','','draft','open','open','','lorem-ipsum','','','2018-01-12 11:08:23','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=2',0,'post','',0),(3,2,'2018-01-12 11:08:23','0000-00-00 00:00:00','<p>Lorem ipsum dolor sit amet, consectetur adipiscing elit. Vivamus semper fermentum tellus vitae iaculis. Nunc ut tempus diam, vitae volutpat purus. Aliquam pretium ac nisi a scelerisque. Vestibulum eget nunc quis felis tincidunt tempor vel id eros. Morbi euismod justo et orci suscipit, nec scelerisque turpis sagittis. Nunc in placerat tortor. Praesent gravida lorem gravida, varius risus eu, fermentum ipsum. Nunc fringilla massa sem, nec iaculis massa posuere eu. Etiam a purus ac tortor vestibulum auctor. Sed congue arcu enim, a facilisis nisi accumsan ut.</p>\n<!--more-->\n<p>Etiam egestas enim fringilla tellus eleifend lobortis. Morbi mattis nisi risus, ac laoreet odio pellentesque vel. Proin congue semper massa vel efficitur. Nullam enim quam, accumsan sed lacinia et, ultrices vel sem. Duis vitae nunc at neque bibendum hendrerit ut a mauris. Suspendisse potenti. Donec at suscipit augue. Fusce nisl sem, lobortis in aliquam ac, posuere sed ligula. Aenean non vestibulum sapien, at iaculis eros. Morbi ac tellus cursus, egestas metus a, aliquam dui. Proin euismod diam eget justo fringilla, malesuada ullamcorper ex molestie. Proin ultrices dui ut sagittis sodales. Praesent est velit, ultricies sit amet magna nec, vestibulum aliquam turpis. Morbi porttitor arcu dolor, ut mattis urna cursus ut. Proin aliquet nisl sit amet tellus suscipit fringilla.</p><p>Donec quis auctor justo. Integer tristique interdum velit in egestas. Etiam nisi mauris, posuere vitae pretium sed, fermentum vitae magna. Curabitur gravida lacus et ligula efficitur sagittis. Nulla fermentum congue eros, eu posuere velit suscipit in. Nulla volutpat metus in quam porttitor tincidunt. Nam a dictum nisi, maximus rhoncus elit. Morbi ornare porta pulvinar. Aenean facilisis, tellus at lacinia bibendum, velit nisi convallis magna, viverra accumsan magna nunc rutrum magna. Pellentesque blandit mollis justo. Etiam eu pretium eros. In at metus libero. Maecenas pharetra ultricies interdum. Cras quis urna eget odio venenatis sodales. Maecenas euismod velit quis rutrum placerat. </p>','Dolor sit amet','','draft','open','open','','dolor-sit-amet','','','2018-01-12 11:08:23','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=3',1,'post','',0),(4,2,'2018-01-12 11:08:23','0000-00-00 00:00:00','<p>Lorem ipsum dolor sit amet, consectetur adipiscing elit. Vivamus semper fermentum tellus vitae iaculis. Nunc ut tempus diam, vitae volutpat purus. Aliquam pretium ac nisi a scelerisque. Vestibulum eget nunc quis felis tincidunt tempor vel id eros. Morbi euismod justo et orci suscipit, nec scelerisque turpis sagittis. Nunc in placerat tortor. Praesent gravida lorem gravida, varius risus eu, fermentum ipsum. Nunc fringilla massa sem, nec iaculis massa posuere eu. Etiam a purus ac tortor vestibulum auctor. Sed congue arcu enim, a facilisis nisi accumsan ut.</p>\n<!--more-->\n<p>Etiam egestas enim fringilla tellus eleifend lobortis. Morbi mattis nisi risus, ac laoreet odio pellentesque vel. Proin congue semper massa vel efficitur. Nullam enim quam, accumsan sed lacinia et, ultrices vel sem. Duis vitae nunc at neque bibendum hendrerit ut a mauris. Suspendisse potenti. Donec at suscipit augue. Fusce nisl sem, lobortis in aliquam ac, posuere sed ligula. Aenean non vestibulum sapien, at iaculis eros. Morbi ac tellus cursus, egestas metus a, aliquam dui. Proin euismod diam eget justo fringilla, malesuada ullamcorper ex molestie. Proin ultrices dui ut sagittis sodales. Praesent est velit, ultricies sit amet magna nec, vestibulum aliquam turpis. Morbi porttitor arcu dolor, ut mattis urna cursus ut. Proin aliquet nisl sit amet tellus suscipit fringilla.</p><p>Donec quis auctor justo. Integer tristique interdum velit in egestas. Etiam nisi mauris, posuere vitae pretium sed, fermentum vitae magna. Curabitur gravida lacus et ligula efficitur sagittis. Nulla fermentum congue eros, eu posuere velit suscipit in. Nulla volutpat metus in quam porttitor tincidunt. Nam a dictum nisi, maximus rhoncus elit. Morbi ornare porta pulvinar. Aenean facilisis, tellus at lacinia bibendum, velit nisi convallis magna, viverra accumsan magna nunc rutrum magna. Pellentesque blandit mollis justo. Etiam eu pretium eros. In at metus libero. Maecenas pharetra ultricies interdum. Cras quis urna eget odio venenatis sodales. Maecenas euismod velit quis rutrum placerat. </p>','Consectetur adipiscing elit','','draft','open','open','','consectetur-adipiscing-elit','','','2018-01-12 11:08:23','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=4',2,'post','',0),(5,2,'2018-01-12 11:08:23','0000-00-00 00:00:00','<p>Lorem ipsum dolor sit amet, consectetur adipiscing elit. Vivamus semper fermentum tellus vitae iaculis. Nunc ut tempus diam, vitae volutpat purus. Aliquam pretium ac nisi a scelerisque. Vestibulum eget nunc quis felis tincidunt tempor vel id eros. Morbi euismod justo et orci suscipit, nec scelerisque turpis sagittis. Nunc in placerat tortor. Praesent gravida lorem gravida, varius risus eu, fermentum ipsum. Nunc fringilla massa sem, nec iaculis massa posuere eu. Etiam a purus ac tortor vestibulum auctor. Sed congue arcu enim, a facilisis nisi accumsan ut.</p>\n<!--more-->\n<p>Etiam egestas enim fringilla tellus eleifend lobortis. Morbi mattis nisi risus, ac laoreet odio pellentesque vel. Proin congue semper massa vel efficitur. Nullam enim quam, accumsan sed lacinia et, ultrices vel sem. Duis vitae nunc at neque bibendum hendrerit ut a mauris. Suspendisse potenti. Donec at suscipit augue. Fusce nisl sem, lobortis in aliquam ac, posuere sed ligula. Aenean non vestibulum sapien, at iaculis eros. Morbi ac tellus cursus, egestas metus a, aliquam dui. Proin euismod diam eget justo fringilla, malesuada ullamcorper ex molestie. Proin ultrices dui ut sagittis sodales. Praesent est velit, ultricies sit amet magna nec, vestibulum aliquam turpis. Morbi porttitor arcu dolor, ut mattis urna cursus ut. Proin aliquet nisl sit amet tellus suscipit fringilla.</p><p>Donec quis auctor justo. Integer tristique interdum velit in egestas. Etiam nisi mauris, posuere vitae pretium sed, fermentum vitae magna. Curabitur gravida lacus et ligula efficitur sagittis. Nulla fermentum congue eros, eu posuere velit suscipit in. Nulla volutpat metus in quam porttitor tincidunt. Nam a dictum nisi, maximus rhoncus elit. Morbi ornare porta pulvinar. Aenean facilisis, tellus at lacinia bibendum, velit nisi convallis magna, viverra accumsan magna nunc rutrum magna. Pellentesque blandit mollis justo. Etiam eu pretium eros. In at metus libero. Maecenas pharetra ultricies interdum. Cras quis urna eget odio venenatis sodales. Maecenas euismod velit quis rutrum placerat. </p>','Vivamus semper fermentum','','draft','open','open','','vivamus-semper-fermentum','','','2018-01-12 11:08:23','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=5',4,'post','',0),(6,2,'2018-01-12 14:24:31','2018-01-12 22:24:31','<h2>How Interconnects Work™: Coaxial connector launch localization.</h2>\r\n<p><iframe src=\"https://www.youtube.com/embed/LhQGmgUCxpk\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"></iframe></p>','How Interconnects Work: Coaxial Connector Launch Localization','','publish','open','open','','how-interconnects-work-coaxial-connector-launch-localization','','','2018-01-12 14:24:31','2018-01-12 22:24:31','',0,'https://testsite.wildrivertech.com/2018/01/12/how-interconnects-work-coaxial-connector-launch-localization/',1,'post','',0),(7,2,'2018-01-12 14:36:47','2018-01-12 22:36:47','<p>This video is a technical presentation given by Al Neves, chief technologist of Wild River Technology and Yuriy Shlepnev, president of Simberian Incorporated.</p>\r\n<p><iframe src=\"https://www.youtube.com/embed/r4PELP0gn-Y\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"></iframe></p>','Four Essential Steps for EDA Simulation to Measurement Mastery','','publish','open','open','','4-essential-steps-for-eda-simulation-to-measurement-mastery','','','2018-01-12 14:36:47','2018-01-12 22:36:47','',0,'https://testsite.wildrivertech.com/2018/01/12/4-essential-steps-for-eda-simulation-to-measurement-mastery/',6,'post','',0),(8,2,'2018-01-12 14:37:28','2018-01-12 22:37:28','<p>Analysis to measurement correlation of eye diagram for PCB interconnects in Simbeor THz electromagnetic signal integrity software.</p>\r\n<p><iframe src=\"https://www.youtube.com/embed/562pQB_8zsY\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"></iframe></p>','Eye Diagram Analysis in Simbeor THz','','publish','open','open','','eye-diagram-analysis-in-simbeor-thz','','','2018-01-12 14:37:28','2018-01-12 22:37:28','',0,'https://testsite.wildrivertech.com/2018/01/12/eye-diagram-analysis-in-simbeor-thz/',5,'post','',0),(9,2,'2018-01-12 14:38:16','2018-01-12 22:38:16','<p>Broadband dielectric and conductor roughness model identification for analysis of PCB/packaging interconnect with SPP \"light\" technique in Simbeor THZ electromagnetic signal integrity software.</p>\r\n<p><iframe src=\"https://www.youtube.com/embed/Gub36vJVLwY\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"></iframe></p>','Material Model Identification in Simbeor THz','','publish','open','open','','material-model-identification-in-simbeor-thz','','','2018-01-12 14:38:16','2018-01-12 22:38:16','',0,'https://testsite.wildrivertech.com/2018/01/12/material-model-identification-in-simbeor-thz/',4,'post','',0),(10,2,'2018-01-12 14:39:02','2018-01-12 22:39:02','<p>Test fixture extraction and de-embedding in Simbeor THz electromagnetic signal integrity software</p>\r\n<p><iframe src=\"https://www.youtube.com/embed/QTJDz1a0LPA\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"></iframe></p>','De-Embedding in Simbeor THz','','publish','open','open','','deembedding-in-simbeor-thz','','','2018-01-12 14:39:02','2018-01-12 22:39:02','',0,'https://testsite.wildrivertech.com/2018/01/12/deembedding-in-simbeor-thz/',3,'post','',0),(11,2,'2018-01-12 14:39:47','2018-01-12 22:39:47','<p>Pre-layout compliance analysis of PCB interconnects with crosstalk in Simbeor THz electromagnetic signal integrity software.</p>\r\n<p><iframe src=\"https://www.youtube.com/embed/0sBRjLNZkLU\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"></iframe></p>','Crosstalk Compliance Analysis in Simbeor THz','','publish','open','open','','cross-talk-compliance-analysis-in-simbeor-thz','','','2018-01-12 14:39:47','2018-01-12 22:39:47','',0,'https://testsite.wildrivertech.com/2018/01/12/cross-talk-compliance-analysis-in-simbeor-thz/',2,'post','',0),(12,2,'2018-01-12 14:44:13','2018-01-12 22:44:13','<p>Invitation to Wild River Technology\'s technical webinar on \"Reducing the Confidence Gap with Channel Modeling.\" Contains a small amount of the actual presentation.</p>\r\n<p><iframe src=\"https://www.youtube.com/embed/vUB77mAVWXQ\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"></iframe></p>','Channel Modeling Webinar','','publish','open','open','','channel-modeling-webinar','','','2018-01-12 14:44:13','2018-01-12 22:44:13','',0,'https://testsite.wildrivertech.com/2018/01/12/channel-modeling-webinar/',0,'post','',0),(13,2,'2013-12-23 06:48:45','0000-00-00 00:00:00','<p>Anritsu Co., as part of its commitment to develop innovative test solutions to meet the needs of signal integrity engineers, announces a working cooperation with Wild River Technology. The two companies are collaborating to provide test solutions that meet the rigorous test requirements associated with high-speed serial data interconnects, SERDES testing, cables, and backplanes used in Next Generation Networks (NGNs).<br /><br />As part of the cooperation, Anritsu has introduced the Wild River Technology CMP-28 and CMP-32 Channel Modeling Platforms (CMPs) as complements to the Anritsu VectorStar™ MS4640B Vector Network Analyzer (VNA) series. Together, the CMP platforms and VectorStar provide a means of accurately verifying measurement-simulation correlation for signal integrity engineers and designers working on high-speed systems ranging from 6 to 32 Gbps data rates.  CMP-28 is aimed at developers working up to 28 Gbps and CMP-32 for rates up to 32 Gbps.<br /><br />Users make S-parameter measurements of the CMP platform structures with VectorStar and then compare the results with the predictions of a 3D-EM simulator based on the supplied dimensional and dielectric properties of the structures. Together, the CMP platform and VectorStar enable signal integrity engineers to have fewer design cycles through validation of measurement-simulation correspondence and have greater confidence in first-turn design success. This removes the need to develop custom channel modeling platforms, improves the designer’s confidence and speeds time-to-market.<br /><br />Using either the CMP-28 and CMP-32 platform together with VectorStar delivers a more reliable assessment of measurement-simulation correspondence due to the inherent accuracy of the MS4640B Vector Star’s S-parameter measurements. In large part this is due to VectorStar’s ability to deliver high-quality low-frequency measurements, which are critical for DC-point estimation as required for accurate time domain simulations fidelity of high-speed systems.  This is achieved through use of an innovative bridge/coupler hybrid architecture that provides high dynamic range results at low and high frequencies alike.  The VectorStar family includes models with available frequency ranges extending from 70 KHz to 70 GHz and extensions for broadband measurements from 70 kHz to 110 GHz.<br /><br />The introduction of the CMP-28 and CMP-32 Channel Modeling Platforms further adds to the range of Signal Integrity solutions from Anritsu Company, including the MS4640B VectorStar Vector Network Analyzer family and the 32 Gbps MP1800A BERT Signal Quality Analyzer. </p>','Anritsu teams with Wild River Technology to develop signal integrity test solutions','','draft','open','open','','anritsu-teams-with-wild-river-technology-to-develop-signal-integrity-test-solutions','','','2013-12-23 06:48:45','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=13',13,'post','',0),(14,2,'2018-01-12 14:52:42','0000-00-00 00:00:00','<p>Santa Clara, CA, USA, January 21, 2016: CST – Computer Simulation Technology (CST) and Wild River Technology (WRT) present first results of their cooperation, aimed to demonstrate the correlation of simulation and measurement for high speed digital design at DesignCon 2016, Booth # 627.<br /><br />New technologies such as DDR 4 and in particular SerDes are pushing electronics to higher speeds.This has increased the need for 3D electromagnetic field simulation in the design process to identify and help avoid signal integrity (SI) and power integrity (PI) issues. To simulate devices accurately, design engineers working in this field require accurate broadband models for interconnects and transmission lines, which need to include effects such as conductor surface roughness and dispersion in dielectric materials. Being able to validate the results against benchmarks increases the engineer’s confidence in the simulation.<br /><br />Engineers in leading companies in the electronics industry use the CST STUDIO SUITE® software package to analyze Signal and Power integrity. With mature time-domain and frequency-domain solvers, CST® simulation tools have a strong background in applications from classical microwave into the terahertz regime and are well suited to the challenges of high-speed digital design. Wild River Technology meanwhile markets products for high-speed signal integrity engineers who need to characterize high-speed digital systems very accurately. Through the cooperation of CST and WRT, simulations can now be verified against measurements using the CMP-28 Channel Modeling Platform. This is powerful tool for the development of high-speed systems, and includes a range of structures for benchmarking 3D EM simulations and verifying simulation and measurement methods.<br /><br />“A strong correlation between measurement and simulation is absolutely critical to the successful use of the simulation tools,” said Dr. Klaus Krohne, Market Development Manager EDA, CST. “This cooperation with Wild River Technology means that users can now simulate the behavior of a highspeed channel and then easily check the simulated results against real measured data. This will not only give users more confidence in their results but also help them to avoid some of the common measurement or simulation mistakes that can slow down the development process.”</p>','CST and Wild River Technology cooperate to demonstrate measurement/simulation correlation','','draft','open','open','','cst-and-wild-river-technology-cooperate-to-demonstrate-measurement-simulation-correlation','','','2018-01-12 14:52:42','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=14',11,'post','',0),(15,2,'2017-03-23 07:55:35','0000-00-00 00:00:00','<div class=\"article-toolbar\"> </div>\r\n<div class=\"image\"><img src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/4102_Thumb.jpg?1490385251\" /></div>\r\n<div class=\"content\">\r\n<div class=\"body article-body\">\r\n<p>Since the IEEE 802.3bj 100 Gb/s Backplane Ethernet standard has been officially approved, Channel Operating Margin (COM) will likely become an important quality-evaluation method for SERDES links. Although COM was preceded by a long history of eye/BER evaluation techniques, those methods have never been officially standardized. Different tools used their own smart approaches to find a channel characterization response, to select the optimal sampling location and properly center the eye or BER diagram on the plot, to find optimal equalization parameters, and to evaluate the effect of ISI, jitter noise, and crosstalk. There is an IBIS standard (IBIS 5.0 to 6.2) that describes the use of Algorithmic Model Interface (IBIS-AMI) models, but it mostly defines the rules describing how a simulation platform interacts with the model libraries, calls their interface functions, forms inputs, and reads the output parameters. Overall, many decisions – especially those regarding channel characterization, waveform processing, data accumulation, and impairment handling, are left for the developers. Not surprisingly, among many tools available on the market, we can hardly find two that produce identical results and in some cases the differences can be significant.</p>\r\n<p>It appears therefore that one of the goals for COM was to minimize ambiguity in finding the signal/noise ratio, a measure closely related to BER. COM starts from a set of S-parameters describing victim and aggressors’ channels. It doesn’t employ time-domain responses directly, as do many tools that run SPICE-level simulation considering non-linear models of Tx and Rx buffers. Instead, after a series of transformations, it finds the effective transfer function of the channel and converts it into a time response by IFFT. This way, it avoids a great deal of ambiguity caused by the SPICE type of modeling and simulation.  For a given operating mode all of the necessary parameters needed to calculate COM are defined within, that minimizes any ambiguity.  These parameters include symbol rate, number of signaling levels, package parameters, impedance mismatch, transmit and receive noise, equalization types, the number and the limits for tap coefficients, jitter characteristics, and more. It even goes into such details as required frequency limits and resolution for S-parameters, the number of samples per bit in the impulse response, and meshing used when calculating probability mass functions describing the distribution of the eye density at the chosen cross-section.</p>\r\n<p> </p>\r\n<p>Mathematically, COM is equivalent to statistical analysis, but performs it only for one vertical cross-section of the eye diagram that corresponds to the “best” sampling time. Therefore, it is reasonable to compare COM with statistical eyes, rather than with bit-by-bit analysis which is often unable to provide sufficient sample size. Such a comparison was made previously in a number of works [6, 7, and 8]. Most of them indicate that although both metrics reliably distinguish high- and low-quality channels, the “border” cases remain inconclusive since the compliance results do not agree. The authors give examples of false-positive and false-negative cases and try to explain the difference by certain features of the links that differently affect the BER and COM numbers. We don’t think, however, that a fair comparison is possible when we compare two flows where the first is non-standardized (BER) and the second follows precise instructions (COM). What may be more reasonable is an incremental comparison between BER and COM, which assumes that every computational step starts from identical input. There are many items on which BER and COM may disagree, and we will analyze them in Section I. We’ll show that most of these discrepancies are caused by different assumptions, or by different input data. There are only two aspects of the analysis where we believe that COM makes some oversimplifications affecting the accuracy of the results. This is where it computes contributions from the input jitter and crosstalk. We’ll discuss the assumptions and their potential effects on jitter evaluation in Section II. In Section III we suggest a more accurate way of finding crosstalk contribution. In Section IV we provide a simple method to calculate COM from eye-density and BER plot measurements. In Section V we perform a series of experiments with a set of S-parameters generated from experimental topologies mimicking the behavior of a variety of possible real-life designs. The collected results are post-processed and used to estimate the error introduced by the simplifying assumptions made in the COM algorithm for jitter and crosstalk computations. Finally, in the last section we present our conclusions.</p>\r\n<p><strong>Main Sources of Difference between BER and COM</strong></p>\r\n<p>Going through the steps constituting the BER and COM flows, we can identify a number of reasons causing differences between results:</p>\r\n<ol>\r\n<li>Channel characterization. Many EDA tools perform a detailed circuit simulation to find the response characterizing the channel. For example, they can find an “edge” response, showing the transition from one logical state to another. Or, they can apply a known periodic pattern (PRBS) and then find an equivalent channel’s response by deconvolution. In these cases, they consider non-linearity of the buffers, described by non-LTI IBIS models or by general SPICE-type sub-circuits, possibly with a transistor-level description of the buffers. In this case, the response they measure at the receiver pins is affected by non-linear models, and may contain the effect of common mode converted into differential at the receiver end. COM starts from S-parameters of the bare channel, and completely ignores non-LTI and common-mode effects.</li>\r\n<li>Since COM doesn’t use device models, it doesn’t know the exact package parameters. “Packages” in COM are “template approximations” of those that exist in devices, containing shunt capacitors and transmission lines.</li>\r\n<li>For similar reasons, COM doesn’t know the actual termination conditions that exist on both sides of the channel. In most cases, it assumes 55-ohm resistive termination, which is slightly different from 50-ohm S-parameter normalization impedance.</li>\r\n<li>COM considers a receiver noise filter, with a flat bandwidth of 75% of the data rate. Most eye/BER analyzers don’t have the characteristics of this filter and don’t apply it.</li>\r\n<li>In COM, the Tx equalizer has only one pre-tap and one post-tap, with a setup limit on the cursor values. Since the actual device might have a different architecture, its model (e.g., IBIS AMI) is likely to allow for different settings.</li>\r\n<li>CTLE used in COM is consistent with common practice, but optimization is performed for DC gain only. The poles’ frequencies are predefined for a given operation mode. If we allow full optimization of CTLE parameters, the result will likely be different.</li>\r\n<li>In the COM flow, Gaussian and dual-Dirac transmit jitter is computed by linearizing the pulse response and taking its slope at the selected sample points. Accurate statistical analysis requires a different approach. The effect of ISI and peak distortion is also affected by the input jitter; that’s why accurate statistical analysis computes the distribution that includes ISI and transmit jitter simultaneously. We’ll discuss this in more detail below, and also in Section II.</li>\r\n<li>In the COM procedure, optimization of equalizers’ parameters is made by considering a further simplified metric called FOM (figure of merit), to reduce the optimization time. However, with additional assumptions, e.g., regarding Gaussian distribution of all “noise” contributions, there is a considerable difference between the predicted (FOM) and the final (COM) measure. We cannot be sure that the choice of equalization parameters that gives us the best FOM also gives the best COM.</li>\r\n<li>Signal-to-noise ratio of the transmitter is rarely considered by BER analyzers. The same is true for receive noise.</li>\r\n<li>In COM, the contribution from aggressors is taken with the worst possible phase combinations, which may cause crosstalk overestimation. We’ll address this issue in Section III.</li>\r\n<li>Some of the operating modes in COM assume an error correction mechanism (FEC) and measure the noise amplitude against the larger BER threshold. This may not be the case for many BER evaluation tools.</li>\r\n</ol>\r\n<p>Most of the reasons listed above can be addressed by properly adjusting the data used in BER analysis. For example, we can find the channel response by repeating the COM flow: start from S parameters, find contributions from every driver, including all aggressors, convert partial 4-port parameters into differential-only mode, add packages as defined in COM, apply termination and convert the 2-port model into a scalar transfer function, then apply the receiver noise filter. The resulting function can be converted into step or pulse response by IFFT, and used in the eye/BER simulation tool as shown in Fig.1 below.</p>\r\n<p align=\"center\"><img style=\"width: 339px; height: 378px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fig-1.jpg\" alt=\"Fig 1\" /></p>\r\n<p align=\"center\"><em>Fig.1 COM to Eye/BER analysis flow</em></p>\r\n<p>With the non-equalized response taken from the COM engine, we can allow the eye/BER simulator to find its own settings for feed-forward equalization, CTLE, and DFE, or take those chosen by the COM approach when finding the best “figure of merit”. Finally, we can add the Tx and Rx noise defined by COM into eye/BER analysis.</p>\r\n<p>The issues mentioned in pp.7 require deeper consideration. When finding noise contribution from jitter by response linearization, we may end up with over or underestimation of jitter, which depends on the shape of the response and the chosen sampling position. Second, the effect of jitter must be searched by analyzing the edge response (not pulse — i.e., bit — response) because transmit jitter changes the distance between the edges and therefore affects the shape of the “pulse” response itself. We analyze this issue later in Section II. Regarding crosstalk (p.10), it would be more reasonable to assume that relative phases are random and have uniform distribution. With that, we can find the effective noise PDFs for different phases within 1UI and then find the average PDF by integrating over the unit interval.</p>\r\n<p><strong>Transmit Jitter Evaluation: Rigorous Way versus COM-Way</strong></p>\r\n<p>As shown earlier in e.g., [1-3], in the presence of jitter, the signal at the receive sampling location can be represented as</p>\r\n<p style=\"margin-left: .5in;\">          <img style=\"width: 442px; height: 46px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-1.jpg\" alt=\"Eq 1\" />   (1)</p>\r\n<p>In (1), <em>T</em> is a bit interval, <sub><img style=\"width: 16px; height: 17px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-2a.jpg\" alt=\"Eq 2a\" /></sub>are logical bit values, either [+1,-1] for PAM-2 or [-1, -1/3, +1/3, 1] for PAM-4, <img style=\"width: 23px; height: 17px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-2b.jpg\" alt=\"Eq 2b\" />is the channel’s step response, and,<img style=\"width: 55px; height: 16px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-2c.jpg\" alt=\"Eq 2c\" />represent the phase jitter injected at the transmitter and receiver.</p>\r\n<p>The receive jitter <img style=\"width: 25px; height: 15px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-2d1.jpg\" alt=\"Eq 2d\" />represents the difference between the intended and the actual sample time and can be characterized by its single probability distribution, typically on the eye diagram post-processing step. That’s why for now we exclude the receive jitter from consideration.</p>\r\n<p>If we assume that Tx jitter value <img style=\"width: 28px; height: 15px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-2e.jpg\" alt=\"Eq 2e\" />is small enough, the samples of the step response can be represented by two terms of the Taylor series:</p>\r\n<p>            <img style=\"width: 526px; height: 45px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-2-2.jpg\" alt=\"Eq 2-2\" />         (2)</p>\r\n<p>where <em>H(t)</em> is a Dirac impulse response, the derivative of the step response. Now, substitute (2) into (1):</p>\r\n<p><img style=\"width: 419px; height: 47px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-2-3.jpg\" alt=\"Eq 2-3\" />.                                  (3)</p>\r\n<p>Jitter linearization means that we consider formula (3) instead of (1) when finding the vertical noise contributions (into <em>y(t)</em>). Depending on the exact shape of the edge response and its derivative <em>H(t)</em>, the discrepancy between COM- and BER-way evaluation may go in different directions, as illustrated in Fig 2, cases A-C below. Sometimes, for a large variance of the transmit jitter, the linearized formula (3) (COM way) may give larger values of the vertical noise because the transformation is linear and therefore unbounded. If, however, the slope at the sample point is small, the effect of jitter doesn’t get into the final results.</p>\r\n<p align=\"center\"><img style=\"width: 502px; height: 386px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fig-2.jpg\" alt=\"Fig 2\" /></p>\r\n<p><em>Fig. 2 Vertical noise PDFs generated from jitter distributions with and without response linearization. Both methods give almost identical results when jitter is applied around point A. In point B, jitter effect is greatly underestimated with response linearization. Around point C, linearization leads to jitter overestimation</em></p>\r\n<p>The exact mechanism of how the timing jitter translates into a vertical noise is shown in Fig.2. The gray PDF curves (probability density functions) are shown at the bottom. We assume that jitter causes a random horizontal deviation of the sample point, as defined by these PDFs. This deviation translates into a vertical movement of the sampled value. At every particular location, the vertical distribution depends on the shape of the step response and jitter PDF. If the response is linearized around the sample point, the resulting noise PDF is similar by shape to the timing jitter. These PDFs are shown in blue. The accurate transformations result in a set of PDFs which are shaped differently at every sample location (brown). When the response can be approximated by a straight line (point A), both approaches give very similar PDFs. At point B, the slope of the curve is zero, therefore the linear transformation doesn’t produce any vertical noise (i.e., we have a Dirac-impulse PDF), whereas the accurate transformation shows a considerable vertical variation. In contrast to that, at point C the derivative of the step response is non-zero, and the linear transformation produces considerable vertical noise. However, since the step response doesn’t change much in the vicinity of point C, the accurate transformation produces a vertical PDF with much smaller variation.</p>\r\n<p>Note that properly designed statistical solvers, estimating the eye diagram and BER, do not apply linearization of the responses, but perform accurate transformation of horizontal jitter distribution into vertical noise. For that reason, they may give jitter estimates that differ from COM.</p>\r\n<p><strong>Jitter Variance at the Receiver Side When Considering Derivatives of the Step Response</strong></p>\r\n<p>Now that we have described potential implications caused by linearization, let’s still assume that the jitter variance is small and linearization doesn’t create considerable errors. If so, we can use (3) to find vertical noise variations caused by jitter. We assume here that the values of the transmit jitter are uncorrelated, have Gaussian distribution with a known standard deviation, and are independent from the pattern. There are two random factors in (3): the random difference between the coefficients and the random jitter itself. The variance of a product of two independent values with zero mean is the product of their variances. The first is the average of the squares of the difference: <img style=\"width: 136px; height: 20px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-3.jpg\" alt=\"Eq 3\" /> For an uncorrelated PAM-2 pattern, the four bit combinations in the pair <img style=\"width: 58px; height: 16px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-3-1a.jpg\" alt=\"Eq 3-1a\" />={-1,-1},{-1,+1},{+1,-1},{+1,+1} are equally probable. The difference therefore can be {0, 2, -2, 0} respectively, and the average square of the difference is 2. For PAM-4, we should consider 16 pair combinations taken from <sub><img style=\"width: 88px; height: 37px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-3-2.jpg\" alt=\"Eq 3-2\" /></sub>. We can show that this factor is 10/9. These numbers are two times the factor <img style=\"width: 150px; height: 38px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-3-3.jpg\" alt=\"Eq 3-3\" /> used in [4, formula 93A-29], where <em>L</em> denotes the number of signal levels. Therefore, the variance of the random “jitter noise” as seen at the Rx end becomes</p>\r\n<p style=\"margin-left: 1.5in;\"><img style=\"width: 232px; height: 50px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-4.jpg\" alt=\"Eq 4\" />                   (4)</p>\r\n<p>To add the effect of duty-cycle distortion (independent from random jitter), we add its term into (4) and get:</p>\r\n<p style=\"margin-left: 1.5in;\"><img style=\"width: 287px; height: 51px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-5.jpg\" alt=\"Eq 5\" />         (5)</p>\r\n<p><strong>Jitter Variance at the Receiver as Defined in COM Specification </strong></p>\r\n<p>To find the effect of jitter, COM uses derivatives of the bit response, not the edge response. The formula (93A-32) defined in [4] is equivalent (assuming that the differences accurately approximate the derivatives) to:</p>\r\n<p style=\"margin-left: 1.0in;\"><img style=\"width: 310px; height: 49px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-6.jpg\" alt=\"Eq 6\" />          (6)</p>\r\n<p>where <img style=\"width: 136px; height: 14px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-6-1.jpg\" alt=\"Eq 6-1\" /> is an equalized pulse or single bit response.</p>\r\n<p>Let’s compare (5) and (6). A derivative of the pulse response can be represented as:</p>\r\n<p><img style=\"width: 491px; height: 39px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-6-2.jpg\" alt=\"Eq 6-2\" /></p>\r\n<p>and the sum of squares of such derivatives is:</p>\r\n<p style=\"margin-left: 1.0in;\"><img style=\"width: 400px; height: 94px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-7.jpg\" alt=\"Eq 7\" />                      (7)</p>\r\n<p>Note that the sum in (5) is the first summand in (7). Hence, in addition to linearization, the IEEE COM standard introduces another error that can be measured as:</p>\r\n<p><img style=\"width: 504px; height: 45px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-7-1.jpg\" alt=\"Eq 7-1\" /></p>\r\n<p>By denoting <img style=\"width: 103px; height: 18px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-7-2.jpg\" alt=\"Eq 7-2\" />, we can express the relative error as:</p>\r\n<p style=\"margin-left: 1.5in;\"><img style=\"width: 205px; height: 99px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-8.jpg\" alt=\"Eq 8\" />                (8)</p>\r\n<p>Since the summation goes over all non-zero samples of the impulse response, expression (8) cannot exceed 1. The ratio between the IEEE COM definition (7) and the one found from (5) is:</p>\r\n<p style=\"margin-left: 1.0in;\"><img style=\"width: 205px; height: 97px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-9.jpg\" alt=\"Eq 9\" />                       (9)</p>\r\n<p>Note that (9) is non-negative but always less than 1. Therefore it appears that COM underestimates contributions from transmit jitter. Let’s see by how much.</p>\r\n<p>Below, we consider 10GBASE-KR channel, operating at 10.31 Gbps. First, we performed jitter evaluation for a channel without equalization. Its step response is shown in Fig.3a in red, and pulse response — the difference between the step response and its delayed copy — in blue. Fig.3b shows the derivatives of the step (red) and pulse (blue) responses. Note that these are quite different by magnitude around the point where the pulse response reaches its peak. This alone leads to underestimation of variance in the IEEE COM version by factor 0.64, and with the additional 2x factor in (5) makes it 0.32, as shown in Fig. 3c. It’s interesting to see how this ratio changes with bit rate. As we see from Fig.3d, at higher bit rate, the ratio goes further down and reaches 0.17 at 25 Gbps, which is equivalent by taking only sqrt(0.17)=0.46 of the Gaussian sigma or peak-to-peak sine jitter.     </p>\r\n<p align=\"center\">        <img style=\"width: 553px; height: 476px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fig-3-a-b-c-d--2.jpg\" alt=\"Fig 3 a b c d -2\" />   </p>\r\n<p><em>Fig.3 Non-equalized responses. Formulas (5) and (7) give considerably different estimations. (a) – non-equalized step and pulse responses; (b) – comparison of  the Dirac impulse and derivative of the pulse response; (c) – how the two variance estimates and their ratio change along 1UI. The star shows the chosen sampling location; (d) the ratio of the two estimates as a function of bit rate. </em> </p>\r\n<p>However, with an equalized response, the plots look different. Equalization modifies the response in such a way that rising and falling transitions occur “faster”. The correlation coefficients between neighbor samples defining the sum in the nominator of (8) and (9) gets smaller and the two jitter estimates become closer to each other. Another explanation is also possible: equalized step and pulse responses become closer to each other by magnidute, as seen in Fig.4a. Since the pulse response has two distinct slopes, rising and falling, it makes up for the factor “2” added in the step-response-based jitter evaluation. However, even for the equalized responses we see that the variance of jitter found from (7) is only 0.8 of the more accurate estimate suggested by (5).</p>\r\n<p style=\"margin-left: 120px;\">             <img style=\"width: 599px; height: 486px; float: left;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fig-4-a-b-c-d.jpg\" alt=\"Fig 4 a b c d\" /></p>\r\n<p><em>Fig.4 Equalized responses. The difference between jitter estimates is smaller. (a) – step and pulse responses; (b) – comparison of  the Dirac impulse and derivative of the pulse response; (c) – how the two variance estimates change along 1UI; (d) the ratio of the two estimates as a function of bit rate.</em></p>\r\n<p><strong>III.  Crosstalk Evaluation in COM and BER</strong></p>\r\n<p>Another important difference between the COM and BER approaches is how they evaluate the effect of crosstalk. Both start from forming the single-bit response. This is possible because jitter in the aggressor channels is often neglected. Crosstalk contribution is evaluated by taking the cursors of the pulse response and considering their magnitudes. The cursors are samples of the response taken with a constant step that equals the bit interval. As we see from Fig.5, depending on the initial phase within bit interval, we can get different sets of samples. Both COM and BER take these samples, and for every initial phase (typically, they consider 32 phase values within 1UI) find the PDF <img style=\"width: 57px; height: 16px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-10.jpg\" alt=\"Eq 10\" /> of the random value described by equation:</p>\r\n<p style=\"margin-left: 1.5in;\"><img style=\"width: 164px; height: 63px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-10a.jpg\" alt=\"Eq 10a\" />                                (10)</p>\r\n<p>In (10), the parameter <img style=\"width: 58px; height: 18px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-10b.jpg\" alt=\"Eq 10b\" /> designates initial phase, <img style=\"width: 44px; height: 22px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-10c.jpg\" alt=\"Eq 10b\" />are cursors of the pulse response, and <img style=\"width: 14px; height: 17px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-10d.jpg\" alt=\"Eq 10d\" /> are random, statistically independent symbol magnitudes. They could be either <img style=\"width: 38px; height: 17px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-10e.jpg\" alt=\"Eq 10e\" /> for PAM-2 or <img style=\"width: 89px; height: 37px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-10f.jpg\" alt=\"Eq 10f\" /> for PAM-4 modulation.</p>\r\n<p>   </p>\r\n<p align=\"center\"><img style=\"width: 502px; height: 306px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fig-5.jpg\" alt=\"Fig 5\" /></p>\r\n<p><em>Fig.5 Aggressor’s pulse response. The cursors can be taken with different initial phase, which affects the mean deviation and distribution of the crosstalk noise.</em></p>\r\n<p>A difference exists in how COM and BER consider initial phases. Accurate BER evaluation assumes that initial phases of the crosstalk input are random and uniformly distributed within 1UI. For that reason, it finds the averaged PDF of the crosstalk input by integrating the partial PDFs:</p>\r\n<p style=\"margin-left: 1.5in;\"><img style=\"width: 219px; height: 53px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-11.jpg\" alt=\"Fig 11\" />                                      (11)</p>\r\n<p>In the COM procedure, we first find the initial phase, for which the variance and standard deviation of the crosstalk noise is maximal: <img style=\"width: 161px; height: 43px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-11a.jpg\" alt=\"Fig 11a\" /> </p>\r\n<p>Then, we continue with the PDF found for this initial phase:</p>\r\n<p style=\"margin-left: 1.5in;\"><img style=\"width: 173px; height: 37px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12.jpg\" alt=\"Fig 12\" />                                       (12)</p>\r\n<p>Let’s see how big the effect of this choice on the crosstalk PDF could be. Take, for example, an equalized pulse response of the aggressor channel, as in Fig.6a. The zoomed portion of the same response around its peak value is also shown in Fig.6. The two peaks of the standard deviation in Fig.6b are evidently caused by the two prominent extremes of the pulse response. Note that the standard deviation of the crosstalk noise is a periodic function, with a period 1UI. The crosstalk PDF is also a periodic function (Fig6c). The contour lines encompass 20 orders of magnitude; therefore the vertical swing of the PDF is about plus/minus 10 sigma. In Fig.6d, we compare the PDF considered by COM (red), which is a cross-section taken at ~0.18UI in Fig.6c, and the averaged PDF computed by formula (11). As we see, the averaged PDF is not Gaussian and has a peak in the middle, caused by considerable contribution from the portions of the PDFs that have smaller deviation. The peak mean deviation is reflected, too: it defines how quickly the resulting PDF decreases with the offset. We can show that outside the mid portion, the accurate PDF is a peak mean-value PDF shifted down.</p>\r\n<p style=\"margin-left: 80px;\"><img style=\"width: 649px; height: 545px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-6.jpg\" alt=\"Fig 6\" /></p>\r\n<p align=\"center\"><em>Fig.6 Single-bit (pulse) response from the aggressor channel (a), standard deviation of the crosstalk noise versus initial phase (b), noise PDF as a function of phase (the contours span 20 orders of magnitude) (c), and a comparison between the averaged PDF (blue) and the one selected by COM (red) (d)</em></p>\r\n<p>If we converted both PDF functions into CDF and find the offsets at 1e-12, we’d get about 6% difference between the two estimations. At 1e-5, the difference is about 10%. Of course, the numbers can vary from case to case, but the general conclusion is that COM overestimates the effect of crosstalk.</p>\r\n<p><strong>How We Compare the Results from COM and BER Simulations</strong></p>\r\n<p>Finding correlation between COM and BER simulation results isn’t easy. There are some works [6, 7, and 8] that establish general correlation between BER and COM results, however they don’t compare the computation techniques and don’t try to put the results side-by-side. We are going to demonstrate a valid comparison technique.</p>\r\n<p>Many simulation tools that compute eye and BER plots can generate or import the step or pulse response of the victim and aggressor channels. They can also find the optimal equalization parameters or allow the user to set up them. And, they can also allow adding Tx and Rx jitter and noise. Some simulators of that kind take the responses found from SPICE-level simulation of the channels together with the buffer models. It is technically difficult to produce a single bit or step response for a non-linear channel driven by a logical buffer. By definition, both step and pulse response should be computed starting with zero initial conditions as they describe a single (one-sided) transition or pulse. Instead, the simulators produce the edge or bit responses, where the states are changing between “low” and “high” so that the responses have approximately double the magnitude expected for the step or pulse response.</p>\r\n<p style=\"margin-left: 80px;\"><img style=\"width: 684px; height: 480px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-7.jpg\" alt=\"Fig 7\" /></p>\r\n<p><em>Fig.7 Measuring signal and noise magnitude on a BER plot: COM report (a), position of the “signal” sample on the eye diagram (b), corresponding BER plot (c), and BER cut-off below 5e-6 to ease measurements</em></p>\r\n<p>There are several steps in COM and BER computations which may go differently. If we want to see how the numbers compare with identical input (most importantly – the same channel responses), it makes sense to take the responses generated by COM and use them in eye/BER simulation. In our implementation, we can save both pulse and step responses, equalized and non-equalized, as they were found along with COM evaluation. These responses can be taken as an input to the eye/BER-computation tool, by considering the 2X difference in magnitude.</p>\r\n<p>Since in BER analysis we reuse the victim’s primary response from COM, the magnitude of the “signal” is the same in both cases. It is defined by the chosen sample of the equalized pulse response, and can be taken from the COM report (Fig.7a). On the eye diagram, the signal magnitude can be found somewhere along the vertical cross-section that corresponds to the largest eye opening, while its vertical position (Y-coordinate) corresponds to the middle of the top (or bottom) branch of the eye, as in Fig.7b. The corresponding statistical BER plot, where we need to measure the offset at a specified BER level, could be fuzzy since it spans a wide range of probabilities (Fig.7c). If the tool allows, it’s convenient to set up the needed threshold and the eliminate BER profile below this level. The cut-off probability in Fig.7d is 5e-6, half the target detector error ratio, specified by COM for a chosen operation mode.</p>\r\n<p>The reason we take half of the specified level is the different normalization of BER in the eye/BER and COM procedures. As shown in [5], accurate BER evaluation is described by formula <img style=\"width: 137px; height: 20px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12a.jpg\" alt=\"Eq 12a\" /> where <img style=\"width: 12px; height: 18px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12b.jpg\" alt=\"Eq 12b\" />and <img style=\"width: 15px; height: 17px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12c.jpg\" alt=\"Eq 12c\" /> are the probabilities of transmitting bit ‘1’ or ‘0’ respectively, and <img style=\"width: 46px; height: 17px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12de.jpg\" alt=\"Eq 12de\" /> evaluate the probability of two possible errors: reading ‘1’ as ‘0’ or ‘0’ as ‘1’. For a DC balanced signal, <img style=\"width: 82px; height: 18px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12f.jpg\" alt=\"Eq 12f\" />  and (1) becomes <img style=\"width: 139px; height: 17px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12g.jpg\" alt=\"Eq 12g\" /> making the probability of error at very high or very low threshold equal 0.5. But the COM procedure considers only one branch of the eye diagram (e.g., the upper), and assumes that the corresponding CDF is normalized so that its full integral equals 1. </p>\r\n<p>From Fig.7d, we find that the eye opening at the specified BER level is 0.0203. Hence, the noise magnitude is: <img style=\"width: 256px; height: 21px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12h.jpg\" alt=\"Eq 12h\" /> From here, we can evaluate  <img style=\"width: 237px; height: 20px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Eq-12i.jpg\" alt=\"Eq 12i\" /> This value is close to what we get from the COM report (6.36dB). The difference can be explained by the way we consider jitter and crosstalk, and some imperfectness of measurements we performed on the eye and BER plots, for example, caused by a discreteness of the mesh.</p>\r\n<p><strong>Experimental COM vs Improved COM Comparison</strong></p>\r\n<p>To evaluate the error introduced by the simplifications made in the COM method in regards to jitter and crosstalk contributions, a set of eight pre-layout schematics that mimic the behavior of a 100GBASE-KR4 electrical backplane system was created. All of these schematics implement, as shown in Fig. 8, a variation of the same topology containing the backplane, connectors, and two daughter-cards attached at each end. The two connectors support 25-Gbps data rates. The wide bus topology includes five coupled differential pairs, with a victim pair in the center and four aggressors (two on each side of the victim). The two near-end aggressors (NEXT) have opposite signaling flow compared to the victim pair, while the two far end aggressors (FEXT) have the same signaling flow as the victim pair. The total length of the channel is 47cm (19 inches), with 40 cm (16 inches) on the backplane and 7 cm (3 inches) on each of the daughter-cards. The backplane stackup contains 24 layers: 14 signal layers (2 microstrip and 12 edge-coupled striplines) and 10 power/ground layers. The daughter-cards’ stackup is similar to the backplane stack-up, but is thinner and has only 18 layers: 10 signal layers (2 microstrip and 8 edge-coupled stripline) and 8 power/ground layers. The main routing on the backplane and daughter-cards is stripline with short microstrip connector breakouts (0.5 inch on each side of the connector). The geometry of the traces was chosen to meet the 50 ohm single-ended and respectively 100-ohm differential impedance, or to be as close as possible to them. The differential vias were also optimized for 100-ohm differential impedance, except in the case of the first configuration where intentional stubs lowered the impedance of the backplane differential vias down to ~64 ohm.</p>\r\n<p align=\"center\"><img style=\"width: 628px; height: 291px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-8.jpg\" alt=\"Fg 8\" /></p>\r\n<p align=\"center\"><em>Fig.8 Simulated topology</em></p>\r\n<p>The main elements that differentiate the eight configurations are:</p>\r\n<ol>\r\n<li>Configuration 1 – higher-loss material (FR406 with Er = 3.93 and Loss Tangent = 0.0167), reflections due to long via stubs, and a high level of crosstalk. The main routing on the backplane was done in layer 3 and the vias were not backdrilled, leaving long via stubs (layer 3 to layer 24). The inter-pair spacing was 2.5 times the dielectric height (10 mils).</li>\r\n<li>Configuration 2 – higher-loss material, reflections due to long via stubs were suppressed, and high level of crosstalk. The second configuration inherits the material properties and inter-pair spacing from the previous configuration (FR406 and 10 mils pair-to-pair spacing). The main routing on the backplane was moved from layer 3 to layer 22, thus the via stubs are much shorter. The inter-pair spacing was kept the same as in the first configuration.                                                                                                            </li>\r\n</ol>\r\n<p align=\"center\"><img style=\"width: 670px; height: 127px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-9a-b.jpg\" alt=\"Fg 9a b\" /></p>\r\n<p align=\"center\"><em>Fig.9 Differential via structures: configuration 1 (a), all the other configurations (b)</em></p>\r\n<ol>\r\n<li value=\"3\">Configuration 3 – low-loss dielectric material and high crosstalk. This version of the system topology was derived from the second configuration by replacing the FR406 board material with Megtron 6 (Er = 3.71, Loss Tangent = 0.002).</li>\r\n<li value=\"4\">Configurations 4 to 8 – low-loss material and lower crosstalk. Those configurations are improved versions of configuration 3 from the crosstalk perspective. The pair-to-pair spacing was incrementally increased from 2.5 times the dielectric height (10 mils) up to 5 times the dielectric height (20 mils).</li>\r\n</ol>\r\n<p>The overlapped frequency-domain plots of the eight configurations are shown in Fig.10. It can be seen from the differential insertion-loss plots that the first configuration fails the 100GBASE-KR4 limit and the long via stubs generate a sharp dip at 9 GHz. Although the resonant structures (via stubs) were removed from the second configuration, the differential insertion loss plot still violates the required limit at around 12GHz. All the other configurations meet the informative recomendation of the IEEE 802.3bj specification for insertion loss. As expected, the return-loss plot of the first configuration fails the low frequency limit, due to its reflective behaviour. The second channel passes the differential return-loss constraints with very narrow margin in the low-frequency range. All the other configurations slightly violate the specification’s informative reccomendations for return loss. The FEXT and NEXT plots are below -20dB for all the configurations. From those plots it can also be observed that the magnitude of the crosstalk terms is lower for the last five configurations.</p>\r\n<p style=\"margin-left: 80px;\"><img style=\"width: 650px; height: 278px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-10a-b.jpg\" alt=\"Fg 10a b\" /></p>\r\n<p style=\"margin-left: 80px;\"><img style=\"width: 655px; height: 528px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-10c-d-e-f.jpg\" alt=\"Fg 10c d e f\" /></p>\r\n<p align=\"center\"><em>Fig.10 Overlapped frequency-domain characteristics of the eight configurations: differential insertion loss of the victim pairs plotted against the 100GBASE-KR4 limit (a), differential return loss of the victim pairs plotted against the 100GBASE-KR4 limit (b), aggressor 1 NEXT (c), aggressor 2 (FEXT) (d), aggressor 3 (NEXT) (e), and aggressor 4 (FEXT) (f)</em></p>\r\n<p>For each of those configurations, two channel operation margins were calculated: one using the method described in the IEEE 802.3bj standard and another one using the improved algorithm proposed in this paper. The computed COM values are ranging from -8.7 dB to 6.43 dB with a minimum attained in the case of configuration 1 and a maximum in the configuration 8 case. COM is way below the 3dB threshold for the first three configurations, clearly indicating that those are failing channels. The fourth configuration passes the 3dB threshold with almost no margin. The last four configurations pass the specification limits with good margins. The first two plots, (a) and (b), shown in Fig 11, describe COM variation versus configuration number for the two package cases (short and long). The next two plots, (c) and (d) from the same figure, indicate the absolute error between the two methods for COM computation. In the last two plots, (e) and (f), the comparative accuracy of these methods is quantified in terms of their relative errors. The first four plots reveal that the maximum absolute error for all the configurations under consideration is 0.44 dB and it occurs in the short package case for the first configuration.</p>\r\n<p style=\"margin-left: 40px;\">  <img style=\"width: 630px; height: 623px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-11a-b-c-d-e-f.jpg\" alt=\"Fg 11a b c d e f\" /></p>\r\n<p><em>Fig.11 Computed COM for each of the eight configurations using standard COM and improved COM methods: short-package case (a), long-package case (b), absolute error short-package case (c), absolute error long-package case (d), relative error short-package case (e), relative error long-package case (f)</em></p>\r\n<p>From the last two plots it can be seen that the relative error between the two methods of COM computation can be as high as 24% in the short package case and 32% in the long package case. Those maximum values correspond to configuration 3 for which the computed COM values are near 0 dB. The relative error diminishes as COM goes below or above 0 dB.</p>\r\n<p>From these plots, and especially from Fig.11 a,b, we see that the modified version of COM procedure shows more effect from jitter, although the results are slightly less sensitive to crosstalk. This observation agrees with estimations made in Sections II and III.</p>\r\n<p>To compare the COM and eye/BER results we used the flow described in Section 1 and illustrated in</p>\r\n<p>Fig. 1. With this technique we generated the eye-density plots for each of the eight configurations and compared them against the computed COM value. The plots corresponding to the short-package case and DER<sub>0</sub> = 10<sup>-5</sup>  are shown in Fig. 12 below and a summary of the COM vs. eye metrics results is presented in the Table 1.</p>\r\n<p style=\"margin-left: 40px;\"><img style=\"width: 668px; height: 540px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-12-a-b-c-d-e-f.jpg\" alt=\"Fg 12 a b c d e f\" /></p>\r\n<p style=\"margin-left: 40px;\"><img style=\"width: 667px; height: 175px;\" src=\"https://www.signalintegrityjournal.com/ext/resources/article-images-2017/PAPER_BerComWayChannelCompliance_DmitrievZdorov_Final/Fg-12-g-h1.jpg\" alt=\"Fg 12 g h\" /></p>\r\n<p><em>Fig.12 Eye density plots generated using the flow described in Fig. 1 for each of the eight configurations: configuration 1 (a), configuration 2 (b), configuration 3 (c), configuration 4 (d), configuration 5 (e), configuration 6 (f), configuration 7 (g), and configuration 8 (h)</em></p>\r\n<table border=\"1\" cellspacing=\"0\" cellpadding=\"0\">\r\n<tbody>\r\n<tr>\r\n<td style=\"width: 84px; height: 21px;\">\r\n<p align=\"center\"><strong>Config #</strong></p>\r\n</td>\r\n<td style=\"width: 90px; height: 21px;\">\r\n<p align=\"center\"><strong>COM (dB)</strong></p>\r\n</td>\r\n<td style=\"width: 132px; height: 21px;\">\r\n<p align=\"center\"><strong>Eye height (mV)</strong></p>\r\n</td>\r\n<td style=\"width: 126px; height: 21px;\">\r\n<p align=\"center\"><strong>Eye width (UI)</strong></p>\r\n</td>\r\n</tr>\r\n<tr>\r\n<td style=\"width: 84px; height: 23px;\">\r\n<p align=\"center\">1</p>\r\n</td>\r\n<td style=\"width: 90px; height: 23px;\">\r\n<p align=\"center\">-8.42</p>\r\n</td>\r\n<td style=\"width: 132px; height: 23px;\">\r\n<p align=\"center\">0</p>\r\n</td>\r\n<td style=\"width: 126px; height: 23px;\">\r\n<p align=\"center\">0</p>\r\n</td>\r\n</tr>\r\n<tr>\r\n<td style=\"width: 84px; height: 22px;\">\r\n<p align=\"center\">2</p>\r\n</td>\r\n<td style=\"width: 90px; height: 22px;\">\r\n<p align=\"center\">-4.97</p>\r\n</td>\r\n<td style=\"width: 132px; height: 22px;\">\r\n<p align=\"center\">0</p>\r\n</td>\r\n<td style=\"width: 126px; height: 22px;\">\r\n<p align=\"center\">0</p>\r\n</td>\r\n</tr>\r\n<tr>\r\n<td style=\"width: 84px; height: 23px;\">\r\n<p align=\"center\">3</p>\r\n</td>\r\n<td style=\"width: 90px; height: 23px;\">\r\n<p align=\"center\">0.19</p>\r\n</td>\r\n<td style=\"width: 132px; height: 23px;\">\r\n<p align=\"center\">7.8</p>\r\n</td>\r\n<td style=\"width: 126px; height: 23px;\">\r\n<p align=\"center\">0.1</p>\r\n</td>\r\n</tr>\r\n<tr>\r\n<td style=\"width: 84px; height: 23px;\">\r\n<p align=\"center\">4</p>\r\n</td>\r\n<td style=\"width: 90px; height: 23px;\">\r\n<p align=\"center\">2.63</p>\r\n</td>\r\n<td style=\"width: 132px; height: 23px;\">\r\n<p align=\"center\">30.0</p>\r\n</td>\r\n<td style=\"width: 126px; height: 23px;\">\r\n<p align=\"center\">0.35</p>\r\n</td>\r\n</tr>\r\n<tr>\r\n<td style=\"width: 84px; height: 17px;\">\r\n<p align=\"center\">5</p>\r\n</td>\r\n<td style=\"width: 90px; height: 17px;\">\r\n<p align=\"center\">4.84</p>\r\n</td>\r\n<td style=\"width: 132px; height: 17px;\">\r\n<p align=\"center\">42.0</p>\r\n</td>\r\n<td style=\"width: 126px; height: 17px;\">\r\n<p align=\"center\">0.46</p>\r\n</td>\r\n</tr>\r\n<tr>\r\n<td style=\"width: 84px; height: 20px;\">\r\n<p align=\"center\">6</p>\r\n</td>\r\n<td style=\"width: 90px; height: 20px;\">\r\n<p align=\"center\">5.90</p>\r\n</td>\r\n<td style=\"width: 132px; height: 20px;\">\r\n<p align=\"center\">46.0</p>\r\n</td>\r\n<td style=\"width: 126px; height: 20px;\">\r\n<p align=\"center\">0.48</p>\r\n</td>\r\n</tr>\r\n<tr>\r\n<td style=\"width: 84px; height: 23px;\">\r\n<p align=\"center\">7</p>\r\n</td>\r\n<td style=\"width: 90px; height: 23px;\">\r\n<p align=\"center\">6.05</p>\r\n</td>\r\n<td style=\"width: 132px; height: 23px;\">\r\n<p align=\"center\">46.3</p>\r\n</td>\r\n<td style=\"width: 126px; height: 23px;\">\r\n<p align=\"center\">0.49</p>\r\n</td>\r\n</tr>\r\n<tr>\r\n<td style=\"width: 84px; height: 19px;\">\r\n<p align=\"center\">8</p>\r\n</td>\r\n<td style=\"width: 90px; height: 19px;\">\r\n<p align=\"center\">6.19</p>\r\n</td>\r\n<td style=\"width: 132px; height: 19px;\">\r\n<p align=\"center\">49.6</p>\r\n</td>\r\n<td style=\"width: 126px; height: 19px;\">\r\n<p align=\"center\">0.50</p>\r\n</td>\r\n</tr>\r\n</tbody>\r\n</table>\r\n<p><em>Table 1. COM vs. eye height and eye width</em></p>\r\n<p>It can be seen from those results that the eye-density plots and COM computations are in good agreement. Both of those two metrics follow the same trend and can be used to predict the behavior of the channel. Small changes in the COM computed value translate into small variations of the eye opening while larger COM amounts turn into a more sizable eye opening.</p>\r\n<p><strong>Conclusions</strong></p>\r\n<p>In this paper, we have demonstrated a number of important points. First, COM analysis is a simplified version of the statistical simulation of SERDES links. With all conditions being set equal, the two give very close, if not identical, result.</p>\r\n<p>The advantage of COM is that it includes optimization of equalization parameters as an integral part. However, for the sake of performance, the computation of COM within the optimization cycle is replaced by FOM, which is a greatly simplified measure. FOM assumes a Gaussian distribution of all noise contributors, but the actual distribution of noise elements is far from Gaussian, for which reason FOM and COM measures may differ considerably. Hence, the “best set” of equalization parameters found from evaluating FOM may not be the best in the “COM sense”. This effect should be further investigated: we need to find out how much the reported COM differs from its optimal potential.</p>\r\n<p>We considered two other simplifications common for FOM and COM. These include using the bit (not step) response in jitter evaluation and taking the worst possible phase combination for crosstalk components. We have shown that the two factors, on average, modify COM in different directions. That is, most likely, COM underestimates jitter but overestimates the effect of crosstalk. Even though the final numbers for the standard and modified COM are close in Figure 11, the two factors may not always compensate each other. For example, with larger distance between the conductors we expect smaller crosstalk with possibly considerable transmit jitter. This is where the standard COM measure will show lesser noise than the more accurate “improved” algorithm. Over-optimistic prediction may lead to design failure. Still, we have shown that the method can be easily improved with minor (if any) computational cost.</p>\r\n<p>Finally, we demonstrated that the improved COM method perfectly matches the results given by an accurate statistical eye and BER analysis, provided that both are based on the same channel response and identical equalization settings.</p>\r\n<p><strong>References</strong></p>\r\n<ol>\r\n<li>V. Stojanovic, M. Horiwitz, Modeling and analysis of high-speed links, Proc. IEEE Custom Integrated Circuit Conf., pp. 589–594, Sept 2003</li>\r\n<li>J. Caroselly, C. Liu, An analytic system model for high-speed interconnects and its application to the specification of signaling and equalization architectures for 10Gbps backplane communications, DesignCon, 2006</li>\r\n<li>M. Tsuk, D. Dvorscsak, C.S. Ong, and J. White, An electrical-level superimposed-edge approach to statistical serial link simulation, IEEE/ACM International Conf. on Computer-aided Design Digest of Technical Papers, pp. 718–724, 2009</li>\r\n<li>IEEE Std. 802.3bj-2014 (Amendment to IEEE Std. 802.3-2012), Annex 93A.1, Channel Operating Margin</li>\r\n<li>V. Dmitriev-Zdorov, M. Miller, C. Ferry, The Jitter-Noise Duality and Anatomy of an Eye Diagram, DesignCon 2014</li>\r\n<li>M. Rowlands, I. Park, D. Correia, What Makes a Good Channel? COM vs. BER Metrics, DesignCon 2015</li>\r\n<li>X. Dong, M. Mo, F. Rao, W. Jin., G. Zhang, Relating COM to Familiar S-Parameter Parametric to Assist 25Gbps System Design,  , DesignCon 2014</li>\r\n<li>R. Mellitz, A. Ran, M. Peng Li, V. Ragavassamy, Channel Operating Margin (COM): Evolution of Channel Specifications for 25 Gbps and Beyond, DesignCon 2013</li>\r\n<li>M. Brown, M. Dudek, A. Healey, L. B. Artsi, R. Mellitz, C. Moore, A. Ran, P. Zivny, The state of IEEE 802.3bj 100 Gb/s Backplane Ethernet, DesignCon 2014</li>\r\n<li>B. Gore, R. Mellitz, An Exercise in Applying Channel Operating Margin (COM) for 10GBASE-KR Channel Design, IEEE International Symposium on Electromagnetic Compatibility (EMC) 2014</li>\r\n</ol>\r\n<p><strong>Authors’ Biographies</strong></p>\r\n<p><em><strong>Vladimir Dmitriev-Zdorov</strong></em></p>\r\n<p>Dr. Vladimir Dmitriev-Zdorov is a principal engineer at Mentor Graphics Corporation. He has developed a number of advanced models and novel simulation methods used in the company’s products. His current work includes development of efficient methods of circuit/system simulation in the time and frequency domains, transformation and analysis of multi-port systems, and statistical and time-domain analysis of SERDES links. He received Ph.D. and D.Sc. degrees (1986, 1998) based on his work on circuit and system simulation methods. The results have been published in numerous papers, conference proceedings, and a monograph.</p>\r\n<p><em><strong>Cristian Filip</strong></em></p>\r\n<p>Cristian Filip joined Mentor Graphics Corporation in 2014 as a product marketing manager for high-speed products. His interests include high-speed serial link design, modeling and simulations of DDR memory interfaces, and power integrity. Prior to joining Mentor Graphics, Cristian was a Senior Hardware Engineer specializing in signal and power integrity at General Dynamics Canada in Ottawa. Cristian holds a M. Eng. In Electronics and Telecommunications from the Polytechnic University, Timisoara, Romania and is member of Professional Engineers Ontario.</p>\r\n<p><em><strong>Chuck Ferry</strong></em></p>\r\n<p>Chuck Ferry is a product marketing manager at Mentor Graphics Corporation. Chuck focuses on product definition and validation for signal integrity and power integrity solutions. He has spent the last 16 years tackling a broad range of high speed digital design challenges spanning from system level design to multi-gigabit channel analysis developing and incorporating detailed characterizations of the IC, packages, connectors and multiple boards.  Chuck graduated Magna cum Laude from the University of Alabama with a BS in electrical engineering and continued graduate course work in the areas of signal processing and hardware description languages.</p>\r\n<p><em><strong>Alfred Neves</strong></em></p>\r\n<p>Al has 34 years of experience in the design and application development of semiconductor products, capital equipment design focused on jitter and signal integrity analysis, and has successfully been involved with numerous business developments and startup activity for the last 17 years. Al focuses on measure-based model development, package characterization, high-speed board design, low jitter design, analysis, and training. He earned a B.S. in Applied Mathematics at the University of Massachusetts.</p>\r\n<p> </p>\r\n<p><em>This paper was presented at DesignCon 2016.</em></p>\r\n</div>\r\n</div>','BER- and COM-Way of Channel-Compliance Evaluation: What are the Sources of Differences? Presentation at EDI CON 2016','','draft','open','open','','ber-and-com-way-of-channel-compliance-evaluation-what-are-the-sources-of-differences-presentation-at-edi-con-2016','','','2017-03-23 07:55:35','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=15',9,'post','',0),(16,2,'2016-05-18 07:56:14','0000-00-00 00:00:00','<p><img src=\"http://design.iconnect007.com/files/4214/6367/5109/mentor_bestpaperaward.jpg\" alt=\"\" width=\"300\" height=\"242\" align=\"right\" /></p>\r\n<p>This paper, \"BER- and COM-Way of Channel-Compliance Evaluation: What Are the Sources of Differences?\" won the DesignCon 2016 Best Paper Award. It analyzes the computational procedure specified for Channel Operation Margin (COM) and compares it to traditional statistical eye/BER analysis. </p>\r\n<p>The  paper was written by Vladimir Dmitriev-Zdorov, Chuck Ferry, and Christian Filip of Mentor Graphics, and Alfred P. Neves of Wild River Technology. To read this paper, <a href=\"https://www.mentor.com/pcb/resources/overview/ber-and-com-channel-compliance-0d966f11-d571-4c49-83d6-02a2bad74703?clp=1&amp;contactid=1&amp;PC=L&amp;c=2016_05_16_pcb_hl_wp_ber_compliance_1of2\">click here</a>.</p>','DesignCon Award-Winning Paper by Mentor Graphics and Wild River Technology','','draft','open','open','','designcon-award-winning-paper-by-mentor-graphics-and-wild-river-technology','','','2016-05-18 07:56:14','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=16',14,'post','',0),(17,2,'2011-04-13 07:59:11','0000-00-00 00:00:00','<div class=\"row\">\r\n<div class=\"col-md-12\">\r\n<h1 class=\"industry-news-title-seo\">Vitesse Semiconductor, LeCroy Corporation and Wild River Technology to Present at DesignCon 2012</h1>\r\n</div>\r\n</div>\r\n<div class=\"row\">\r\n<div class=\"col-md-12 news-content\">\r\n<p>Signal Integrity Design and Backplane Characterization Experts to Address Integration of Cross Talk Pathology into Serial Link Analysis</p>\r\n<p>CAMARILLO, Calif.--(BUSINESS WIRE)--Vitesse Semiconductor Corporation (NASDAQ: VTSS), LeCroy Corporation and Wild River Technology will present a jointly prepared paper titled “A Robust method for Addressing 12Gbpsec Interoperability for High-Loss and Crosstalk Aggressed Channels,” at DesignCon 2012 at the Santa Clara Convention Center in Santa Clara, Calif., on Tuesday, January 31, 2012, at 2:00 p.m. local time.</p>\r\n<p>“They are also stressed by channel-to-channel cross talk. The challenge is integrating cross talk pathology into serial link analysis. Our DesignCon presentation will outline a solution to this problem.”</p>\r\n<p>During the session, engineers involved with signal integrity design and backplane characterization with system interoperability issues related to crosstalk and channel loss will learn about a new methodology, which will be demonstrated on 10.7 Gbps measured systems. It involves synthesizing a perfect SerDes architecture, simulating responses with a host of pathological channels using S-parameter models, and then performing a final co-verification using internal eye monitoring metrics.</p>\r\n<p>“As data rates increase, high speed serial channels are stressed by more than just excessive losses,” said Dr. Eric Bogatin, president of Bogatin Enterprises. “They are also stressed by channel-to-channel cross talk. The challenge is integrating cross talk pathology into serial link analysis. Our DesignCon presentation will outline a solution to this problem.”</p>\r\n<p>Coauthored by James Bell and Al Neves of Wild River Technology, Alan Blankman from LeCroy Corporation, Eric Bogatin, founder of Bogatin Enterprises, and Martin Spadaro and George Noh of Vitesse, the paper will be presented by Messrs. Spadaro, Blankman and Neves.</p>\r\n<p>DesignCon is an annual conference on product technologies, design methodologies, and EDA software, with a focus on system-on-chip design. For additional information: www.designcon.com.</p>\r\n<p>About LeCroy</p>\r\n<p>LeCroy Corporation is a worldwide leader in serial data test solutions, creating advanced instruments that drive product innovation by quickly measuring, analyzing, and verifying complex electronic signals. The Company offers high-performance oscilloscopes, serial data analyzers, and global communications protocol test solutions used by design engineers in the computer and semiconductor, data storage device, automotive and industrial, and military and aerospace markets. LeCroy’s 48-year heritage of technical innovation is the foundation for its recognized leadership in ”WaveShape Analysis” – capturing, viewing, and measuring the high-speed signals that drive today’s information and communications technologies. LeCroy is headquartered in Chestnut Ridge, New York. Company information is available at www.lecroy.com.</p>\r\n<p>About Wild River Technology</p>\r\n<p>Wild River Technology is a company conceived by a small, but dedicated cadre of engineering folks who intimately understand the everyday challenges of the signal integrity practitioner. Our marketing and product concepts are born by practical experience in years of working in high-speed design environments, where our focused and reasonably cost products are supported by aggressive customer support. We are dedicated to the art of superb signal integrity practice. Company information is available at www.wildrivertech.com.</p>\r\n<p>About Bogatin Enterprises</p>\r\n<p>Training from Bogatin Enterprises teaches how to turn complex signal integrity problems into practical design solutions. We accelerate engineers up the learning curve by strengthening engineering intuition. Our classes illustrate how analysis and measurement tools can be used to quickly and efficiently solve signal integrity problems. The design methodology we teach emphasizes eliminating problems by identifying their root cause and designing them out early in the design cycle. Analysis techniques are applied to balance the cost performance tradeoffs. Risk can be reduced by leveraging simulation tools and measurement using TDR and VNA instruments. For 20 years, Bogatin Enterprises has been setting the standard for signal integrity training. Company information is available at www.beTheSignal.com.</p>\r\n<p>About Vitesse</p>\r\n<p>Vitesse designs, develops and markets a diverse portfolio of high-performance, cost-competitive semiconductor solutions for Carrier and Enterprise Ethernet networks worldwide. Engineering excellence and dedicated customer service distinguish Vitesse as an industry leader in Gigabit Ethernet LAN, Ethernet-over-SONET, Fibre Channel, Optical Transport, and other applications. Vitesse innovation empowers customers to deliver superior products for Enterprise, Access, Metro, and Core applications. Additional company and product information is available at www.vitesse.com.</p>\r\n<p>Vitesse is a registered trademark of Vitesse Semiconductor Corporation in the United States and other jurisdictions. All other trademarks or registered trademarks mentioned herein are the property of their respective holders.</p>\r\n</div>\r\n</div>','Vitesse Semiconductor, LeCroy Corporation and Wild River Technology to Present at DesignCon 2012','','draft','open','open','','vitesse-semiconductor-lecroy-corporation-and-wild-river-technology-to-present-at-designcon-2012','','','2011-04-13 07:59:11','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=17',12,'post','',0),(18,2,'2018-01-12 15:04:47','0000-00-00 00:00:00','<p><img src=\"http://www.electronicdesign.com/sites/electronicdesign.com/files/styles/article_featured_standard/public/Keysight_ED-MWRF_126webinar_595x335.jpg?itok=IJYrKbWx\" alt=\"Keysight Webinar\" width=\"300\" class=\"medium js-imgpxr\" title=\"Keysight Webinar\" /></p>\r\n<p>This webcast introduces a forensic channel analysis approach that implements both measurement hardware and EDA tools with contemporary SERDES internal tools (e.g., internal eye scan) for the purpose of optimizing the BER for highly pathological channels (i.e. identifying the major contributors to signal degradation in the link). State-of-the-art pulse response analysis such as this, provides valuable insight into the behavior of the channel and the effective use of CTLE, FFE, and DFE equalization techniques, in order to mitigate crosstalk, attenuation and return loss.</p>\r\n<p>Sponsored by Keysight Technologies</p>\r\n<h1>&nbsp;</h1>\r\n<h1>Speakers</h1>\r\n<p><img src=\"http://beta.electronicdesign.com/sites/electronicdesign.com/files/Heidi_Barnes.jpg\" alt=\"\" class=\"old-inline-image\" data-caption data-credit data-noderef=\"workspace://SpacesStore/ae18280b-1398-47a4-9d61-96ce1243b3dd\" /></p>\r\n<p><strong>Heidi Barnes</strong><br /> Senior Application Engineer<br /><strong>Keysight Technologies</strong></p>\r\n<p><strong><img src=\"http://beta.electronicdesign.com/sites/electronicdesign.com/files/Al_Neves.jpg\" alt=\"\" class=\"old-inline-image\" data-caption data-credit data-noderef=\"workspace://SpacesStore/b84f74ce-e0cd-4703-82eb-793416e801e5\" /></strong></p>\r\n<p><strong>Al Neves</strong><br /> Chief Technologist<br /><strong>Wild River Technology</strong></p>\r\n<p><strong><img src=\"http://beta.electronicdesign.com/sites/electronicdesign.com/files/JackC-cropped.jpg\" alt=\"\" class=\"old-inline-image\" data-caption data-credit data-noderef=\"workspace://SpacesStore/54f02310-4889-4b79-a163-537924482c77\" /></strong></p>\r\n<p><strong>Jack Carrel</strong><br /> Applications Engineer<br /><strong>Xilinx</strong></p>\r\n<h1>Description</h1>\r\n<p><img src=\"http://beta.electronicdesign.com/sites/electronicdesign.com/files/20161213_ads_eye_graphic.jpg\" alt=\"\" class=\"old-inline-image\" data-caption data-credit data-noderef=\"workspace://SpacesStore/670493b0-e526-4750-a7dd-e3c35bab5f5b\" /></p>\r\n<p><strong>Why this webcast is important:</strong><br /> SerDes design engineers often find themselves confronted with channels that prove quite difficult to optimize. “It is all about the margins”.</p>\r\n<p>This webcast introduces a forensic channel analysis approach that implements both measurement hardware and EDA tools with contemporary SERDES internal tools (e.g., internal eye scan) for the purpose of optimizing the BER for highly pathological channels (i.e. identifying the major contributors to signal degradation in the link). State-of-the-art pulse response analysis such as this, provides valuable insight into the behavior of the channel and the effective use of CTLE, FFE, and DFE equalization techniques, in order to mitigate crosstalk, attenuation and return loss.</p>\r\n<p>Specific topics to be covered during this webcast include: optimization, BER, PAM-4, IBIS-AMI, S-parameters, causality, passivity, EQ, DFE, FFE, CTLE, and the latest in pulse response analysis and optimization.</p>\r\n<p><strong>Who should view this webcast:</strong> <br /> Engineers and managers working on signal integrity design, characterization, and validation who want insight into the latest tips and techniques for optimizing the physical layer (package, PCBs &amp; interconnects) for 32Gbps to 56Gbps communication links.</p>\r\n<p><img src=\"http://beta.electronicdesign.com/sites/electronicdesign.com/files/Keysight_Footer_012617.jpg\" alt=\"\" class=\"old-inline-image\" data-caption data-credit data-noderef=\"workspace://SpacesStore/fd48a86f-6378-4f83-bee1-0bdd90929db6\" /></p>\r\n<h1>Webinar Registration</h1>\r\n<p><a href=\"https://w.on24.com/r.htm?e=818904&amp;s=1&amp;k=921D9D59BB09612FFB61FA6887D3405C&amp;partnerref=EDbanner126\" target=\"_blank\" rel=\"noopener noreferrer\">Register Here</a></p>','Analyze and Optimize 32Gbps to 56Gbps Serial Link Channels: Webinar','','draft','open','open','','webinar-on-1-26-2018-analyze-and-optimize-32-to-56-gbps-serial-link-channels','','','2018-01-12 15:04:47','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=18',10,'post','',0),(19,2,'2018-01-15 10:02:17','2018-01-15 18:02:17','<p>Wild River Technology offers one-hour technical webinars on subjects related to advanced modeling of interconnects. These webinars are free and open to everyone (registration required). To schedule a webinar or class and to receive the class outline, please call Alfred Neves at +1-503-718-7172 or email <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a>.</p>\r\n<ul>\r\n<li><a title=\"Webinar: Analyze and Optimize 32-Gbps to 56-Gbps Serial Link Channels\" href=\"https://www.youtube.com/watch?v=AGKmjb3yfk0%20\" target=\"_blank\" rel=\"noopener noreferrer\"><strong>Analyze and Optimize 32- to 56-Gbps Serial Link Channels</strong></a><a href=\"https://testsite.wildrivertech.com/?p=18\"><br /></a><em><strong>Presented by Keysight, Wild River Technology, and Xilinx</strong></em><br /><br />This webcast introduces a forensic channel analysis approach that implements both measurement hardware and EDA tools with contemporary SerDes internal tools (e.g., internal eye scan) for the purpose of optimizing the BER for highly pathological channels (i.e. identifying the major contributors to signal degradation in the link). State-of-the-art pulse response analysis such as this, provides valuable insight into the behavior of the channel and the effective use of CTLE, FFE, and DFE equalization techniques, in order to mitigate crosstalk, attenuation and return loss.<br /><br />Specific topics to be covered include: optimization, BER, PAM-4, IBIS-AMI, S-parameters, causality, passivity, EQ, DFE, FFE, CTLE, and the latest in pulse response analysis and optimization. <br /> </li>\r\n</ul>\r\n<ul class=\"ubermenu-submenu ubermenu-submenu-id-1758 ubermenu-submenu-type-auto ubermenu-submenu-type-stack\">\r\n<li><a href=\"https://www.youtube.com/embed/r4PELP0gn-Y?start=16\" target=\"_blank\" rel=\"noopener noreferrer\"><strong>Four Essential Steps for EDA Simulation Measurement Mastery<br /></strong></a><em><strong>Presented by Simbeor and</strong></em><em><strong> Wild River Technology</strong></em><a href=\"https://www.youtube.com/embed/r4PELP0gn-Y?start=16\" target=\"_blank\" rel=\"noopener noreferrer\"><br /></a>This seminar will help you achieve this level of modeling measurement using Simbeor as demonstrated using Wild River Technology’s CMP-28 Advanced Channel Modeling Platform in a systematized and high-confidence approach\r\n<ul>\r\n<li>Step 1: Measure S-parameters and validate quality</li>\r\n<li>Step 2: Import and adjust stack-up and board geometry into EDA tool</li>\r\n<li>Step 3: Identify broadband dielectric and conductor roughness models</li>\r\n<li>Step 4: Simulate all structures on the validation board without further adjustments and compare magnitude and phase of S-parameters, TDR/TDT and eye diagrams<a href=\"http://www.keysight.com/main/eventDetail.jspx?cc=US&amp;lc=eng&amp;ckey=2765334&amp;nid=-34335.870787.08&amp;id=2765334&amp;cmpid=MA64008AM&amp;MKCID=2798724.000000000000000000000000000000\"><br /> <br /></a></li>\r\n</ul>\r\n</li>\r\n<li><a href=\"https://youtu.be/Nm-L50B-wPw\" target=\"_blank\" rel=\"noopener noreferrer\"><strong>How to Use Fixture De-Embedding to Match Signal Integrity Simulations to Measurements</strong><br /></a><strong><em>Presented by Keysight, featuring Wild River Technology channel modeling platforms</em></strong><br />This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels. Multigigabit channels that include multi-layer laminate or printed circuit board structures require a fixture to go from the coaxial connections of the measuring instrument to the planar transmission line structures on a PCB. This fixture is not calibrated out by the coaxial calibration of the instrument and is often neglected in the simulation. This video will go through a four-step process to show how to de-embed the fixture from the measurement to validate the PCB channel model, then how to embed the fixture with the model to do a direct compare of simulation to full-path measurement both in the frequency domain and time domain. The end result is demonstrated using a 32Gb/s example of simulation to measurement correlation.</li>\r\n</ul>\r\n<p> </p>\r\n<p> </p>\r\n<p> </p>','Webinars','','publish','open','open','','webinars','','','2021-08-02 15:27:29','2021-08-02 22:27:29','',0,'https://testsite.wildrivertech.com/2018/01/15/webinars/',12,'post','',0),(100,2,'2021-08-02 15:27:29','2021-08-02 22:27:29','<p>Wild River Technology offers one-hour technical webinars on subjects related to advanced modeling of interconnects. These webinars are free and open to everyone (registration required). To schedule a webinar or class and to receive the class outline, please call Alfred Neves at +1-503-718-7172 or email <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a>.</p>\r\n<ul>\r\n<li><a title=\"Webinar: Analyze and Optimize 32-Gbps to 56-Gbps Serial Link Channels\" href=\"https://www.youtube.com/watch?v=AGKmjb3yfk0%20\" target=\"_blank\" rel=\"noopener noreferrer\"><strong>Analyze and Optimize 32- to 56-Gbps Serial Link Channels</strong></a><a href=\"https://testsite.wildrivertech.com/?p=18\"><br /></a><em><strong>Presented by Keysight, Wild River Technology, and Xilinx</strong></em><br /><br />This webcast introduces a forensic channel analysis approach that implements both measurement hardware and EDA tools with contemporary SerDes internal tools (e.g., internal eye scan) for the purpose of optimizing the BER for highly pathological channels (i.e. identifying the major contributors to signal degradation in the link). State-of-the-art pulse response analysis such as this, provides valuable insight into the behavior of the channel and the effective use of CTLE, FFE, and DFE equalization techniques, in order to mitigate crosstalk, attenuation and return loss.<br /><br />Specific topics to be covered include: optimization, BER, PAM-4, IBIS-AMI, S-parameters, causality, passivity, EQ, DFE, FFE, CTLE, and the latest in pulse response analysis and optimization. <br /> </li>\r\n</ul>\r\n<ul class=\"ubermenu-submenu ubermenu-submenu-id-1758 ubermenu-submenu-type-auto ubermenu-submenu-type-stack\">\r\n<li><a href=\"https://www.youtube.com/embed/r4PELP0gn-Y?start=16\" target=\"_blank\" rel=\"noopener noreferrer\"><strong>Four Essential Steps for EDA Simulation Measurement Mastery<br /></strong></a><em><strong>Presented by Simbeor and</strong></em><em><strong> Wild River Technology</strong></em><a href=\"https://www.youtube.com/embed/r4PELP0gn-Y?start=16\" target=\"_blank\" rel=\"noopener noreferrer\"><br /></a>This seminar will help you achieve this level of modeling measurement using Simbeor as demonstrated using Wild River Technology’s CMP-28 Advanced Channel Modeling Platform in a systematized and high-confidence approach\r\n<ul>\r\n<li>Step 1: Measure S-parameters and validate quality</li>\r\n<li>Step 2: Import and adjust stack-up and board geometry into EDA tool</li>\r\n<li>Step 3: Identify broadband dielectric and conductor roughness models</li>\r\n<li>Step 4: Simulate all structures on the validation board without further adjustments and compare magnitude and phase of S-parameters, TDR/TDT and eye diagrams<a href=\"http://www.keysight.com/main/eventDetail.jspx?cc=US&amp;lc=eng&amp;ckey=2765334&amp;nid=-34335.870787.08&amp;id=2765334&amp;cmpid=MA64008AM&amp;MKCID=2798724.000000000000000000000000000000\"><br /> <br /></a></li>\r\n</ul>\r\n</li>\r\n<li><a href=\"https://youtu.be/Nm-L50B-wPw\" target=\"_blank\" rel=\"noopener noreferrer\"><strong>How to Use Fixture De-Embedding to Match Signal Integrity Simulations to Measurements</strong><br /></a><strong><em>Presented by Keysight, featuring Wild River Technology channel modeling platforms</em></strong><br />This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels. Multigigabit channels that include multi-layer laminate or printed circuit board structures require a fixture to go from the coaxial connections of the measuring instrument to the planar transmission line structures on a PCB. This fixture is not calibrated out by the coaxial calibration of the instrument and is often neglected in the simulation. This video will go through a four-step process to show how to de-embed the fixture from the measurement to validate the PCB channel model, then how to embed the fixture with the model to do a direct compare of simulation to full-path measurement both in the frequency domain and time domain. The end result is demonstrated using a 32Gb/s example of simulation to measurement correlation.</li>\r\n</ul>\r\n<p> </p>\r\n<p> </p>\r\n<p> </p>','Webinars','','inherit','closed','closed','','19-revision-v1','','','2021-08-02 15:27:29','2021-08-02 22:27:29','',19,'https://testsite.wildrivertech.com/?p=100',0,'revision','',0),(20,2,'2018-01-15 10:19:40','2018-01-16 02:19:40','','Sandy_River-768x606','Sandy_River','inherit','open','closed','','attachment-sandy_river-768x606','','','2021-08-02 15:26:05','2021-08-02 22:26:05','',24,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/Sandy_River-768x606.jpg',0,'attachment','image/jpeg',0),(21,2,'2018-01-15 10:19:40','2018-01-15 18:19:40','','logo-ansys','','inherit','open','closed','','attachment-logo-ansys','','','2021-08-02 15:26:05','2021-08-02 22:26:05','',24,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/logo-ansys.jpg',0,'attachment','image/jpeg',0),(22,2,'2018-01-15 10:19:40','2018-01-15 18:19:40','','Picture of Al Neves','Al Neves','inherit','open','closed','','attachment-picture-of-al-neves','','','2021-08-02 15:26:05','2021-08-02 22:26:05','',24,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/Al_Neves_headshot_20120319.png',0,'attachment','image/png',0),(23,2,'2018-01-15 10:19:40','2018-01-15 18:19:40','','Picture of James Bell','James Bell','inherit','open','closed','','attachment-picture-of-james-bell','','','2021-08-02 15:26:05','2021-08-02 22:26:05','',24,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/jim_bell_20130211.png',0,'attachment','image/png',0),(24,2,'2018-01-15 10:19:40','2018-01-15 18:19:40','<div style=\"margin-bottom: 50px;\">\r\n<h1><img class=\" alignright size-full wp-image-20\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/Sandy_River-768x606.jpg\" alt=\"\" width=\"40%\" style=\"margin: 0 0 30px 50px;\" title=\"Sandy_River\" align=\"right\" /></h1>\r\n<p>Wild River Technology markets products for the high-speed signal integrity practitioner — an individual who addresses challenges in modeling interconnects, making better measurements, and solving a plethora of signal integrity issues to 56 Gbpsec data rates.</p>\r\n<p>Our products are born over many years of working in high-speed design environments and are adopted by much of the measurement community for improving measurements, characterizing SerDes, and optimizing communications channels.</p>\r\n<p>The objectives of our channel modeling platforms, adapter and cable products, and measurement workspace product line is to elevate signal integrity practices and methodology.</p>\r\n<hr />\r\n<p><a href=\"http://www.ansys.com/startups\" target=\"_blank\" rel=\"noopener noreferrer\"><img class=\" alignleft size-full wp-image-21\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/logo-ansys.jpg\" alt=\"\" width=\"135\" style=\"margin-right: 20px;\" align=\"left\" /></a>Wild River Technology is an official partner with Ansys and its&nbsp;simulation software platforms</p>\r\n<hr />\r\n<p><strong>Our Home</strong></p>\r\n<p>As the picture at right and our name suggests, we are based in a region with numerous wild rivers and incredible scenic beauty, the Portland, Oregon area.</p>\r\n<p><strong>Executive Staff</strong></p>\r\n<p><img class=\" alignleft size-full wp-image-22\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/Al_Neves_headshot_20120319.png\" alt=\"Picture of Al Neves\" width=\"156\" height=\"197\" style=\"margin: 0 50px 0 0;\" title=\"Al Neves\" align=\"left\" /></p>\r\n<p><strong>Al Neves</strong></p>\r\n<p>Alfred P. Neves, founder and chief technologist: Al has 30 years of experience in design and application development of semiconductor products, capital equipment design focused on jitter and signal integrity analysis For the last 13 years he has been successfully involved with numerous business developments and startup activity. Al is involved with the signal integrity community as a consultant, high-speed system-level design manager and engineer. Recent technical accomplishments include development of platforms and methods to improve 3D electromagnetic correspondence to measure-based methods, including advancing time and frequency domain calibration methods.</p>\r\n<p>Al focuses on measure-based model development, package characterization, high-speed board design, low jitter design, analysis, and training. He earned a BS in Applied Mathematics at the University of Massachusetts. He can be reached at <a href=\"mailto:al@wildrivertech.com\">al@wildrivertech.com</a></p>\r\n<p><a href=\"https://www.linkedin.com/pub/alfred-p-neves/0/63a/b75\"><img src=\"http://www.linkedin.com/img/webpromo/btn_in_20x15.png\" alt=\"View Al Neves\' LinkedIn profile\" width=\"20\" height=\"15\" border=\"0\" />View Al Neves’ profile</a></p>\r\n<p>&nbsp;</p>\r\n<p><img class=\" alignleft size-full wp-image-23\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/jim_bell_20130211.png\" alt=\"Picture of James Bell\" width=\"162\" height=\"198\" style=\"margin: 0 50px 0 0;\" title=\"James Bell\" align=\"left\" /></p>\r\n<p><strong>James Bell</strong></p>\r\n<p>James C. Bell, founder and technical&nbsp;manager: James is an experienced design and signal integrity engineer with 30 years of experience in complex system design, interconnect, and signal integrity engineering. He has been a consultant to engineering organizations worldwide, with expertise in pre- and post-route signal integrity and timing validation for advanced systems. He earned his BS in Electrical Engineering at Northern Arizona University. He can be reached at <a href=\"mailto:jim@wildrivertech.com\">jim@wildrivertech.com</a></p>\r\n<p><a href=\"https://www.linkedin.com/pub/james-bell/1b/ab8/772\"><img src=\"http://www.linkedin.com/img/webpromo/btn_in_20x15.png\" alt=\"View James Bell\'s LinkedIn profile\" width=\"20\" height=\"15\" border=\"0\" />View James Bell’s profile</a></p>\r\n</div>','About Wild River Technology','','publish','open','open','','about-us','','','2018-01-15 10:19:40','2018-01-15 18:19:40','',0,'https://testsite.wildrivertech.com/2018/01/15/about-us/',11,'post','',0),(25,2,'2018-01-15 10:21:04','2018-01-15 18:21:04','<p>Section 1502 of the Dodd-Frank financial reform law (PL 111-203) requires companies that use gold, tin, tantalum, and tungsten in products to identify the country of origin of the source mine(s) of these metals used in making any product. An acceptable alternative is a smelter(s) producing such metals that is validated with a “conflict free” designation approved by an industry consortium such as EICC (Electronics Industry Citizenship Coalition). In August 2012, the US Securities and Exchange Commission (SEC) adopted rules that require Wild River Technology and other US public companies using these metals to report on their efforts to identify the sources of these metals in the various raw materials purchased by Wild River Technology. These disclosures to the SEC are binding on both Wild River Technology and its suppliers. Wild River Technology therefore requires its suppliers to identify the source of these four metals used in making raw materials for Wild River Technology on form CE041, which is the latest revision (currently v4.01 dated 12 June 2015) of the EICC- GeSI (Global e-Sustainability Initiative) “Conflict Minerals Reporting Template”.<br /><br /><strong>Wild River Technology “Conflict Minerals” Policy</strong><br /><br />The term “Conflict Minerals” refers to metals that have their origin in areas of the world where known human rights violations exist. Metals used in the manufacture of our products that could potentially have their origin in such a location are…Gold and Tin. Currently, the Democratic Republic of the Congo and the 9 adjoining countries have been identified as a source of “Conflict Minerals”, and this area is known as the “Conflict Region”. Suppliers that can provide documentation acceptable to Wild River Technology that neither they, nor their suppliers, acquire these metals from this area of conflict, or from smelters with an approved designation as “conflict-free” by an industry consortium such as the EICC (Electronics Industry Citizenship Coalition) will receive preferential treatment in Wild River Technology’s purchasing decisions. Wild River Technology expects its suppliers to be environmentally and socially responsible.</p>\r\n<p> </p>\r\n<p> </p>','Conflict Minerals Policy','','publish','open','open','','conflict-minerals-policy','','','2018-01-15 10:21:04','2018-01-15 18:21:04','',0,'https://testsite.wildrivertech.com/2018/01/15/conflict-minerals-policy/',10,'post','',0),(26,2,'2018-01-15 10:31:27','2018-01-15 18:31:27','<p><strong>Wild River Technology Terms &amp; Conditions</strong><br /><br />Thank you for visiting the wildrivertech.com website (the “website”).&nbsp; The website is owned and operated by Wild River Technology LLC., (“wildrivertech.com”, “our”, “us”, “we”, or “the Company”).<br /><br /><strong>Legally Binding Agreement</strong><br />These Terms and Conditions set forth the rules that apply to your use of our website. You should read them carefully.&nbsp; The Terms and Conditions constitute a legally binding agreement between you (including the organization that you represent, if any) and the Company.&nbsp; When you visit or shop at our website you automatically agree to be bound by these terms and conditions and any updates or modifications that we may make from time to time.&nbsp; Internet technologies, and the laws related to them, change frequently, and accordingly, the Company reserves the right to modify these Terms and Conditions at any time.&nbsp; Your continued use of this website constitutes your acceptance of such modified Terms and Conditions.&nbsp; Whenever you visit our website you should review the Terms and Conditions and Privacy Policy.&nbsp; If you do not agree with any of these Terms and Conditions or any provision of the Privacy Policy, do not use the Company website.<br /><br /><strong>Privacy</strong><br />Please read our <a href=\"index.php/about-us/privacy-policy\" title=\"Wild River Technology Privacy Policy\">Privacy Policy,</a> which details our privacy policy and practices and also governs your visit to our website.&nbsp; By visiting or using our website, you agree to be bound by the terms of our Privacy Policy.&nbsp; If there is any conflict between the terms of our Privacy Policy and our Terms and Conditions, the Terms and Conditions govern.<br /><br /><strong>Eligibility to Use Website</strong><br />The website is not intended for or directed to minors (persons under 18 years of age), and the website may only be used by individuals and entities who can form legally binding contracts under applicable law. Your use of the website is a representation that you are legally permitted to enter into binding contracts, are 18 years of age or older.<br /><br /><strong>Copyright/Trademark Information</strong><br />The contents of this website are the intellectual property of Wild River Technology LLC., its affiliates, subsidiaries or third parties who have licensed the materials to us. All content is protected by United States and international copyright, trademark, trade dress, and other intellectual property laws, and is the exclusive property of Company, who reserves all rights, title, and interests thereto.<br /><br />WILDRIVERTECH.COM; and the Wild River Technology logo are trademarks of Wild River Technology LLC., and may not be used by you without our written permission.&nbsp; All other trademarks of third parties that may appear on our site are the property of their respective owners.<br /><br />This website or its contents may not be copied, reproduced, distributed, or transmitted in any way without Company’s prior written consent. As a user of the website, you may download one copy of the contents on this site for personal, non-commercial use provided that you do not alter, modify, or attempt to alter or modify the contents in any way, or alter or delete any copyright or trademark notice. All content on this website shall be used for lawful purposes only.<br /><br /><strong>Copyright Infringement Complaints</strong><br />Pursuant to 17 United States Code 512(c)(2) (“Digital Millennium Copyright Act of 1998”), our designated agent for notice of alleged copyright infringement appearing on our website is:<br /><br />Benjamin Knaupp<br />Garland Griffiths Knaupp, Attorneys<br />254 North 1st Avenue<br />Hillsboro, OR 97124<br />Phone: 503-343-1946<br />Fax: 503-419-4912<br /><br />Any other complaints of intellectual property infringement should be sent in writing to the above designated agent.<br /><br />Notwithstanding the foregoing, this website acts as a passive conduit for your communications and any and all other communications and/or distribution of information. Company has no editorial control or otherwise, over any communication, information, and specifically, over the content of such communication or information. Company does not and will not ensure the accuracy or reliability of your communications and any and all other communications or information nor will Company act as a monitor over the content of such communication or information. However, Company does reserve the absolute right to remove or restrict any communication or information that you may post or communicate to the website that is in violation of the Terms and Conditions, illegal, threatening, vulgar or lewd. You acknowledge and agree that this website acts as a passive conduit for any of your communications and that you will remain wholly responsible and liable for any damages, whether it be to person, property or business, that arise as a result of your communications and that you will indemnify, defend and hold harmless Company for any of these damages.<br /><br /><strong>Advertisements for Offers to Buy Products</strong><br />Listings on this website are not an offer to sell goods, rather, they are advertisements to receive offers from you to buy goods from us. By placing an order, you are making an offer to buy those goods, which the Company accepts only by shipping the good(s) ordered. There is no binding contract for sale until such time as we deliver the first shipment of product(s) subject to your offer. All prices advertised on the website are subject to change, and we may have to communicate price changes or availability issues to you after you place your order.<br /><br /><strong>Risk of Loss</strong><br />If you provide us with a carrier account number or select a carrier other than a carrier that regularly ships for us, title to products and risk of loss or damage during shipment passes from Company to you upon shipment from our facility. For all other shipments, title to products and risk of loss or damage during shipment passes from Company to you upon your receipt.<br /><br />Notwithstanding the foregoing, title to software will remain with the applicable licensor(s) and your rights therein are contained in the license agreement between such licensor(s) and you. Company retains a security interest in the products until payment in full is received. You will be responsible for all shipping and related charges.<br /><br /><strong>Order Acceptance Policy</strong><br />Your receipt of an electronic or other form of order confirmation does not signify our acceptance of your order, nor does it constitute confirmation of an offer to sell. Any such confirmation is subject to correction before shipment in the event of inaccuracies, errors, product unavailability, or for any other reason. Company reserves the right at any time after receipt of your order to accept or decline your order for any reason. Company reserves the right at any time after receipt of your order, without prior notice to you, to supply less than the quantity you ordered of any item. All orders placed over $2,000.00 ( USD ) must obtain pre-approval with an acceptable method of payment. We may require additional verifications or information before accepting any order. Company does not accept orders from exporters, wholesalers, or other customers who intend to resell the products offered by Company.<br /><br /><strong>Typographical or Price Errors</strong><br />The information contained in this website is subject to change without notice. We are not responsible for typographical, technical, or descriptive errors of products herein. We reserve the right to correct errors or to update product information at any time without notice.&nbsp; In the event a product is listed at an incorrect price or with incorrect information due to typographical error or error in pricing or product information received from our suppliers, Company, in its sole discretion, shall have the right to either: (i) refuse or cancel any orders placed for the product(s) listed at the incorrect price, or (ii) give you notice of the error and allow you the opportunity to proceed with your order at the corrected price. Company shall have the right to refuse or cancel any such orders whether or not the order has been confirmed and your credit card charged. If your credit card has already been charged for the purchase and your order is canceled, Company shall issue a credit to your credit card account in the amount of the charge.<br /><br /><strong>Product Descriptions</strong><br />Company attempts to describe the products listed on the website as accurately as possible.&nbsp; However, we make no guarantees with respect to the accuracy, completeness, reliability, or currency of our product descriptions or other website content.&nbsp; If a product you order and receive from us is not as described on our website, your sole remedy is to return the product to us in accordance with the terms of our Return Policy and Procedure.<br /><br /><strong>User Accounts</strong><br />You may create your own account by completing the online registration process on the website.&nbsp; You must provide us with accurate and complete registration information, and update it if this information changes.&nbsp; Keep the e-mail address associated with your account current, otherwise you will not be able to receive messages from us even though you may still access your account.<br /><br />In creating an account, you expressly consent to our collection, disclosure, and use of any information that you submit therewith in accordance with our Privacy Policy.&nbsp; You also consent to receive communications from us electronically, and agree that all communications we provide to you electronically satisfy any legal requirement that such communication be in writing.<br /><br />You are responsible for maintaining the confidentiality of your account and password, and will be responsible for all use of your account and password, including, without limitation, any use by any unauthorized third party.&nbsp; You must notify us immediately if you believe your password may have been used by any unauthorized person or entity. Company reserves the right to suspend or terminate your use of the website if we believe that your password is being used without permission or otherwise in a manner that may disrupt the website.&nbsp; Company also reserves the right to refuse service, terminate accounts, remove or edit content, or cancel orders in our sole discretion.<br /><br /><strong>Comments and Correspondence</strong><br />Any comments, content, feedback, ideas, posts, reviews, submissions, or suggestions (“Comments”) you send to us or post on the website shall become and remain our exclusive property. Your submission of such material shall constitute an assignment to Company of all worldwide right, title, and interest in and to the materials including all copyright and other intellectual property rights and a waiver of any claim based on moral rights, unfair competition, breach of implied contract, breach of confidentiality, and any other theory relating to such submissions. We may use, copy, publish, modify, disclose, and distribute any Comments you send us, for any purpose whatsoever, without compensating you in any way. We are and will be under no obligation: (i) to maintain any Comments in confidence; (ii) to pay to you or any third party any compensation for any Comments; or (iii) to respond to any Comments. You are and shall remain solely responsible for the content of any Comments you make. You also agree to take all further acts as we request to effect the intent of this paragraph.<br /><br /><strong>Prohibited Conduct</strong><br />You may only use the website for lawful purposes.&nbsp; In your use of the website, you agree not to: (i) infringe any patent, trademark, trade secret, copyright, right of publicity or other right of any party; (ii) defame, abuse, harass, stalk any individual, or disrupt or interfere with the security or use of the website or any websites linked to it, or post or transmit any defamatory, vulgar, obscene, profane, sexually explicit, or other objectionable material; (iii) interfere with or damage the website, including, without limitation, through the use of viruses, cancel bots, Trojan horses, harmful code, flood pings, denial of service attacks, packet or IP spoofing, forged routing or electronic mail address information or similar methods or technology; (iv) attempt to use another user’s account, impersonate another person or entity, misrepresent your affiliation with a person or entity, including, without limitation, Company, or create or use a false identity; (v) attempt to obtain unauthorized access to the website or portions of the website that are restricted from general access; (vi) engage, directly or indirectly, in transmission of “spam,” chain letters, junk mail or any other type of unsolicited solicitation; (vii) collect, manually or through an automatic process, information about other users without their express consent or other information relating to the website; (viii) use any meta tags or any other “hidden text” utilizing our name, trademarks, or product names; (ix) advertise, offer to sell, or sell any goods or services, except as expressly permitted by Company; (x) engage in any activity that interferes with any third party’s ability to use or enjoy the website; or (xi) assist any third party in engaging in any activity prohibited by these Terms and Conditions.<br /><br />Company has the right to prohibit communication, conduct, or content on the website that, in our sole discretion, we deem to be unlawful or harmful.&nbsp; As we cannot ensure prompt removal of questionable or harmful content, Company assumes no liability for any action or inaction with respect to such content.<br /><br />Company may terminate or suspend access, without notice, to part or all of the website for any conduct that, in our sole discretion, we believe violates any law, these Terms and Conditions, or is otherwise harmful to our interests or the interests of our affiliates, subsidiaries, customers, or other users of the website.<br /><br /><strong>Return Policy and 30 Day Limited Guarantee</strong><br />Every product you buy from Wild River Technology is backed by a one (1) year product manufacturer’s warranty and the Company guarantees described in this section. See manufacturer’s information for details on the manufacturer’s warranty. Company is not responsible for the manufacturer’s warranty, and all communications related thereto should be sent directly to the manufacturer.<br /><br />Wild River Technology’s 100% Money Back Guarantee: Our 30 day money back guarantee provides for either exchange or refund of qualifying merchandise only. Failure to comply with the Return Policy and Procedure voids this guarantee.<br /><br />All returns require a Return Authorization number to be issued prior to being returned. Returned products must be in new condition, include original outer packaging, all disks, registration cards, inner packing materials and other accessories, and be received within 30 days of the date shipped. We reserve the right to refuse for return or charge a restocking fee for damaged, incomplete or otherwise non-conforming returns. Returns will not be accepted without a Return Authorization number issued by Company or when the product manufacturer’s or distributor’s return policies supersede ours.<br /><br />This is a summary only, you can review our complete Return Policy and Procedure in our support center or click here. You can also review warranty coverage and returns privileges for any specific product in that item’s listing on our website. You can request a Return Authorization for most products eligible for return through the link provided in our complete Return Policy and Procedure, or after logging into your account.<br /><br />Wild River Technology’s Price Guarantee – Shop with confidence, our price guarantee includes time of sale price matching as well as 30 day price protection as described below.<br /><br />Wild River Technology’s Point of Sale Price Match Policy: At point of sale we will match any competitor’s price on identical offers or items. The item must be in-stock, available for immediate shipment and be in the same condition as the Company advertised item. Price matched items are limited to one per household. Sorry, but we do not offer price matches on any item that is advertised below Company’s actual cost.<br /><br />Wild River Technology’s 30 Day Price Protection Policy: In the event our regular advertised price on an item falls within 30 days of your purchase date simply e-Mail us within 30 days of your original purchase date and we will issue you a credit in the amount of the price drop good toward the purchase of anything else we sell. This price protection policy only applies to regularly advertised products and does not apply to limited time sales, instant savings offers, instant or mail-in rebates, private offers, auctions, open box items, limited quantity and close out items or other promotions or offers and may not be used in conjunction with other discounts.<br /><br /><strong>DISCLAIMERS, EXCLUSIONS AND LIMITATIONS:</strong><br /><br /><strong>NO WARRANTIES</strong><br />THIS WEBSITE AND ALL INFORMATION, CONTENT, MATERIALS, OR PRODUCTS INCLUDED OR SOLD THROUGH IT ARE PROVIDED ON AN “AS IS” AND “AS AVAILABLE” BASIS. Other than Company’s MONEY BACK GUARANTEE, Company’s Point of Sale Price Match Policy, AND company’s 30 DAY PRICE PROTECTION POLICY, Company makes no representations or warranties of any kind, express or implied, as to the operation of this website or the information, content, materials, or products included or sold through it. By using this WEBsite, you agree THAT YOUR USE OF THIS WEBSITE IS AT YOUR SOLE RISK AND YOU AGREE to assume full responsibility for any costs associated with servicing or repairs of any equipment you use in connection with your use of our WEBsite.<br /><br />TO THE FULL EXTENT PERMISSIBLE UNDER APPLICABLE LAW, THE COMPANY, ON BEHALF OF ITSELF, IT’S AFFILIATES, AND SUPPLIERS:&nbsp; (1) DISCLAIMS ALL WARRANTIES OF ANY KIND, EXPRESS OR IMPLIED, INCLUDING, BUT NOT LIMITED TO, IMPLIED WARRANTIES OF TITLE, NON-INFRINGEMENT, ACCURACY, MERCHANTABILITY, AND FITNESS FOR A PARTICULAR PURPOSE, AND ANY WARRANTIES THAT MAY ARISE FROM COURSE OF DEALING, COURSE OF PERFORMANCE, CUSTOM, OR TRADE; AND (2) DOES NOT WARRANT THAT THIS WEBSITE, ITS SERVERS, E-MAIL, OR ANY OTHER ASPECT THEREOF ARE FREE OF VIRUSES OR OTHER HARMFUL COMPONENTS.&nbsp; YOU FULLY ASSUME ALL risk AND responsibility for your use of the content of this website AND ALL PRODUCTS SOLD THEREON.<br /><br /><strong>LIMITATION OF LIABILITY</strong><br />In no event shall Company or any of its subsidiaries, affiliates, licensors, suppliers, advertisers, agents, vendors, or sponsors, nor our or their directors, officers, employees, consultants, agents, attorneys, or other representatives, be responsible or liable for any indirect, special, incidental, consequential, exemplary, punitive or other damages, including but not limited to, loss of use, loss of data, loss of business, or loss of profits, under any contract, negligence, strict liability, or other legal OR EQUITABLE theory arising out of or relating in any way or connected to the website, materials contained on the website, products contained on or sold through the website. OR YOUR ACCESS, USE OR INABILITY TO USE THE WEBSITE, OR IN CONNECTION WITH ANY FAILURE OR PERFORMANCE, ERROR, OMISSION, INTERRUPTION, DEFECT, DELAY IN OPERATION OR TRANSMISSION, COMPUTER VIRUS OR LINE OR SYSTEM FAILURE. the total aggregate liability of Company or any of the other entities, parties, or persons subject to this liability limitation, arising from, related to or connected with the website, materials contained on the website, or products contained on or sold through the website, SHALL NOT exceed the amounts you paid for the product(s) purchased through the website.<br /><br />Some state laws do not allow the exclusion or limitation of implied warranties or the exclusion or limitation of incidental or consequential damages, so the above disclaimers, limitations and/or exclusions may not apply to you.<br /><br /><strong>NO GUARANTEE OF PRODUCT AVAILABILITY</strong><br />Wild River Technology makes no guarantee that any product(s) contained on the website is in-stock or is otherwise available, and we reserve the right to cancel any order placed for product(s) that are or become unavailable.<br /><br /><strong>BUNDLED ITEMS</strong><br />Bundled items are included and available only while supplies last. Items of similar or greater value may be substituted at our sole discretion.<br /><br /><strong>REBATE COUPONS</strong><br />Rebate coupon redemptions are limited to ONE PER ADDRESS only, unless otherwise noted.<br /><br /><strong>CIRCUMSTANCES BEYOND OUR CONTROL</strong><br />Under no circumstances will Company be liable for failing to perform by the occurrence of any event beyond our reasonable control, including, without limitation, a labor disturbance, an Internet outage or interruption of service, a communications outage, failure by a service provider to perform, fire, terrorism, natural disaster or war.<br /><br /><strong>THIRD-PARTY SERVICES AND LINKS TO OTHER WEBSITES</strong><br />Certain third parties provide services on or through the website.&nbsp; We do not warrant the offerings of any of these third parties. We do not assume any responsibility or liability for the actions, product, or content of all of these or any other third parties.<br /><br />This website contains hyperlinks to outside services and resources which are not owned, operated or affiliated with Company, and which we do not control. These hyperlinks take the user outside the Company website and any concerns or issues relating to goods or services offered for sale at such websites, or such websites themselves, should be directed to the particular company or resource that owns or operates the website in question. You access these websites at your own risk. Company makes no warranties or guarantees concerning the accuracy or safety of such websites or their content, including the products or services available thereon and does not assume any responsibility or liability for the actions, product, service, or content of such websites. Further, Company&nbsp; is not bound by the terms or conditions, if any, of such websites. A link to any other website does not mean, expressly or implicitly, that Company endorses or accepts responsibility for the content or use of such websites, nor does it create any affiliation, connection, endorsement, or sponsorship of such websites or their owners or operators.<br /><br />***<br /><br /><strong>Export Regulations</strong><br />Wild River Technology makes no claim or representation that the materials on this website are available outside of the United States. You may not access, use, download, or export any materials contained on this website in violation of the United States export laws or regulations or in violation of any local laws or regulations.&nbsp; Any warranties are immediately rendered null and void for products exported outside the United States.<br /><br /><strong>Indemnification</strong><br />You agree to defend, indemnify, and hold harmless Wild River Technology, and its affiliates, subsidiaries, and all of their respective shareholders, directors, officers, employees, agents, distributors, vendors, attorneys and other representatives, from and against any and all claims, damages, losses, liabilities, costs and expenses, including without limitation, attorneys’ fees, arising from, connected with, or related to: (i) your use of the website; (ii) alleged breach of these Terms and Conditions; or (iii) any activity related to your account by you or any other person accessing the site using your account.<br /><br /><strong>Dispute Resolution</strong><br />AGREEMENT TO RESOLVE ALL DISPUTES THROUGH ARBITRATION AND AGREEMENT TO WAIVE A RIGHT TO JURY TRIAL AND TO PARTICIPATION IN CLASS ACTIONS.<br /><br />You and Wild River Technology agree to resolve any controversy, dispute, or claim arising out of or relating to your purchase of any product or service from Wild River Technology by binding Arbitration administered by the American Arbitration Association. The prevailing American Arbitration Association Commercial Arbitration Rules and Mediation Procedures and Consumer Related Disputes Supplementary Procedures, if applicable, shall apply. These Arbitration Rules may be found on the American Arbitration Association’s web site at www.adr.org. Any arbitration under this Agreement will take place on an individual basis. Class arbitrations and class actions are not permitted. The arbitration award shall be binding and judgment on the arbitration award rendered by the Arbitrator(s) may be entered in a court having competent jurisdiction to become an enforceable judgment. This agreement to arbitrate is intended to be broadly interpreted and covers all controversies, disputes, or claims arising out of or relating to your purchase of goods from Company, including, but not limited to, contract claims, tort claims and statutory claims, or any combination of claims. You and Company agree that the arbitration proceeding will take place in Washington County, Oregon. You agree that, by entering into this Agreement, you are waiving the right to a trial by jury or to participate in a class action to the extent set forth in this Agreement.<br /><br /><strong>Modification and Termination</strong><br />We may, in our sole discretion, change, modify, suspend, make improvements to or discontinue any aspect of the website, temporarily or permanently, at any time without notice to you, and we will not be liable for doing so.&nbsp; If you do not agree with any changes made to the website, you may elect not to use or visit the website.<br /><br />We reserve the right to immediately terminate these Terms and Conditions and/or your access to and use of the website, including your account, at any time and for any reason, with or without notice.&nbsp; Neither Company nor its affiliates will have any liability for such termination.<br /><br /><strong>Miscellaneous</strong><br />These Terms and Conditions (including the documents referenced herein) contain the entire understanding of you and Company regarding the website, and supersedes all prior and contemporaneous agreements and understandings regarding its subject matter. These Terms and Conditions will be binding upon each party and its successors and permitted assigns, and governed by and construed in accordance with the laws of the State of Oregon without reference to conflict of law principles.&nbsp; These Terms and Conditions and all of your rights and obligations under them will not be assignable or transferable by you without our prior written consent.&nbsp; No failure or delay by a party in exercising any right, power, or privilege under these Terms and Conditions will operate as a waiver thereof, nor will any single or partial exercise of any right, power, or privilege preclude any other or further exercise thereof or the exercise of any other right, power, or privilege under these Terms and Conditions.&nbsp; No agency, partnership, joint venture, or employee-employer relationship is intended or created by these Terms and Conditions.&nbsp; The invalidity or unenforceability of any provision of these Terms and Conditions will not affect the validity or enforceability of any other provision of these Terms and Conditions, all of which will remain in full force and effect.</p>','Terms & Conditions','','publish','open','open','','terms-conditions','','','2018-01-15 10:31:27','2018-01-15 18:31:27','',0,'https://testsite.wildrivertech.com/2018/01/15/terms-conditions/',9,'post','',0),(27,2,'2018-01-15 11:05:47','2018-01-16 03:05:47','','cmp-28-32 28G and 32G Channel Modeling Platform','EDA SIMULATION AND MEASUREMENT','inherit','open','closed','','attachment-cmp-28-32-28g-and-32g-channel-modeling-platform','','','2021-08-02 15:26:07','2021-08-02 22:26:07','',29,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cmp-28-32-channel-modeling-platform.png',0,'attachment','image/png',0),(28,2,'2018-01-15 11:05:47','2018-01-15 19:05:47','','CMP-28-32_Data_Brief_Rev11','EDA SIMULATION AND MEASUREMENT TOOL','inherit','open','closed','','attachment-cmp-28-32_data_brief_rev11','','','2021-08-02 15:26:07','2021-08-02 22:26:07','',29,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/CMP-28-32_Data_Brief_Rev11.pdf',0,'attachment','application/pdf',0),(29,2,'2018-01-15 11:05:47','2018-01-15 19:05:47','<p><img class=\" alignright size-full wp-image-27\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cmp-28-32-channel-modeling-platform.png\" alt=\"cmp-28-32 28G and 32G Channel Modeling Platform\" width=\"40%\" style=\"margin: 0 0 30px 50px;\" title=\"EDA SIMULATION AND MEASUREMENT\" align=\"right\" /><strong>Industry-First EDA Simulation to Measurement Tool:</strong></p>\r\n<p>The Wild River Technology CMP-28/32 Standard Channel Modeling Platform represents a powerful tool for development of high-speed systems up to 50 GHz. The primary target application for the CMP-28/32 is 3D-EM solver analysis versus time and frequency domain measurement methodology. It combines 27 structures based on a consistent development of primitive structures useful for performing a host of calibrations including automatic fixture removal, unknown THRU, WinCal XE™ calibration, and VNA gating and time transform analysis. More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n<p>The CMP-28 and CMP-32 provide the following features:</p>\r\n<ul>\r\n<li>Assembled with 2.92mm (CMP-28) or 2.4mm (CMP-32) connectors</li>\r\n<li>3D EM benchmark structures\r\n<ul>\r\n<li>Loss structures for material extraction</li>\r\n<li>Resonators for measurement correspondence</li>\r\n<li>Multi-impedance structures for VNA time transform analysis</li>\r\n</ul>\r\n</li>\r\n<li>TVNA-VNA analysis structure\r\n<ul>\r\n<li>TDR resolvers for ultra-fast TDR (11 psec and 28 psec rise times)</li>\r\n</ul>\r\n</li>\r\n<li>Allegro layout provided for easy 3D EM import</li>\r\n<li>Family of via fields</li>\r\n</ul>\r\n<p>Applications:</p>\r\n<ul>\r\n<li>3D-EM and measurement assistance for the SI practitioner\r\n<ul>\r\n<li>Vias</li>\r\n<li>Multimode analysis</li>\r\n<li>Meshing analysis structure</li>\r\n<li>Advanced material extraction and loss modeling</li>\r\n</ul>\r\n</li>\r\n<li>THRU calibration, T-matrix de-embedding</li>\r\n<li>Advanced crosstalk analysis</li>\r\n<li>TRL/LRM calibration verification/benchmark</li>\r\n</ul>\r\n<p><strong><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/CMP-28-32_Data_Brief_Rev11.pdf\" title=\"EDA SIMULATION AND MEASUREMENT TOOL\">DOWNLOAD DATASHEET</a></strong></p>','32 Gbpsec and 50 GHz Standard Channel Modeling Platform EDA Package CMP-28/CMP-32','','publish','open','open','','cmp-28-industry-first-eda-simulation-to-measurement-tool','','','2018-01-15 11:05:47','2018-01-15 19:05:47','',0,'https://testsite.wildrivertech.com/2018/01/15/cmp-28-industry-first-eda-simulation-to-measurement-tool/',3,'post','',0),(30,2,'2018-01-15 11:11:44','2018-01-16 03:11:44','','Wild River Technology 28G &amp; 32G ISI Loss Modeling Platforms','','inherit','open','closed','','attachment-wild-river-technology-28g-32g-isi-loss-modeling-platforms','','','2021-08-02 15:26:20','2021-08-02 22:26:20','',32,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/ISI-28-32.png',0,'attachment','image/png',0),(31,2,'2018-01-15 11:11:44','2018-01-15 19:11:44','','ISI-28-32_Data_Brief_Rev1','','inherit','open','closed','','attachment-isi-28-32_data_brief_rev1','','','2021-08-02 15:26:20','2021-08-02 22:26:20','',32,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/ISI-28-32_Data_Brief_Rev1.pdf',0,'attachment','application/pdf',0),(32,2,'2018-01-15 11:11:44','2018-01-15 19:11:44','<p><img class=\" alignright size-full wp-image-30\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/ISI-28-32.png\" alt=\"Wild River Technology 28G &amp; 32G ISI Loss Modeling Platforms\" width=\"40%\" style=\"margin: 0 0 30px 50px;\" align=\"right\" /><strong>6-32 Gbpsec Advanced SerDes Testing – Channel Optimization – Tolerance Testing</strong></p>\r\n<p>The ISI-28/ISI-32 represents the next generation of Wild River Technology platforms with controlled amounts of intersymbol interference (ISI) for creating jitter to 32 Gbpsec. True ISI is created by loss generated with dielectric and skin effect only. Group delay variation, an important loss consideration for data rates exceeding 10 Gbpsec, has been minimized with special layout techniques, pristine connector launches, and the use of controlled-weave dielectric material.</p>\r\n<p>The Wild River Technology ISI Platform is composed of nine microstrip and&nbsp;nine stripline differential pairs of various lengths.&nbsp; Ground vias surrounding each structure preserve jitter spectral purity by suppressing unwanted resonance. More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n<p>Features</p>\r\n<ul>\r\n<li>Loss from –5dB to –40dB at 10 and 28 Gbpsec</li>\r\n<li>Causal/passive high-quality S-parameters included</li>\r\n<li>Superb signal integrity</li>\r\n<li>Pristine launch design</li>\r\n<li>Assembled with 2.92mm (ISI-28) or 2.4mm (ISI-32) connectors</li>\r\n</ul>\r\n<p><strong><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/ISI-28-32_Data_Brief_Rev1.pdf\">DOWNLOAD DATASHEET</a></strong></p>','28G & 32G Intersymbol Interference (ISI) Loss Modeling Platforms','','publish','open','open','','isi-28-isi-32','','','2018-01-15 11:11:44','2018-01-15 19:11:44','',0,'https://testsite.wildrivertech.com/2018/01/15/isi-28-isi-32/',2,'post','',0),(33,2,'2018-01-15 11:16:44','2018-01-16 03:16:44','','Wild River Technology XTALK-28-32 crosstalk modeling platform','','inherit','open','closed','','attachment-wild-river-technology-xtalk-28-32-crosstalk-modeling-platform','','','2021-08-02 15:26:23','2021-08-02 22:26:23','',35,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/XTALK-28-32-crosstalk-modeling-platform.png',0,'attachment','image/png',0),(34,2,'2018-01-15 11:16:44','2018-01-15 19:16:44','','XTALK-32-Data-Brief_201512111','','inherit','open','closed','','attachment-xtalk-32-data-brief_201512111','','','2021-08-02 15:26:23','2021-08-02 22:26:23','',35,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/XTALK-32-Data-Brief_201512111.pdf',0,'attachment','application/pdf',0),(35,2,'2018-01-15 11:16:44','2018-01-15 19:16:44','<p><img class=\" alignright size-full wp-image-33\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/XTALK-28-32-crosstalk-modeling-platform.png\" alt=\"Wild River Technology XTALK-28-32 crosstalk modeling platform\" width=\"40%\" style=\"margin: 0 0 30px 50px;\" align=\"right\" /><strong>Crosstalk Testing, Channel Optimization, Tolerance Testing: <br /></strong></p>\r\n<p style=\"margin: .1pt 0in .1pt 0in;\">This is an industry-first crosstalk testing platform consisting of a family of loss and insertion-crosstalk ratio (ICR) designed to challenge 6-32 Gbpsec systems and PAM-4, 56 Gbpsec. ICR is a basic measure of signal versus crosstalk energy (similar to signal/noise) and provides 50 (very low crosstalk) to 15 (very high crosstalk) for both 10&nbsp;Gbpsec and 28 Gbpsec systems. Crosstalk energy and victim loss can further be tuned with optional pad kit. Structures can be combined with other platforms or on-board structures using optional low-skew &lt;1 psec <a href=\"https://testsite.wildrivertech.com/2018/01/21/cable-assemblies/\" title=\"Wild River Technology matched cables\">matched cable kit. </a>More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n<p>Features</p>\r\n<ul>\r\n<li>Industry-first crosstalk channel modeling package for creating real crosstalk, not synthesized!</li>\r\n<li>Family of ICR for common compliance specifications 802.3, CEI, USB 3.0, 10GBase-KR, SAS3, PCI Express Gen3, 40GbE, 100GbE, 16XFC</li>\r\n<li>S-parameter library for pre-silicon analysis</li>\r\n<li>Clean-pure crosstalk with no signal integrity structure set included</li>\r\n<li>Crosstalk with -5 and -10dB return loss for mimicking problem backplanechannels</li>\r\n<li>Optional <a href=\"https://testsite.wildrivertech.com/2018/01/21/cable-assemblies/\" title=\"WRT skew-matched cable pairs\">Wild River Technology skew-matched cable pairs</a> to use with ISI-28/32 for adding loss</li>\r\n</ul>\r\n<p><strong><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/XTALK-32-Data-Brief_201512111.pdf\">DOWNLOAD DATASHEET</a></strong></p>','Crosstalk Channel Modeling Platform, 6-56 Gbpsec, XTALK-32','','publish','open','open','','crosstalk-testing-channel-optimization-tolerance-testing','','','2021-08-02 15:27:29','2021-08-02 22:27:29','',0,'https://testsite.wildrivertech.com/2018/01/15/crosstalk-testing-channel-optimization-tolerance-testing/',3,'post','',0),(36,2,'2018-01-15 11:20:45','2018-01-16 03:20:45','','cmp70','','inherit','open','closed','','attachment-cmp70','','','2021-08-02 15:26:27','2021-08-02 22:26:27','',37,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cmp70.png',0,'attachment','image/png',0),(37,2,'2018-01-15 11:20:45','2018-01-15 19:20:45','<p><img class=\" alignright size-full wp-image-36\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cmp70.png\" alt=\"\" width=\"40%\" style=\"margin: 0 0 30px 50px;\" align=\"right\" /><strong>Custom High-Speed Channel Modeling Platform </strong></p>\r\n<p>For development of high-speed systems based on your stack-up. Includes full HFSS and Simbeor model library to 70 GHz. Deliverables include pristine connector launches and stellar via designs, cross section analysis, and unimpeachable material/loss models. More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n<h2>Features</h2>\r\n<ul>\r\n<li>12 weeks typical completion</li>\r\n<li>Launch design 3X better than IEEE PG370 compliance</li>\r\n<li>Via and HDI interconnect optimization</li>\r\n<li>Material extraction including surface roughness modeling provided</li>\r\n<li>Allegro layout (.brd or OBD++)</li>\r\n</ul>','Custom Channel Modeling Platform CMP-70','','publish','open','open','','cmp-70-custom-channel-modeling-platform','','','2018-01-15 11:20:45','2018-01-15 19:20:45','',0,'https://testsite.wildrivertech.com/2018/01/15/cmp-70-custom-channel-modeling-platform/',0,'post','',0),(38,2,'2018-01-20 19:54:02','2018-01-21 11:54:02','','Cable assembly, yellow 1501 flexible, hermetic sealable, 2.92mm male connectors','','inherit','open','closed','','attachment-cable-assembly-yellow-1501-flexible-hermetic-sealable-2-92mm-male-connectors','','','2021-08-02 15:26:28','2021-08-02 22:26:28','',41,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-yellow-1501-flexible-hermetic-sealable_800pxW.jpg',0,'attachment','image/jpeg',0),(39,2,'2018-01-20 19:54:02','2018-01-21 03:54:02','','Connector close-up, Cable matched pair, yellow 1501 flexible hermetic sealable connectors','','inherit','open','closed','','attachment-connector-close-up-cable-matched-pair-yellow-1501-flexible-hermetic-sealable-connectors','','','2021-08-02 15:26:28','2021-08-02 22:26:28','',41,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-yellow-1501-flexible-hermetic-sealable_connectors-500pxW.jpg',0,'attachment','image/jpeg',0),(40,2,'2018-01-20 19:54:02','2018-01-21 03:54:02','','Cable assembly, yellow 1501 flexible, hermetic sealable, example connection','','inherit','open','closed','','attachment-cable-assembly-yellow-1501-flexible-hermetic-sealable-example-connection','','','2021-08-02 15:26:28','2021-08-02 22:26:28','',41,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-yellow-1501-flexible-hermetic-sealable_example.jpg',0,'attachment','image/jpeg',0),(41,2,'2018-01-20 19:54:02','2018-01-21 03:54:02','<table style=\"width: 100%;\">\r\n<tbody>\r\n<tr valign=\"top\">\r\n<td style=\"width: 50%;\">\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"></span></span></strong>Wild River Technology hermetically sealable matched cables are specifically designed for 10-32 Gbpsec jitter analysis. Skew matched to 1ps, these flexible cable assemblies have 2.92 mm male connectors (custom configurations available, contact WRT) and unmatched phase stability, which results in repeatable measurements of jitter. These U.S.-manufactured cables accomplish low return loss up to 40 GHz.</p>\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<p>This cable utilizes a silver-plated copper conductor with a very low-loss expanded-PTFE dielectric. The shield consists of two conductive layers. The first layer is a silver-plated copper flat wire, applied to&nbsp;yield low contact resistance, resulting in low insertion loss. The second layer is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded FEP.</p>\r\n<p>Each cable is individually hand tested and comes with the measured s2p Touchstone file.</p>\r\n<p><strong>What You Get with Your Order</strong></p>\r\n<ul>\r\n<li>Cables</li>\r\n<li>UV curing lamp</li>\r\n<li>Loctite SI 5056 light cure adhesive</li>\r\n<li>Spudger tool (Used for removing sealant)</li>\r\n<li>Thumb drive. Contents:\r\n<ul>\r\n<li>Video on how to seal the cable connectors</li>\r\n<li>Full VNA measurement results</li>\r\n<li>Usage procedure for sealing the cable connectors</li>\r\n</ul>\r\n</li>\r\n<li>Printed Documents\r\n<ul>\r\n<li>Certificate of compliance</li>\r\n<li>Graphs of VNA results</li>\r\n<li>Usage procedure for sealing the cable connectors</li>\r\n</ul>\r\n</li>\r\n</ul>\r\n<p>More information:&nbsp;<a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n</div>\r\n</td>\r\n<td style=\"padding-left: 10%;\">\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-38\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-yellow-1501-flexible-hermetic-sealable_800pxW.jpg\" alt=\"Cable assembly, yellow 1501 flexible, hermetic sealable, 2.92mm male connectors\" width=\"100%\" /><br /></span></span></strong></p>\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-39\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-yellow-1501-flexible-hermetic-sealable_connectors-500pxW.jpg\" alt=\"Connector close-up, Cable matched pair, yellow 1501 flexible hermetic sealable connectors\" width=\"100%\" /></span></span></strong></p>\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-40\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-yellow-1501-flexible-hermetic-sealable_example.jpg\" alt=\"Cable assembly, yellow 1501 flexible, hermetic sealable, example connection\" width=\"100%\" /></span></span></strong></p>\r\n</td>\r\n</tr>\r\n</tbody>\r\n</table>','Skew Matched Flexible Cable Assembly Pairs with 2.92mm Male Connectors, Hermetically Sealable','','publish','open','open','','cable-set-skew-matched-2-92mm-male-connectors-hermetically-sealable','','','2018-01-20 19:54:02','2018-01-21 03:54:02','',0,'https://testsite.wildrivertech.com/2018/01/20/cable-set-skew-matched-2-92mm-male-connectors-hermetically-sealable/',6,'post','',0),(42,2,'2018-01-20 19:54:02','2018-01-21 11:54:02','','Cable assembly, blue DXM086 flexible, 1.85mm male connectors','','inherit','open','closed','','attachment-cable-assembly-blue-dxm086-flexible-1-85mm-male-connectors','','','2021-08-02 15:26:29','2021-08-02 22:26:29','',44,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-blue-DXM086-flexible.jpg',0,'attachment','image/jpeg',0),(43,2,'2018-01-20 19:54:02','2018-01-21 03:54:02','<table style=\"width: 100%;\">\r\n<tbody>\r\n<tr valign=\"top\">\r\n<td style=\"width: 50%;\"><strong><span class=\"sku_wrapper\">SKU: <span class=\"sku\">501-xxx.x-02</span></span></strong>\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n\r\nBlue DXM086 flexible coaxial cable assemblies with 1.85mm compatible male connectors on both ends. Specification: 16dB return loss or better through 65 GHz.\r\n\r\nThe DXM086 series cable is a low-loss and phase-stable cable. This cable series meets all the material requirements outlined in the MIL-C-17 specification. This cable utilizes silver plated copper conductor, with a very low-loss expanded PTFE dielectric. The shield consists of two conductive layers. The first layer is a silver-plated copper flat wire, applied to yield low contact resistance and resulting in low insertion loss.The second layer is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded FEP.\r\n\r\nThis assembly uses matched 1.85mm male connectors for low return loss up to 65 GHz. These DXM086 flexible cable assemblies make great, cost-effective test cables.\r\n\r\nMore information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a>\r\n\r\n</div>\r\n</div></td>\r\n<td style=\"padding-left: 10%;\"><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-42\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-blue-DXM086-flexible.jpg\" alt=\"Cable assembly, blue DXM086 flexible, 1.85mm male connectors\" width=\"100%\" />\r\n</span></span></strong></td>\r\n</tr>\r\n</tbody>\r\n</table>','DXM086 Flexible Coaxial Cable Assembly with 1.85mm Male Connectors','','publish','open','open','','coaxial-cable-assembly-with-1-85mm-male-connectors','','','2021-08-02 15:33:39','2021-08-02 22:33:39','',0,'https://testsite.wildrivertech.com/2018/01/20/coaxial-cable-assembly-with-1-85mm-male-connectors/',5,'post','',0),(103,2,'2021-08-02 15:33:39','2021-08-02 22:33:39','<table style=\"width: 100%;\">\r\n<tbody>\r\n<tr valign=\"top\">\r\n<td style=\"width: 50%;\"><strong><span class=\"sku_wrapper\">SKU: <span class=\"sku\">501-xxx.x-02</span></span></strong>\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n\r\nBlue DXM086 flexible coaxial cable assemblies with 1.85mm compatible male connectors on both ends. Specification: 16dB return loss or better through 65 GHz.\r\n\r\nThe DXM086 series cable is a low-loss and phase-stable cable. This cable series meets all the material requirements outlined in the MIL-C-17 specification. This cable utilizes silver plated copper conductor, with a very low-loss expanded PTFE dielectric. The shield consists of two conductive layers. The first layer is a silver-plated copper flat wire, applied to yield low contact resistance and resulting in low insertion loss.The second layer is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded FEP.\r\n\r\nThis assembly uses matched 1.85mm male connectors for low return loss up to 65 GHz. These DXM086 flexible cable assemblies make great, cost-effective test cables.\r\n\r\nMore information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a>\r\n\r\n</div>\r\n</div></td>\r\n<td style=\"padding-left: 10%;\"><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-42\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-blue-DXM086-flexible.jpg\" alt=\"Cable assembly, blue DXM086 flexible, 1.85mm male connectors\" width=\"100%\" />\r\n</span></span></strong></td>\r\n</tr>\r\n</tbody>\r\n</table>','DXM086 Flexible Coaxial Cable Assembly with 1.85mm Male Connectors','','inherit','closed','closed','','43-revision-v1','','','2021-08-02 15:33:39','2021-08-02 22:33:39','',43,'https://testsite.wildrivertech.com/?p=103',0,'revision','',0),(44,2,'2018-01-20 19:54:02','2018-01-21 03:54:02','<table style=\"width: 100%;\">\r\n<tbody>\r\n<tr valign=\"top\">\r\n<td style=\"width: 50%;\">\r\n<p><strong><span class=\"sku_wrapper\">SKU:&nbsp;<span class=\"sku\">501-xxx.x-02</span></span></strong></p>\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<p>Blue DXM086 flexible coaxial cable assembly with 2.4mm compatible male connectors on both ends. Specification: 16dB return loss or better through 50 GHz.</p>\r\n<p>The DXM086 series cable is a low-loss and phase-stable cable. This cable series meets all the material requirements outlined in the MIL-C-17 specification. This cable utilizes silver-plated copper conductor, with a very low loss expanded PTFE dielectric. The shield consists of two conductive layers: the first layer is a silver-plated copper flat wire, applied so that it yields low contact resistance, resulting in low insertion loss. The second layer is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded FEP.</p>\r\n<p>This assembly uses matched 2.4mm male connectors for low return loss up to 50 GHz. These assemblies make great, cost-effective test cables.</p>\r\n<p>More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n</div>\r\n</div>\r\n</div>\r\n</td>\r\n<td style=\"padding-left: 10%;\">\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-42\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-blue-DXM086-flexible.jpg\" alt=\"Cable assembly, blue DXM086 flexible, 2.4mm male connectors\" width=\"100%\" /><br /></span></span></strong></p>\r\n</td>\r\n</tr>\r\n</tbody>\r\n</table>','DXM086 Flexible Coaxial Cable Assembly with 2.4mm Male Connectors','','publish','open','open','','coaxial-cable-assembly-with-2-4mm-connectors','','','2018-01-20 19:54:02','2018-01-21 03:54:02','',0,'https://testsite.wildrivertech.com/2018/01/20/coaxial-cable-assembly-with-2-4mm-connectors/',4,'post','',0),(45,2,'2018-01-20 19:54:02','2018-01-21 11:54:02','','Cable assembly yellow 1501 flexible','','inherit','open','closed','','attachment-cable-assembly-yellow-1501-flexible','','','2021-08-02 15:26:29','2021-08-02 22:26:29','',46,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-yellow-1501-flexible.jpg',0,'attachment','image/jpeg',0),(46,2,'2018-01-20 19:54:02','2018-01-21 03:54:02','<table style=\"width: 100%;\">\r\n<tbody>\r\n<tr valign=\"top\">\r\n<td style=\"width: 50%;\">\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"></span></span></strong>Yellow 1501 flexible coaxial cable assemblies with 2.92mm-compatible male connectors on both ends. Specification: 16dB return loss or better through 40 GHz.</p>\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<p>The 1501 series cable is a low-loss, phase-stable cable. This flexible cable series meets all MIL-C-17 specification material requirements. This cable utilizes silver-plated copper conductor with a very low-loss expanded PTFE dielectric. The shield consists of two conductive layers. Layer one is a silver-plated copper flat wire, applied to yield low contact resistance, resulting in low insertion loss. Layer two is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded fluorinated ethylene propylene (<em>FEP</em>).</p>\r\n<p>This flexible cable assembly uses matched 2.92mm connectors to deliver low return loss up to 40 GHz. These flexible coaxial cable assemblies make great, cost-effective test cables.</p>\r\n<p>More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n</div>\r\n</div>\r\n</td>\r\n<td style=\"padding-left: 10%;\">\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-45\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-yellow-1501-flexible.jpg\" alt=\"Cable assembly yellow 1501 flexible\" width=\"100%\" /><br /></span></span></strong></p>\r\n</td>\r\n</tr>\r\n</tbody>\r\n</table>','1501 Flexible Coaxial Cable Assembly with 2.92mm Male Connectors','','publish','open','open','','coaxial-cable-assembly-with-2-92mm-connectors','','','2018-01-20 19:54:02','2018-01-21 03:54:02','',0,'https://testsite.wildrivertech.com/2018/01/20/coaxial-cable-assembly-with-2-92mm-connectors/',3,'post','',0),(47,2,'2018-01-20 19:54:02','2018-01-21 11:54:02','','Cable assembly pairs, blue DXM086, flexible, matched to 1psec','','inherit','open','closed','','attachment-cable-assembly-pairs-blue-dxm086-flexible-matched-to-1psec','','','2021-08-02 15:26:30','2021-08-02 22:26:30','',49,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-pairs-blue-DXM086-flexible-matched-to-1psec.jpg',0,'attachment','image/jpeg',0),(48,2,'2018-01-20 19:54:02','2018-01-21 03:54:02','<table style=\"width: 100%;\">\r\n<tbody>\r\n<tr valign=\"top\">\r\n<td style=\"width: 50%;\">\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"></span></span></strong>Skew matched cable pairs: blue DXM086 flexible coaxial cable assemblies with 2.4mm-compatible male connectors on both ends.&nbsp;Specification: 16dB return loss or better through 50 GHz, 1ps or less skew matched cable pairs.</p>\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<p>The&nbsp;DXM086 series cable is a low-loss, phase-stable cable. This cable series meets all the material requirements outlined in the MIL-C-17 specification. This cable utilizes silver-plated copper conductor, with a very low loss expanded PTFE dielectric. The shield consists of two conductive layers. The first layer is a silver-plated copper flat wire, applied to yield low contact resistance and result in low insertion loss. The second layer is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded FEP.</p>\r\n<p>This assembly uses matched 2.4mm male connectors to accomplish low return loss up to 50 GHz. These assemblies make great, cost-effective test cables.</p>\r\n<p>More information:&nbsp;<a>sales@wildrivertech.com</a></p>\r\n</div>\r\n</div>\r\n</td>\r\n<td style=\"padding-left: 10%;\">\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-47\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-pairs-blue-DXM086-flexible-matched-to-1psec.jpg\" alt=\"Cable assembly pairs, blue DXM086, flexible, matched to 1psec\" width=\"100%\" /></span></span></strong></p>\r\n</td>\r\n</tr>\r\n</tbody>\r\n</table>','Skew Matched DXM086 Flexible Coaxial Cable Assembly Pairs with 2.4mm Male Connectors','','publish','open','open','','matched-coaxial-cable-assemblies-with-2-4mm-male-connectors','','','2018-01-20 19:54:02','2018-01-21 03:54:02','',0,'https://testsite.wildrivertech.com/2018/01/20/matched-coaxial-cable-assemblies-with-2-4mm-male-connectors/',2,'post','',0),(49,2,'2018-01-20 19:54:02','2018-01-21 03:54:02','<table style=\"width: 100%;\">\r\n<tbody>\r\n<tr valign=\"top\">\r\n<td style=\"width: 50%;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\" style=\"display: block;\">\r\n<p>Blue DXM086 flexible coaxial cable assemblies with 1.85mm-compatible male connectors on both ends. Specification: 16dB return loss or better through&nbsp;65 GHz, 1ps or less skew matched cable pairs.</p>\r\n<p>The&nbsp;DXM086 series cable is a low-loss, phase-stable cable. This cable series meets all the material requirements outlined in the MIL-C-17 specification. This cable utilizes silver-plated copper conductor, with a very low-loss expanded-PTFE dielectric. The shield consists of two conductive layers. The first layer is a silver-plated copper flat wire, applied to yield low contact resistance and resulting in low insertion loss. The second layer is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded FEP.</p>\r\n<p>This assembly uses matched 1.85mm male connectors for low return loss up to&nbsp;65 GHz. These assemblies make great, cost-effective test cables.</p>\r\n<p>For more information, please contact our sales group at: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n</div>\r\n</div>\r\n</div>\r\n</td>\r\n<td style=\"padding-left: 10%;\">\r\n<p><strong><span class=\"sku_wrapper\"><span class=\"sku\"><img class=\" size-full wp-image-47\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/cable-assembly-pairs-blue-DXM086-flexible-matched-to-1psec.jpg\" alt=\"Cable assembly pairs, blue DXM086, flexible, matched to 1psec\" width=\"100%\" /><br /></span></span></strong></p>\r\n</td>\r\n</tr>\r\n</tbody>\r\n</table>','Matched DXM086 Flexible Coaxial Cable Assembly Pairs with 1.85mm Male Connectors','','publish','open','open','','matched-coaxial-cable-assembly-pairs-with-1-85mm-male-connectors','','','2018-01-20 19:54:02','2018-01-21 03:54:02','',0,'https://testsite.wildrivertech.com/2018/01/20/matched-coaxial-cable-assembly-pairs-with-1-85mm-male-connectors/',1,'post','',0),(50,2,'2018-01-21 18:10:14','2018-01-22 10:10:14','','jimbell','','inherit','open','closed','','attachment-jimbell','','','2021-08-02 15:26:30','2021-08-02 22:26:30','',57,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/jimbell.jpg',0,'attachment','image/jpeg',0),(51,2,'2018-01-21 18:10:14','2018-01-22 02:10:14','','WRT_ClassesTraining_2016_41','','inherit','open','closed','','attachment-wrt_classestraining_2016_41','','','2021-08-02 15:26:30','2021-08-02 22:26:30','',57,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/WRT_ClassesTraining_2016_41.pdf',0,'attachment','application/pdf',0),(52,2,'2018-01-21 18:10:14','2018-01-22 02:10:14','','Simbeor-Training-Brief','','inherit','open','closed','','attachment-simbeor-training-brief','','','2021-08-02 15:26:30','2021-08-02 22:26:30','',57,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/Simbeor-Training-Brief.pdf',0,'attachment','application/pdf',0),(53,2,'2018-01-21 18:10:14','2018-01-22 02:10:14','','alneves','','inherit','open','closed','','attachment-alneves','','','2021-08-02 15:26:30','2021-08-02 22:26:30','',57,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/alneves.jpg',0,'attachment','image/jpeg',0),(54,2,'2018-01-21 18:10:14','2018-01-22 02:10:14','','tomdagostino','','inherit','open','closed','','attachment-tomdagostino','','','2021-08-02 15:26:30','2021-08-02 22:26:30','',57,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/tomdagostino.jpg',0,'attachment','image/jpeg',0),(55,2,'2018-01-21 18:10:14','2018-01-22 02:10:14','','yuriyshlepnev','','inherit','open','closed','','attachment-yuriyshlepnev','','','2021-08-02 15:26:30','2021-08-02 22:26:30','',57,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/yuriyshlepnev.jpg',0,'attachment','image/jpeg',0),(56,2,'2018-01-21 18:10:14','2018-01-22 02:10:14','','ransomstephens','','inherit','open','closed','','attachment-ransomstephens','','','2021-08-02 15:26:30','2021-08-02 22:26:30','',57,'https://testsite.wildrivertech.com/wp-content/uploads/2018/01/ransomstephens.jpg',0,'attachment','image/jpeg',0),(57,2,'2018-01-21 18:10:14','2018-01-22 02:10:14','<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/WRT_ClassesTraining_2016_41.pdf\">Download the Wild River Technology signal integrity training brief.  </a></p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/Simbeor-Training-Brief.pdf\">Download the Simbeor EDA training brief.</a></p>\r\n<p>Contact us to set up a training class: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a>.</p>\r\n<p><strong>Classes Offered</strong></p>\r\n<table width=\"100%\">\r\n<tbody>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6; padding: 5px;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>Class No.</strong></span></td>\r\n<td style=\"text-align: center; background-color: #4bacc6; padding: 5px;\" width=\"615\"><span style=\"color: #ffffff;\"><strong>Title</strong></span></td>\r\n</tr>\r\n<tr style=\"border-top: 2px solid #000000;\">\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>ADS-01</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Advanced Time-Domain Analysis (TDR/TDT) Using Keysight ADS</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>ADS-02</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Advanced ADS for Signal Integrity Engineers</span></td>\r\n</tr>\r\n<tr style=\"border-top: 2px solid #000000;\">\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>JITT-01</strong></span></td>\r\n<td style=\"padding: 5px; background: #ccc;\" width=\"615\"><span style=\"color: #000000;\">10G BASE KR</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>JITT-02</strong></span></td>\r\n<td style=\"padding: 5px; background: #ccc;\" width=\"615\"><span style=\"color: #000000;\">100G Ethernet Signaling</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>JITT-03</strong></span></td>\r\n<td style=\"padding: 5px; background: #ccc;\" width=\"615\"><span style=\"color: #000000;\">Advanced Crosstalk and Peak Distortion Analysis, Conquering Difficult SI</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>JITT-04</strong></span></td>\r\n<td style=\"padding: 5px; background: #ccc;\" width=\"615\"><span style=\"color: #000000;\">Get up to Date in High-Speed Tech: COM, ICN, eTJ, eBUJ</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>JITT-05</strong></span></td>\r\n<td style=\"padding: 5px; background: #ccc;\" width=\"615\"><span style=\"color: #000000;\">Channel Optimization by Combining Modeling and Measurement</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>JITT-06</strong></span></td>\r\n<td style=\"padding: 5px; background: #ccc;\" width=\"615\"><span style=\"color: #000000;\">Advancing to the Edge: 56G Design, Compliance, and Debug</span></td>\r\n</tr>\r\n<tr style=\"border-top: 2px solid #000000;\">\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>SI-01</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Jitter Analysis Essentials for Signal Integrity Engineers</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>SI-02</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Mastering High-Speed I/O: Compliance, Diagnostics, and Simulation</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>SI-03</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Understanding, Debugging, and Testing High-Speed I/O</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>SI-04</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Advanced TDR and VNA Measurement Methodology</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>SI-05</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">WRT Channel Modeling for Advanced EDA to Measurement Correspondence</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>SI-06</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Introduction into computational electromagnetics for interconnect analysis</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>SI-07</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Multiport theory for interconnect analysis</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\"><span style=\"color: #ffffff;\"><strong>SI-08</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Analysis of signal propagation in interconnects</span></td>\r\n</tr>\r\n<tr>\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>SI-09</strong></span></td>\r\n<td style=\"padding: 5px;\" width=\"615\"><span style=\"color: #000000;\">Simbeor EDA Training for Signal Integrity Engineers</span></td>\r\n</tr>\r\n<tr style=\"border-top: 2px solid #000000;\">\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>TDR-01</strong></span></td>\r\n<td style=\"padding: 5px; background: #ccc;\" width=\"615\"><span style=\"color: #000000;\">TDR Basics</span></td>\r\n</tr>\r\n<tr style=\"border-bottom: 2px solid #000000;\">\r\n<td style=\"text-align: center; background-color: #4bacc6;\" width=\"92\"><span style=\"color: #ffffff;\"><strong>TDR-02</strong></span></td>\r\n<td style=\"padding: 5px; background: #ccc;\" width=\"615\"><span style=\"color: #000000;\">TDR Based Modeling Using Tektronix’ IConnect</span></td>\r\n</tr>\r\n</tbody>\r\n</table>\r\n<p>Meet the Instructors:</p>\r\n<table style=\"border: none; font-size: 0.8em; line-height: 1.2em;\" width=\"100%\">\r\n<tbody>\r\n<tr valign=\"top\">\r\n<td style=\"border: none; padding: 10px;\" width=\"16%\"><strong>James Bell<br /><br /></strong> <img class=\" size-full wp-image-50\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/jimbell.jpg\" width=\"100%\" /><br /><br /> James teaches Simbeor basics. He is one of the founders of Wild River Technology and is an experienced design and signal integrity engineer with over 30 years’ experience in complex system design, interconnect, and signal integrity engineering. He has been a consultant to engineering organizations world-wide, with expertise in pre- and post-route signal integrity and timing validation for advanced systems. He earned his B.S. in Electrical Engineering at Northern Arizona University.</td>\r\n<td style=\"border: none; padding: 10px;\" width=\"16%\"><strong>Alfred Neves<br /><br /></strong> <img class=\" size-full wp-image-53\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/alneves.jpg\" width=\"100%\" /><br /><br /> Al teaches VNA, TDR, and channel modeling classes. Al is a Signal Integrity practitioner with over 30 years of experience in design and applications, and is one of the founders of WRT, and developed their physical layer and channel modeling platforms.</td>\r\n<td style=\"border: none; padding: 10px;\" width=\"16%\"><strong>Tom Dagostino<br /><br /></strong> <img class=\" size-full wp-image-54\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/tomdagostino.jpg\" width=\"100%\" /><br /><br /> Tom founded Teraspeed Labs in 2002 to make measurement based IBIS Models and Signal Integrity related measurements for end customers. This is the continuation of his work that started in 1994 at Zeelan Technology and Mentor Graphics. In addition Tom supports the Tektronix IConnect TDR based modeling tool. Tom was also employed at Tektronix between 1974 and 1993 as a design engineer of digital oscilloscopes, project manager and performed market research and product planning in an inbound marketing position. Tom was awarded with 10 US patents during his early work developing digital oscilloscopes. Tom has also developed and taught classes on IBIS modeling and debugging, TDR technology and measurement based modeling techniques. Tom earned his BSEE from Worcester Polytechnic Institute.</td>\r\n<td style=\"border: none; padding: 10px;\" width=\"16%\"><strong>Yuriy Shlepnev, Ph.D.<br /><br /></strong> <img class=\" size-full wp-image-55\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/yuriyshlepnev.jpg\" width=\"100%\" /><br /><br /> Yuriy teaches Advanced Electromagnetic Principles for Signal Integrity Engineers and is President and Founder of Simberian Inc., where he develops Simbeor electromagnetic signal integrity software. He received his Ph.D. degree in computational electromagnetics from Siberian State University of Telecommunications and Informatics in 1990. He was the principal developer of electromagnetic simulator for Eagleware Corporation and the leading developer of electromagnetic software for simulation of signal and power distribution networks at Mentor Graphics.</td>\r\n<td style=\"border: none; padding: 10px;\" width=\"16%\"><strong>Ransom Stephens, Ph.D<br /><br /></strong> <img class=\" size-full wp-image-56\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/ransomstephens.jpg\" width=\"100%\" /><br /><br /> Ransom teaches all jitter classes and helps engineers advance to technology\'s cutting edge. A pioneer in jitter analysis, he has served on the electrical working groups for several high data rate standards and has written over 300 articles, white papers, and application notes in the electronics industry.</td>\r\n</tr>\r\n</tbody>\r\n</table>\r\n<p> </p>\r\n<p> </p>\r\n<p> </p>','Training','','publish','open','open','','training','','','2018-01-21 18:10:14','2018-01-22 02:10:14','',0,'https://testsite.wildrivertech.com/2018/01/21/training/',8,'post','',0),(58,2,'2018-01-21 18:11:49','2018-01-22 02:11:49','','Videos','','publish','open','open','','videos','','','2018-01-21 18:11:49','2018-01-22 02:11:49','',0,'https://testsite.wildrivertech.com/2018/01/21/videos/',7,'post','',0),(59,2,'2018-01-21 18:16:14','2018-01-22 02:16:14','','News & Events','','publish','open','open','','news-events','','','2018-01-21 18:16:14','2018-01-22 02:16:14','',0,'https://testsite.wildrivertech.com/2018/01/21/news-events/',6,'post','',0),(60,2,'2018-01-21 18:23:27','2018-01-22 02:23:27','<p>Wild River Technology cable assemblies and skew matched cable pairs are offered as accessories to our <a title=\"Wild River Technology channel modeling platforms\" href=\"index.php/si-test-fixtures/standard-channel-modeling-platform\">channel modeling platforms,</a> <a title=\"Crosstalk testing\" href=\"index.php/si-test-fixtures/crosstalk-aggression-platform\">crosstalk aggression platform,</a> and <a title=\"Ultra-low return loss intersymbol interference (ISI) platform.\" href=\"index.php/si-test-fixtures/isi-loss-modeling-platform\">ultra-low return loss intersymbol interference (ISI) platform.</a> Custom configurations are available, including for our hermetically sealable, skew matched, flexible cable assembly pair. Please contact us at <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a> for pricing and delivery.</p>\r\n<hr />','Cable Assemblies','','publish','open','open','','cable-assemblies','','','2018-01-21 18:23:27','2018-01-22 02:23:27','',0,'https://testsite.wildrivertech.com/2018/01/21/cable-assemblies/',5,'post','',0),(61,2,'2019-07-17 11:49:20','2019-07-17 18:49:20','<p>Wild River Technology and WildRiverTech.com collects personally identifiable information (name, email address, etc.) and demographic data (address, zip code, phone number) provided by you when you:</p>\r\n<ul>\r\n<li>Register for access to our premium web content</li>\r\n<li>Make a purchase</li>\r\n<li>Register for a Wild River Technology class or seminar</li>\r\n</ul>\r\n<p>You are not required to disclose any personally identifiable information to us. However, portions of our website may be unavailable to you without such information, and you may not make a purchase without identifying information.</p>\r\n<h2>How We Use Information</h2>\r\n<p>We use the information you provide to process and maintain your online account, to compile lists of potential customer leads, and to send you our quarterly newsletter. We may also use this information to contact you about your account, or to send you necessary information directly related to the products or services you have requested. We may release personal information to third parties to perform services on our behalf such as maintaining and enhancing our website.</p>\r\n<p>Occasionally we may share identifiable information (emails only) with third-party partners who have sponsored specific events. When sponsored events are posted, they will be clearly identified. Access is managed through our coupon service, and use of a coupon for an event is agreement that your email may be shared.</p>\r\n<p>If you order products or register for a class or seminar online on WildRiverTech.com, you will be required to provide contact information (e.g., name and shipping address) and financial information (e.g., credit card number and expiration date).</p>\r\n<p>If you do not want to receive email from us in the future, please let us know by sending us an email at <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a>.</p>\r\n<p>If you supply us with your postal address online you will only receive the information for which you provided us your address.</p>\r\n<p>Upon request we offer visitors the ability to have inaccuracies corrected in contact information, unique identifiers. Consumers can have this information corrected by sending us an email at <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a> or calling us at +1 (800) 604-0858.</p>\r\n<h2>Security</h2>\r\n<p>The security of the information you provide to WildRiverTech.com is important to us. We use encryption software and other security measures to protect the loss, misuse and alteration of sensitive information under our control. However, Wild River Technology\'s site includes links to other sites, and when you choose to visit those sites, we are not responsible for their privacy policies or how they treat user information.</p>\r\n<p>When we transfer and receive certain types of sensitive information such as financial information, we redirect visitors to a secure server and will notify visitors through a special padlock icon on the page. We have appropriate security measures in place in our physical facilities to protect against the loss, misuse or alteration of information that we have collected from you at our site.</p>\r\n<p>WildRiverTech.com uses cookies (small text files transferred from our website to your hard drive) to recognize repeat users, track usage behavior and facilitate your access to and use of our site. Cookies do not damage files or allow anyone to access your personally identifiable information — they simply allow us to tailor information to make your visits more enjoyable and meaningful. They also provide information to us about site usage to help us improve and update our site.</p>\r\n<h2>This Policy</h2>\r\n<p>If you feel that this site is not following its stated information policy, you may contact us at the above email address or phone number. However, Wild River Technology LLC and WildRiverTech.com reserve the right to alter our privacy policy as business needs require. Any changes to this policy will be posted on our website in a timely manner. In the event that we change the way we use personally identifiable information, users will be notified via email and will be given the opportunity to opt out. This statement and the policies outlined here are not intended to and do not give you any contractual or other legal rights.</p>\r\n<p>All personally identifiable information and/or third party personally identifiable information is subject to disclosure (i) pursuant to judicial or other government subpoenas, warrants, or orders, (ii) where otherwise required by law, or (iii) where Wild River Technology and WildRiverTech.com believes our property or an individual\'s safety or security is at risk.</p>','Privacy Notice','','publish','open','open','','privacy-notice','','','2019-07-17 11:49:20','2019-07-17 18:49:20','',0,'https://testsite.wildrivertech.com/2019/07/17/privacy-notice/',4,'post','',0),(62,2,'2019-07-17 17:01:18','2019-07-18 00:01:18','<p>Technical experts from Samtec, eSilicon and Wild River Technology recently co-presented a webinar around the topic of High-Performance Communications, Delivered.</p>\r\n\n<!--more-->\n\r\n<h1><img src=\"https://3hp22p4vkie16x1dv48qurbo-wpengine.netdna-ssl.com/wp-content/uploads/2019/06/esilicon-wild-river-56g-serdes-eval-board-crop-700pxW-20190125.jpg\" alt=\"High-Performance Communc\" /></h1>\r\n<h3>High-Performance Communications, Delivered</h3>\r\n<p>The webinar highlighted technical challenges system designers and engineers face on the way to 56 Gbps/112 Gbps PAM 4 data rates. What are some of those challenges? Here was the agenda:</p>\r\n<ul>\r\n<li>The challenges of high-performance communications, introduction \r\n<ul>\r\n<li>Dan Nenni, SemiWiki</li>\r\n</ul>\r\n</li>\r\n<li>Designing a test board to deliver performance — the Apollo mission model\r\n<ul>\r\n<li>Al Neves, Wild River Technology</li>\r\n</ul>\r\n</li>\r\n<li>Delivering the required connectivity\r\n<ul>\r\n<li>Matt Burns, Samtec</li>\r\n</ul>\r\n</li>\r\n<li>Putting it all together with eSilicon SerDes\r\n<ul>\r\n<li>Tim Horel, eSilicon</li>\r\n</ul>\r\n</li>\r\n</ul>\r\n<p>For those unable to attend the webinar live, here is a <a title=\"High-Performance Communications, Delivered: Webinar Video Replay\" href=\"https://youtu.be/nJU66Z9D8kM\" target=\"_blank\" rel=\"noopener noreferrer\">link to the <em>High-Performance Communications, Delivered</em> webinar recording.</a></p>\r\n<h3>Whitepaper: Meeting the Demands of PAM4 Systems at 56Gbps and Beyond</h3>\r\n<p>The webinar was a great introduction to the topic. Are other information sources available as well?</p>\r\n<p>Yes. You can <a title=\"Link to Meeting the Demands of PAM4 Systems at 56Gbps and Beyond white paper\" href=\"https://testsite.wildrivertech.com/2020/05/15/high-speed-communications-white-papers/\">download a new white paper</a> entitled <em>Meeting the Demands of PAM4 Systems at 56Gbps and Beyond</em>. Co-authored by Samtec, eSilicon and Wild River Technology, it details the collaboration and results the partners achieved.</p>','WRT partners with eSilicon and Samtec on high-performance communications webinar','','publish','open','open','','wrt-partners-with-esilicon-and-samtec-on-high-performance-communications-webinar','','','2021-08-02 15:27:29','2021-08-02 22:27:29','',0,'https://testsite.wildrivertech.com/2019/07/17/wrt-partners-with-esilicon-and-samtec-on-high-performance-communications-webinar/',7,'post','',0),(63,2,'2019-08-07 11:01:48','2019-08-07 18:01:48','<p>[cookiepolicy]</p>\r\n<p> [privacycontrols]</p>','Cookies','','publish','open','open','','cookies','','','2019-08-07 11:01:48','2019-08-07 18:01:48','',0,'https://testsite.wildrivertech.com/2019/08/07/cookies/',3,'post','',0),(64,2,'2020-02-12 17:48:37','2020-02-13 09:48:37','','automatically generated SerDes receive eye diagram','','inherit','open','closed','','attachment-automatically-generated-serdes-receive-eye-diagram','','','2021-08-02 15:26:32','2021-08-02 22:26:32','',65,'https://testsite.wildrivertech.com/wp-content/uploads/2020/02/wild-river-tech-serdes-receive-eye-diagram-20181024-700px.png',0,'attachment','image/png',0),(65,2,'2020-02-12 17:48:37','2020-02-13 01:48:37','<h3><img class=\" size-full wp-image-64\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/02/wild-river-tech-serdes-receive-eye-diagram-20181024-700px.png\" alt=\"automatically generated SerDes receive eye diagram\" width=\"700\" height=\"566\" /></h3>\r\n<h3>Semiconductor Digest </h3>\r\n<p>| By Kar Yee Tang, eSilicon | February 8, 2020 |</p>\r\n<p>Service providers and hyperscalers — Amazon, Apple, Facebook, Google, Intel and Microsoft — are moving from 100 to 400 gigabit (Gb) Ethernet rates and beyond. Wireline and wireless networks are driving new architectures to support the move from 4G LTE to 5G infrastructure driven by increasing global IP traffic as the world becomes more connected digitally. <a title=\"SerDes Design by Kar Yee Tang\" href=\"https://www.semiconductor-digest.com/2020/02/08/serdes-designs-keeping-pace-with-a-demanding-network-environment/\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>','SerDes Designs: Keeping Pace with a Demanding Network Environment','','publish','open','open','','serdes-designs-keeping-pace-with-a-demanding-network-environment','','','2020-02-12 17:48:37','2020-02-13 01:48:37','',0,'https://testsite.wildrivertech.com/2020/02/12/serdes-designs-keeping-pace-with-a-demanding-network-environment/',6,'post','',0),(66,2,'2020-02-13 17:17:36','2020-02-14 01:17:36','<p><a href=\"https://blog.samtec.com/post/icymi-high-performance-communications-delivered/\" target=\"_blank\" rel=\"noopener noreferrer\">ICYMI: High-Performance Communications, Delivered</a></p>\r\n<h4>Samtec Blog</h4>\r\n<p><em>By Matt Burns | July 24, 2019 <br /></em>ICYMI. Doesn’t that immediately induce fear of missing out? Oh wait, that’s another acronym. FOMO. Yikes. In any case, technical experts from Samtec, eSilicon and Wild River Technology recently co-presented a webinar around the topic of <em>High-Performance Communications, Delivered</em>. The webinar highlighted technical challenges system designers and engineers face on the way to 56 Gbps/112 Gbps PAM 4 data rates. What are some of those challenges? <a href=\"https://blog.samtec.com/post/icymi-high-performance-communications-delivered/\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://www.connectorsupplier.com/july-2019-connector-industry-news/\" target=\"_blank\" rel=\"noopener noreferrer\">July 2019 Connector Industry News</a></h3>\r\n<h4>Connector Supplier</h4>\r\n<p><em>By Christine Stieglitz | July 9, 2019</em><br />Samtec, eSilicon, and Wild River Technology have co-developed a next-generation test platform that addresses common challenges OEMS face when developing high-performance communications solutions and are promoting it via webinar on Thursday, July 11. The “High-Performance Communications, Delivered” webinar will focus on high-performance communications at 56Gb/s PAM4 and beyond and will also provide an introduction to the challenges of high-performance communications. <a href=\"https://www.connectorsupplier.com/july-2019-connector-industry-news/\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://blog.samtec.com/post/samtec-partners-with-esilicon-and-wild-river-technology-on-high-performance-communications-webinar/\" target=\"_blank\" rel=\"noopener noreferrer\">Samtec Partners with eSilicon and Wild River Technology on High-Performance Communications Webinar</a></h3>\r\n<h4 class=\"entry-meta\">Samtec Blog</h4>\r\n<p class=\"entry-meta\"><em>By </em><span class=\"entry-author-name\"><em>Matt Burns | June 20, 2019</em> <br /></span>Data, data, data is everywhere. From streaming video to edge computing, system designers are challenged to meet the needs of the networks (and consumers). From servers and switches to networking equipment, OEMs developing next-gen devices with high-performance communications face two common challenges. First, available silicon must support 56 Gbps PAM4 data rates. Second, test fixtures must support performance verification. <a href=\"https://blog.samtec.com/post/samtec-partners-with-esilicon-and-wild-river-technology-on-high-performance-communications-webinar/\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://design.iconnect007.com/index.php/article/117684/wild-river-esilicon-and-samtec-team-up-for-112-gbps-test-vehicle/117687/?skin=design\" target=\"_blank\" rel=\"noopener noreferrer\">Wild River, eSilicon, and Samtec Team up for 112-Gbps Test Vehicle</a></h3>\r\n<h4>Design007 Magazine</h4>\r\n<p><em>By Andy Shaughnessy | June 6, 2019</em><br />During DesignCon, I sat down for an interview with Tim Horel from eSilicon, Al Neves of Wild River Technology, and Matt Burns from Samtec. They’ve recently teamed up to create a 112-Gbps test vehicle that may be the first of its kind of test fixture.</p>\r\n<p>Al Neves: Well, there’s a science-fiction comment that’s really appropriate: “In space, everything can kill you.” And when you’re doing work even at 56 Gbps, the requirements of the PAM4 technology for test fixturing is formidable; everything needs to be top-tier SI metrics. There’s a new emerging standard—IEEE P370—that helps with our guidance of that, and we use it along with some simulations as a guide to establish metrics for doing the 3D EM optimization. The 3D EM optimization was the floor plan—the SI of the platform. Most importantly, the crux issue was the high-density interconnect, which was the Bulls Eye connector from Samtec going into the board.</p>\r\n<p>For the electromagnetic simulation, we had two internal teams, and we also used an external Samtec team. Our experience using external teams from connector companies was universally very negative. They’re not usually up to the requirements of the advanced SI that you need for PAM4. However, the Samtec team did a fabulous job. In fact, we used three independent teams—two internal teams using two different tools, and then a Samtec team—and we overlaid all of those. Samtec’s results and the Wild River team’s overlaid very closely and the synergy between the teams was really brilliant. <a href=\"https://design.iconnect007.com/index.php/article/117684/wild-river-esilicon-and-samtec-team-up-for-112-gbps-test-vehicle/117687/?skin=design\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://www.eeweb.com/profile/martin-rowe-2/articles/112g-digs-in-at-designcon-2019\" target=\"_blank\" rel=\"noopener noreferrer\">112G Digs in at DesignCon 2019</a></h3>\r\n<h4>EEWeb</h4>\r\n<p><em>By </em><em>Martin Rowe </em><em>| February 12, 2019</em><strong><em><br /></em></strong>112G serial links have moved out of the lab and onto the exhibit floor. 56G ramps up while 28G goes mainstream.</p>\r\n<p>Last year at DesignCon 2018, we witnessed high-speed digital designs that moved past 56 Gbits/s (56G) and onto 112 Gbits/s (112G). This year, DesignCon 2019 brought numerous demonstrations of 112G as the connectors and cables caught up with the silicon. While still appearing in technical papers and panels, 112G has certainly moved into the exhibit hall. Meanwhile, 56G has matured and is now a complete ecosystem.</p>\r\n<p>When it comes to signal integrity and high-speed signals, transmission lengths certainly matter, especially with electrical signals over copper connections. Yes, optical transmission is an option, but nobody wants to pay for it. <a href=\"https://www.eeweb.com/profile/martin-rowe-2/articles/112g-digs-in-at-designcon-2019\" target=\"_blank\" rel=\"noopener noreferrer\">More…</a></p>\r\n<h3><a href=\"https://www.signalintegrityjournal.com/articles/1138-designcon-2019---open-your-eyes\" target=\"_blank\" rel=\"noopener noreferrer\">DesignCon 2019 — Open Your Eyes</a></h3>\r\n<h4>Signal Integrity Journal</h4>\r\n<p><em>By Patrick Hindle | February 11, 2019</em><br />eSilicon was in the Samtec booth presenting their collaboration with Wild River Technology and Samtec to develop an advanced test system that addresses the incredible signal integrity demands of 56/112G PAM4 operation. The test system design utilizes the upcoming IEEE P370 standard in association with compliance metrics 802.3bs, OIF CEI – 56G PAM4, and COBO to validate the required performance.</p>\r\n<h3><a href=\"https://www.electronicproducts.com/Board_Level_Products/Communication_Boards/High_speed_design_It_takes_a_village_to_succeed.aspx\" target=\"_blank\" rel=\"noopener noreferrer\">High-speed design: It takes a village to succeed</a><br /><a href=\"https://www.electronicproducts.com/Board_Level_Products/Communication_Boards/High_speed_design_It_takes_a_village_to_succeed.aspx\" target=\"_blank\" rel=\"noopener noreferrer\"><em>eSilicon, Wild River Technology, and Samtec combined forces to develop a 56-Gbits/s test board</em></a></h3>\r\n<h4>Electronic Products</h4>\r\n<p><em>By Martin Rowe | February 8</em>, <i>2019<br /></i>You’ve probably heard the phrase “It takes a village to raise a child.” The same can be said for high-speed digital design. That’s the lesson that engineers at eSilicon, Wild River Technologies, and Samtec learned when eSilicon needed a board to test its latest 56-/112-Gbits/s PAM4 SerDes for use in IEEE 802.3bs (200-/400-Gbits/s Ethernet) and several Optical Internetworking Forum (OIF) implementations.</p>\r\n<p>To find out how the three companies worked on the problem, I met on Jan. 30 with representatives of the three companies at DesignCon 2019 in Santa Clara, California.</p>\r\n<p>“We needed a way to evaluate our chip,” said eSilicon’s director of field applications, Tim Horel. The board not only lets eSilicon engineers do that, it also serves as a reference design. The goal was to design a board that could pass data at a bit-error ratio (BER) of <span class=\"sewwrapper\">10E-11</span> over 5m of copper cable without the need for forward-error correction (FEC). The board, which was on display at DesignCon 2019, can maintain that BER over 7m of copper, according to eSilicon’s VP of marketing, Mike Gianfanga. <a href=\"https://www.electronicproducts.com/Board_Level_Products/Communication_Boards/High_speed_design_It_takes_a_village_to_succeed.aspx\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://semiengineering.com/week-in-review-design-low-power-28/\" target=\"_blank\" rel=\"noopener noreferrer\">Week In Review: Design, Low Power</a><br /><a href=\"https://semiengineering.com/week-in-review-design-low-power-28/\" target=\"_blank\" rel=\"noopener noreferrer\"><em>Formal connectivity checking; EM interference in PCBs; 7nm GDDR6 PHY; advanced 56G/112G PAM4 test board</em></a></h3>\r\n<h4>Semiconductor Engineering</h4>\r\n<p><em>By Jesse Allen | February 1, 2019</em><br />eSilicon teamed up with Wild River Technology on an operation using the upcoming IEEE P370 standard. The design employed a channel-modeling platform to improve de-embedding quality out past 70GHz, establishing clear targets of equalization and creating an advanced reference design suited for immediate 3D electromagnetic design. The core of the design was Samtec’s Bulls Eye Test Point System; tools were also used from Keysight, ANSYS, and Simberian. The next phase is to design and build a test socket suited for 70GHz. <a href=\"https://semiengineering.com/week-in-review-design-low-power-28/\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://semiengineering.com/high-speed-communication-takes-a-village/\" target=\"_blank\" rel=\"noopener noreferrer\">High-Speed Communication Takes A Village</a></h3>\r\n<h4>Semiconductor Engineering</h4>\r\n<p><em>By Mike Gianfagna | January 31, 2019</em><br />Forget the notion of a simple test fixture. This stuff is a lot more complicated than that. It starts with a specification — the complex set of capabilities required to “hit the target.” In this case, it’s the emerging IEEE P370 standard. According to the official website: “The standard is applicable to: PCB and related interconnects (including package, connector, cable, etc.) used in high-speed digital applications, operating with signals at frequencies up to 50 GHz.” To validate the performance of our 56G SerDes, we set out to build a test board that conformed to this specification. <a href=\"https://semiengineering.com/high-speed-communication-takes-a-village/\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://www.globenewswire.com/news-release/2019/01/30/1707529/0/en/eSilicon-and-Wild-River-Technology-Announce-Advanced-SerDes-Test-System.html\" target=\"_blank\" rel=\"noopener noreferrer\">eSilicon and Wild River Technology Announce Advanced SerDes Test System</a><br /><a href=\"https://www.globenewswire.com/news-release/2019/01/30/1707529/0/en/eSilicon-and-Wild-River-Technology-Announce-Advanced-SerDes-Test-System.html\" target=\"_blank\" rel=\"noopener noreferrer\"><em>System addresses the demands of 56/112G PAM4 operation using upcoming IEEE P370 standard</em></a></h3>\r\n<h4>eSilicon Press Release</h4>\r\n<p><em>January 30, 2019</em><br />eSilicon, a leading provider of FinFET ASICs, market-specific IP platforms and advanced 2.5D packaging solutions, in collaboration with Wild River Technology, announced today at DesignCon 2019 the availability of an advanced test system that addresses the incredible signal integrity demands of 56/112G PAM4 operation.</p>\r\n<p>High baud-rate PAM4 test/characterization systems are challenging to design due to the high demands for superior signal integrity and signal-to-noise ratio (SNR). The test system design utilizes the upcoming IEEE P370 standard in association with compliance metrics 802.3bs, OIF CEI – 56G PAM4, and COBO to validate the required performance. Keysight’s Advanced Design System was used to explore power spectral density, examining how much bandwidth is needed for effective testing and what specific metrics of IEEE P370 are most important, such as return loss, equivalent return loss, time-domain reflectometry (TDR) and impedance analysis. eSilicon’s 56G PAM4 &amp; NRZ DSP-based 7nm SerDes was used to drive the communication channels. <a href=\"https://www.globenewswire.com/news-release/2019/01/30/1707529/0/en/eSilicon-and-Wild-River-Technology-Announce-Advanced-SerDes-Test-System.html\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"http://www.magazines007.com/pdf/Design007-Aug2018.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">Moving From 28 Gbps NRZ to 56 Gbps PAM-4: Is it a Free Lunch?</a></h3>\r\n<h4>Design007 Magazine, Page 64</h4>\r\n<p><em>By Yuriy Shlepnev, Simberian | August 2018</em><br />The usual way of signaling through PCB interconnects is a two-level pulse, an encoding of 1s and 0s or bits, named NRZ (non-returnto-zero) or PAM-2 line code type. Increasing the data rate with the NRZ code type presents some obstacles. For a 28 Gbps NRZ signal, the bit time is about 35.7 ps with the main spectral lobe below 28 GHz. For a 56 Gbps NRZ signal, the bit time is about 17.86 ps, with the main spectral lobe below 56 GHz. One can feel the problem already: Getting PCB interconnect analysis and measurements up to 56 GHz and beyond is very challenging, to say the least. In addition, the expected attenuation (dielectric, conductor and roughness losses) would also be an obstacle for 56 GHz NRZ. To reduce the bandwidth of the signal, pulse amplitude modulation with four levels (PAM-4) is being used more frequently on production boards. <a href=\"http://www.magazines007.com/pdf/Design007-Aug2018.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://www.edn.com/analyze-post-equalization-isi-with-pulse-response/\" target=\"_blank\" rel=\"noopener noreferrer\">Analyze post-equalization ISI with pulse response</a></h3>\r\n<h4>EDN</h4>\r\n<p><em>By Ransom Stephens | March 7, 2018</em><br />Any signal-integrity engineer will tell you that analyzing closed eye diagrams has never been easy. A transmission channel\'s frequency response (or lack of bandwidth) causes inter-symbol interference (ISI), the primary eye-closing culprit. While I\'ve written about closed eye analysis techniques before, this time we\'ll measure the ISI left over after equalization, the so-called residual ISI. In the process, we\'ll see the simple guts of decision feedback equalization (DFE). <a href=\"https://www.edn.com/analyze-post-equalization-isi-with-pulse-response/\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://www.designnews.com/content/si-pi-and-emi-have-simpler-more-integrated-future/39212527458190\" target=\"_blank\" rel=\"noopener noreferrer\">SI, PI, and EMI Have a Simpler, More Integrated Future</a></h3>\r\n<h4>Design News</h4>\r\n<p><em>By Chris Wiltz | January 31, 2018</em><br />A panel of experts at DesignCon 2018 said that signal integrity, power integrity, and electromagnetic integrity aren\'t going to be separate disciplines any longer. But how can engineers address the new challenges ahead?</p>\r\n<p>If you want to think about where signal integrity (SI), power integrity (PI), and electromagnetic integrity (EMI) are going in the next five years, the first thing you need to do is stop thinking about them separately.</p>\r\n<p>“SI, PI, and EMI won\'t be three technologies anymore. We\'re going to have to deal with them all simultaneously,” Steve Sandler, Managing Director at Picotest, told the DesignCon 2018 audience at a keynote panel, “SI/PI &amp; EMI Challenges: Looking Ahead Through 2023.”</p>\r\n<p>Sandler and a group of panelists that included Istvan Novak, Senior Principal Engineer at Oracle; Eric Bogatin, an Adjunct Professor at University of Colorado\'s Department of Electrical, Computer, and Energy Engineering; Alfred Neves, Chief Technologist at Wild River Technology; and Kenneth Wyatt, Senior EMC Engineer at Wyatt Technical Services, all concluded that the proliferation of Internet of Things (IoT) technologies, coupled with new forms of computing and emerging technologies like autonomous vehicles, is going to conflate signal, power, and electromagnetism concerns in ways that will present brand new challenges for engineers and force experts in one area to gain experience in the others, as well. <a href=\"https://www.designnews.com/content/si-pi-and-emi-have-simpler-more-integrated-future/39212527458190\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a title=\"Microwave Journal: Signal Integrity Journal Publishes First Print Issue\" href=\"https://www.microwavejournal.com/articles/29678-article-headline\" target=\"_blank\" rel=\"noopener noreferrer\">Signal Integrity Journal Publishes First Print Issue</a></h3>\r\n<h4>Microwave Journal</h4>\r\n<p><i>January 24, 2018<br /></i><i>Signal Integrity Journal</i>, the sister publication to <i>Microwave Journal</i> covering signal integrity, power integrity and EMC/EMI related topics, has published its first printed magazine issue. <i>Signal Integrity Journal</i> was launched in September 2016 as an online magazine, and is now celebrating its success with this 2018 print edition, which is also available as a digital e-book.</p>\r\n<p>The <i>Signal Integrity Journal</i> 2018 print edition features articles from leaders in the industry such as <i>Signal Integrity Journal</i> editor Eric Bogatin (University of Colorado/Teledyne LeCroy), Isvan Novak, (Oracle), Steve Sandler, (Picotest), Al Neves (Wild River Technology) and Bert Simonovich, (LAMSIM).<span class=\"Apple-converted-space\"> <a title=\"Signal Integrity Journal Publishes First Print Issue \\ Microwave Journal\" href=\"https://www.microwavejournal.com/articles/29678-article-headline\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></span></p>\r\n<h3><a href=\"https://www.connectorsupplier.com/designcon-2018/\" target=\"_blank\" rel=\"noopener noreferrer\">10 Must-See Moments at DesignCon 2018</a></h3>\r\n<h4>Connector Supplier</h4>\r\n<p><em>January 15, 2018<br /></em>This year, DesignCon promises a full array of events, including technical sessions, panels, training boot camps, and hundreds of exhibits featuring the latest connector technology.</p>\r\n<p>DesignCon is one of the premier conferences and exhibitions for the high-speed communications and semiconductor communities. Held each year in Santa Clara, California, this jam-packed three-day event includes continuing education opportunities, an expo highlighting the latest technologies, and networking opportunities across industries. There’s so much — you just can’t do it all. But, plan carefully and you can make the most of this experience. (DesignCon’s handy schedule builder is a great planning tool.) Here are 10 must-see moments you’ll want to add to your itinerary. <a href=\"https://www.connectorsupplier.com/designcon-2018/\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://community.keysight.com/community/keysight-blogs/eesof-eda/blog/2017/12/05/tim-s-blackboard-8-eye-opening-experience-with-ctle\" target=\"_blank\" rel=\"noopener noreferrer\">Tim’s Blackboard #8: Eye-opening Experience with CTLE</a></h3>\r\n<h4>Keysight Technologies Blog</h4>\r\n<p><em>By Tim Wang Lee | Dec 5, 2017</em><br />Welcome to Tim’s Blackboard! This is the place to find discussions on interesting topics related to signal integrity and power integrity. This week on Tim’s Blackboard is “Eye-opening Experience with CTLE,” where we study one of the equalization techniques. This post has an associated ADS workspace. Today, we will take a close look at continuous-time linear equalization (CTLE) and how it opens closed eyes for us. <a href=\"https://community.keysight.com/community/keysight-blogs/eesof-eda/blog/2017/12/05/tim-s-blackboard-8-eye-opening-experience-with-ctle\" target=\"_blank\" rel=\"noopener noreferrer\">More…</a></p>\r\n<h3><a title=\"S-Parameters: Signal Integrity Analysis in the Blink of an Eye\" href=\"https://www.signalintegrityjournal.com/articles/432-s-parameters-signal-integrity-analysis-in-the-blink-of-an-eye\" target=\"_blank\" rel=\"noopener noreferrer\">S-Parameters: Signal Integrity Analysis in the Blink of an Eye</a></h3>\r\n<h4>Signal Integrity Journal</h4>\r\n<p><em>By Alfred P. Neves, Mike Resso, and Chun-Ting Wang Lee | May 30, 2017</em><br />Emerging 100 Gigabit Ethernet and 400 Gigabit Ethernet requirements for communication networks have put increasing demands on Internet infrastructure. New methods of design, validation, and troubleshooting to optimize high speed digital channels are being employed in the R&amp;D laboratory. This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.</p>\r\n<h3><a href=\"https://www.signalintegrityjournal.com/articles/378-ber--and-com-way-of-channel-compliance-evaluation-what-are-the-sources-of-differences\" target=\"_blank\" rel=\"noopener noreferrer\">BER- and COM-Way of Channel-Compliance Evaluation: What are the Sources of Differences?</a></h3>\r\n<h4>Signal Integrity Journal</h4>\r\n<p><em>Vladimir Dmitriev-Zdorov, Cristian Filip, Chuck Ferry, and Alfred P. Neves | </em><em>March 23, 2017<br /></em>We analyze the computational procedure specified for channel operation margin (COM) and compare it to traditional statistical eye/BER analysis. There are a number of differences between the two approaches, ranging from how they perform channel characterization, to how they consider Tx and Rx noise and apply termination, to the differences between numerical procedures employed to convert given jitter and crosstalk responses into the vertical distribution characterizing eye diagrams and BER. We show that depending on the channel COM may potentially overestimate the effect of crosstalk and, depending on a number of factors, over- or underestimate the effect of transmit jitter, especially when the channel operates at the rate limits. We propose a modification to the COM procedure that eliminates these problems without considerable work increase. <a href=\"https://www.signalintegrityjournal.com/articles/378-ber--and-com-way-of-channel-compliance-evaluation-what-are-the-sources-of-differences\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"http://www.magazines007.com/pdf/PCBD-Mar2017.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">Obsessing Over Conductor Surface Roughness: What’s the Effect on Dk?</a></h3>\r\n<h4>The PCB Design Magazine, Page 44</h4>\r\n<p><em>By Bert Simonovich, Lamsim Enterprises | March 2017</em><br />You know you have an obsession when you are flying six miles over Colorado and you look out the window at the beautiful scenery, and all you can think about is how the rocky mountain topology reminds you of conductor surface roughness! Well, call me obsessed, because that’s exactly what I thought on my way to DesignCon 2017 in Santa Clara, California.</p>\r\n<p>For those of you who know me, you know that I have been researching practical methods to model conductor surface roughness and its effect on insertion loss (IL). I have presented several papers on the subject over the last couple of years. It’s one of my pet projects. This year at DesignCon, I presented a paper titled “A Practical Method to Model Effective Permittivity and Phase Delay Due to Conductor Surface Roughness.” Everyone involved in the design and manufacture of PCBs knows that one of the most important properties of the dielectric material is the relative permittivity, commonly referred to as dielectric constant (Dk). But in reality, Dk is not constant at all. It varies over frequency as you will see later. <a href=\"http://www.magazines007.com/pdf/PCBD-Mar2017.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<h3><a href=\"https://www.xilinx.com/publications/events/designcon/2017/tutorial-32-to-56-gbps-serial-link-analysis-optimization-methods-pathological-channels.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">32 to 56 Gbps Serial Link Analysis and Optimization Methods for Pathological Channels</a></h3>\r\n<h4>DesignCon 2017</h4>\r\n<p><em>By Al Neves, Tim Wang Lee (Wild River Technology); Jack Carrel, Hong-Ahn (Xilinx, Inc.); Heidi Barnes, Mike Resso (Keysight Technologies) | February 10, 2017</em><strong><br /></strong>For many SerDes applications, when there is a channel that is proving difficult to achieve the required BER performance, the question of where and what to apply to the effort must be answered. The key focus of this tutorial is to unite a concerted channel analysis approach implementing both measurement hardware and EDA tools with contemporary SerDes internal tools (internal eye scan) for the purpose of optimizing BER for highly pathological channels (crosstalk, loss, return loss degradation, etc.). <a href=\"https://www.xilinx.com/publications/events/designcon/2017/tutorial-32-to-56-gbps-serial-link-analysis-optimization-methods-pathological-channels.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>\r\n<p class=\"entry-meta\"> </p>\r\n<p> </p>','Media Coverage Archive','','publish','open','open','','media-coverage','','','2020-02-13 17:17:36','2020-02-14 01:17:36','',0,'https://testsite.wildrivertech.com/2020/02/13/media-coverage/',2,'post','',0),(67,2,'2020-03-12 15:42:44','2020-03-13 05:42:44','','Al Neves, Wild River Technology, on Design for Profitability','Al Neves, Wild River Technology, on Design for Profitability','inherit','open','closed','','attachment-al-neves-wild-river-technology-on-design-for-profitability','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',68,'https://testsite.wildrivertech.com/wp-content/uploads/2020/03/al-neves-design-for-profitibility-700.png',0,'attachment','image/png',0),(68,2,'2020-03-12 15:42:44','2020-03-12 22:42:44','<p><img class=\" size-full wp-image-67\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/03/al-neves-design-for-profitibility-700.png\" alt=\"Al Neves, Wild River Technology, on Design for Profitability\" title=\"Al Neves, Wild River Technology, on Design for Profitability\" width=\"700\" height=\"647\" /></p>\r\n<h3 class=\"moveup\" style=\"font-weight: 200;\">Design007 Magazine</h3>\r\n<p><span class=\"byline\">| By Andy Shaughnessy | March 11, 2020 |<br />If your company is having trouble designing PCBs for profitability, where does the blame fall? Is it management’s fault for having inefficient processes, or is it the fault of the designers and design engineers for not keeping up to date with their training? During DesignCon, I asked Al Neves of Wild River Technology to weigh in on this question. As he explains, you and your manager might both be to blame for inefficiencies in the design process. <a href=\"https://design.iconnect007.com/index.php/article/122077/this-month-in-design007-magazine-al-neves-on-designing-for-profitability/122080/?skin=design\" target=\"_blank\" rel=\"noopener noreferrer\" title=\"Designing for Profitibility, Wild River Technology\">More...</a><br /></span></p>','Al Neves on Designing for Profitability','','publish','open','open','','al-neves-on-designing-for-profitability','','','2020-03-12 15:42:44','2020-03-12 22:42:44','',0,'https://testsite.wildrivertech.com/2020/03/12/al-neves-on-designing-for-profitability/',5,'post','',0),(69,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','high-speed-coms-white-paper-wild-river-samtec-esilicon-20190705','Meeting the Demands of PAM4 Systems at 56Gbps and Beyond white paper','inherit','open','closed','','attachment-high-speed-coms-white-paper-wild-river-samtec-esilicon-20190705','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/high-speed-coms-white-paper-wild-river-samtec-esilicon-20190705.pdf',0,'attachment','application/pdf',0),(70,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','Practical-Method-Model-Effective-Permittivity-and-Phase-Delay-Due-to-Conductor-Surface-Roughness-white-paper-20170128','Practical Method Model Effective Permittivity and Phase Delay Due to Conductor Surface Roughness white paper; DesignCon 2017','inherit','open','closed','','attachment-practical-method-model-effective-permittivity-and-phase-delay-due-to-conductor-surface-roughness-white-paper-20170128','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/Practical-Method-Model-Effective-Permittivity-and-Phase-Delay-Due-to-Conductor-Surface-Roughness-white-paper-20170128.pdf',0,'attachment','application/pdf',0),(71,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','BER-and-COM-Way-of-Channel-Compliance-Evaluation-white-paper-sm-20160121','','inherit','open','closed','','attachment-ber-and-com-way-of-channel-compliance-evaluation-white-paper-sm-20160121','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/BER-and-COM-Way-of-Channel-Compliance-Evaluation-white-paper-sm-20160121.pdf',0,'attachment','application/pdf',0),(72,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','13-MA1Slides_Bell_Neves_Buxton_Martens_Bartlett','','inherit','open','closed','','attachment-13-ma1slides_bell_neves_buxton_martens_bartlett','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/13-MA1Slides_Bell_Neves_Buxton_Martens_Bartlett.pdf',0,'attachment','application/pdf',0),(73,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','DesignCon2012_9-TP6Paper_Bell_Blankman_Bogatin_Neves_Noh_Spadaro','','inherit','open','closed','','attachment-designcon2012_9-tp6paper_bell_blankman_bogatin_neves_noh_spadaro','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2012_9-TP6Paper_Bell_Blankman_Bogatin_Neves_Noh_Spadaro.pdf',0,'attachment','application/pdf',0),(74,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','DesignCon2012_9-TP6Slides_Bell_Blankman_Bogatin_Neves_Noh_Spadaro','','inherit','open','closed','','attachment-designcon2012_9-tp6slides_bell_blankman_bogatin_neves_noh_spadaro','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2012_9-TP6Slides_Bell_Blankman_Bogatin_Neves_Noh_Spadaro.pdf',0,'attachment','application/pdf',0),(75,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','DesignCon2011_13-wa1paper','','inherit','open','closed','','attachment-designcon2011_13-wa1paper','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2011_13-wa1paper.pdf',0,'attachment','application/pdf',0),(76,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','DesignCon2010_12-WA2_Yuriy_Shlepnev','','inherit','open','closed','','attachment-designcon2010_12-wa2_yuriy_shlepnev','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2010_12-WA2_Yuriy_Shlepnev.pdf',0,'attachment','application/pdf',0),(77,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','DesignCon2010_7-TH2_Martin_Schauer','','inherit','open','closed','','attachment-designcon2010_7-th2_martin_schauer','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2010_7-TH2_Martin_Schauer.pdf',0,'attachment','application/pdf',0),(78,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','DesignCon2009_Measurement_Assisted_Extraction_DOC','','inherit','open','closed','','attachment-designcon2009_measurement_assisted_extraction_doc','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2009_Measurement_Assisted_Extraction_DOC.pdf',0,'attachment','application/pdf',0),(79,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','DesignCon2009_Measurement_Assisted_Extraction_PPT','','inherit','open','closed','','attachment-designcon2009_measurement_assisted_extraction_ppt','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2009_Measurement_Assisted_Extraction_PPT.pdf',0,'attachment','application/pdf',0),(80,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','','DesignCon2009_Calibrate_and_DeEmbed_PPT','','inherit','open','closed','','attachment-designcon2009_calibrate_and_deembed_ppt','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',81,'https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2009_Calibrate_and_DeEmbed_PPT.pdf',0,'attachment','application/pdf',0),(81,2,'2020-05-15 17:52:41','2020-05-16 00:52:41','<h3>Meeting the Demands of PAM4 Systems at 56Gbps and Beyond</h3>\r\n<p>July 2019</p>\r\n<p><br />Alfred P. Neves, CTO, Wild River Technology<br />Matthew Burns, Product Marketing Manager–High Speed, Samtec <br />Mike Gianfagna, VP, Marketing, eSilicon <br />Tim Horel, Director of Field Applications, eSilicon </p>\r\n<p><strong>Abstract<br /></strong>Our discussion will focus on PAM4 (pulse amplitude modulation) systems operating at 56 Gigabits per second and beyond. PAM4 is a modulation technique whereby four distinct pulse amplitudes are used to convey the information. PAM4 enables twice the transmission capacity when compared to binary modulation. Because the additional voltage levels in PAM4 reduce the level spacing by a factor of three, PAM4 is more susceptible to noise than a binary digital signal, thus requiring a higher signal- to-noise (SNR) ratio. Consequently, PAM4 is normally used for short-reach applications where a higher SNR can be obtained.</p>\r\n<p>We will explore how this shortcoming can be overcome, resulting in very long-reach signaling with PAM4 encoding over a copper cable to enable next-generation 25.6 and 51.2Tb/s switches, routers and 800G systems. Delivering this capability has two challenges — working silicon that can deliver the required performance and a SerDes test fixture that allows system designers to verify performance in their target application. We will discuss both challenges. <a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/high-speed-coms-white-paper-wild-river-samtec-esilicon-20190705.pdf\" target=\"_blank\" rel=\"noopener noreferrer\" title=\"Meeting the Demands of PAM4 Systems at 56Gbps and Beyond white paper\">Download white paper.</a></p>\r\n<p>Watch the related webinar video, <a href=\"https://youtu.be/nJU66Z9D8kM\" target=\"_blank\" rel=\"noopener noreferrer\" title=\"Webinar video: High-Performance Communications, Delivered\">High-Performance Communications, Delivered.</a></p>\r\n<h3>A Practical Method to Model Effective Permittivity and Phase Delay Due to Conductor Surface Roughness</h3>\r\n<p>DesignCon 2017</p>\r\n<p>Lambert (Bert) Simonovich, Lamsim Enterprises Inc.</p>\r\n<p><strong>Abstract</strong><br />In the GB/s regime, accurate modeling of conductor loss and phase delay is a precursor to successful high-speed serial link designs. In this paper, a practical method to model effective permittivity and phase delay, due to conductor surface roughness, is presented. By obtaining the dielectric and roughness parameters, solely from manufacturers’ data sheets, phase delay and effective permittivity can now be easily predicted. Detailed case studies and several examples test the model`s accuracy. <a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/Practical-Method-Model-Effective-Permittivity-and-Phase-Delay-Due-to-Conductor-Surface-Roughness-white-paper-20170128.pdf\" target=\"_blank\" rel=\"noopener noreferrer\" title=\"Practical Method Model Effective Permittivity and Phase Delay Due to Conductor Surface Roughness white paper; DesignCon 2017\">Download white paper.</a></p>\r\n<h3>BER- and COM-Way of Channel-Compliance Evaluation: What are the Sources of Differences?</h3>\r\n<p>DesignCon 2016</p>\r\n<p>Vladimir Dmitriev-Zdorov, Mentor Graphics <br />Cristian Filip, Mentor Graphics<br />Chuck Ferry, Mentor Graphics<br />Alfred P. Neves, Wild River Technology</p>\r\n<p><strong>Abstract</strong><br />We analyze the computational procedure specified for Channel Operation Margin (COM) and compare it to traditional statistical eye/BER analysis. There are a number of differences between the two approaches, ranging from how they perform channel characterization, to how they consider Tx and Rx noise and apply termination, to the differences between numerical procedures employed to convert given jitter and crosstalk responses into the vertical distribution characterizing eye diagrams and BER. We show that depending on the channel COM may potentially overestimate the effect of crosstalk and, depending on a number of factors, over- or underestimate the effect of transmit jitter, especially when the channel operates at the rate limits. We propose a modification to the COM procedure that eliminates these problems without considerable work increase.<a href=\"images/BER-and-COM-Way-of-Channel-Compliance-Evaluation-white-paper-sm-20160121.pdf\" target=\"_blank\" rel=\"noopener noreferrer\" title=\"BER- and COM-Way of Channel-Compliance Evaluation;\r\nDesignCon 2016\"> Download white paper.</a></p>\r\n<h3>Methods of Improving 3D EM Model Development and Associated Time/Frequency Domain Measurements</h3>\r\n<p>DesignCon 2013</p>\r\n<p>Jim Bell and Al Neves, Wild River Technology<br />Bob Buxton and Jon Martens, Anritsu Company<br />Josiah Bartlett, Tektronix</p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/13-MA1Slides_Bell_Neves_Buxton_Martens_Bartlett.pdf\">&nbsp;Download presentation</a></p>\r\n<h3>Robust Method for Addressing 12 Gbps Interoperability for High-Loss and Crosstalk-Aggressed Channels</h3>\r\n<p>DesignCon 2011</p>\r\n<p>James Bell, Wild River Technology<br />Alan&nbsp;Blankman<br />Alfred Neves, Wild River Technology<br />George Noh<br />Martin Spadaro</p>\r\n<p><strong>Abstract</strong><br />This paper addresses a new methodology for 12 Gbps interoperability that combines a concerted family of pathological channels, internal eye monitoring, and external EQ simulation tools, providing insight into an EQ optimization strategy that addresses the specific channel’s mix of crosstalk noise, jitter, and channel loss. This also provides a backplane designer the ability to configure a high-loss, crosstalk aggressed system. The method, combining co-simulation channel optimization, a reconfigurable channel platform, and receiver eye monitoring, has two key benefits; the separation of channel eye opening versus un-equalizable Deterministic Jitter (Dj), and the capability to map loss-crosstalk space for a particular SERDES channel pair, a new concept in SERDES interoperability evaluation. The method is described in detail, followed by relevant case examples using hardware specifically designed for this endeavor. Finally, we compare eye monitor results with the original co-simulation, validating the method.</p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2012_9-TP6Paper_Bell_Blankman_Bogatin_Neves_Noh_Spadaro.pdf\">View or Download Paper</a></p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2012_9-TP6Slides_Bell_Blankman_Bogatin_Neves_Noh_Spadaro.pdf\">View or Download PowerPoint Presentation</a></p>\r\n<h3>Developing Unified Methods of 3D Electromagnetic Extraction, System Level Channel Modeling, and Robust Jitter Decomposition in Crosstalk Stressed 10Gbpsec Serial Data Systems</h3>\r\n<p>DesignCon 2011</p>\r\n<p>James Bell<br />Scott McMorrow<br />Martin Miller<br />Alfred Neves</p>\r\n<p><strong>Abstract</strong><br />As serial link speeds increase, systems become more \"Stressed\". Loss, low probability deterministic jitter, crosstalk aggression from densely packed signal nets, via and connector impedance and associated resonances, and package and power delivery issues all add their own jitter density function, resulting in a net jitter picture that is inherently complicated. This paper represents a rigorous and practical crosstalk analysis of 10Gbps and higher serial data transmission systems, which will begin at pre-layout 3D EM extraction, continue with the material parameters identification and post-layout analysis and end with direct jitter measurement and separation. We believe this is one of the timeliest of topics in signal integrity at the present time.</p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2011_13-wa1paper.pdf\">View or Download Paper</a></p>\r\n<h3>Full-wave time domain modelingFull-wave time domain modelingof interconnects</h3>\r\n<p>DesignCon 2010</p>\r\n<p>Martin Schauer<br /><span dir=\"ltr\">Alfred Neves</span><br /><span dir=\"ltr\">Tom Dagostino</span><br /><span dir=\"ltr\">Scott McMorrow</span></p>\r\n<p><strong>Abstract</strong><br />Frequency-domain 3D Electromagnetic modeling approaches always have the potentialFrequency-domain 3D Electromagnetic modeling approaches always have the potentialfor causality and passivity violation issues, especially when applied to greater than20Gbsec data rates applications: initial applications for 3D Electromagnetic modelingmethods were only used in low bandwidth frequency-domain microwave designs.A new and inherently passive and causal time-domain oriented approach for 3DElectromagnetic modeling is introduced in detail. The authors show specific advantagesof this approach for baseband-NRZ very high-speed backplanes, interconnects, andgeneral board design for digital systems. Selecting the correct loss model will be includedand the model results will be compared to actual measurements to 20 GHz using a testboard specifically designed for this presentation.</p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2010_12-WA2_Yuriy_Shlepnev.pdf\">View or Download Paper</a></p>\r\n<h3><span dir=\"ltr\">Practical identification of </span><span dir=\"ltr\">dispersive dielectric models with </span><span dir=\"ltr\">generalized modal S-parameters </span><span dir=\"ltr\">for analysis of interconnects in 6-</span><span dir=\"ltr\">100 Gb/s applications</span></h3>\r\n<p>DesignCon 2010</p>\r\n<p><span dir=\"ltr\">Yuriy Shlepnev, Simberian Inc.</span><br /><span dir=\"ltr\">Alfred Neves, Teraspeed Consulting Group</span><br /><span dir=\"ltr\">Tom Dagostino, Teraspeed Consulting Group</span><br /><span dir=\"ltr\">Scott McMorrow, Teraspeed Consulting Group</span></p>\r\n<p><strong>Abstract</strong><br /><span dir=\"ltr\">A novel method for extraction of dispersive di</span><span dir=\"ltr\">electric parameters to 50 GHz is proposed. </span><span dir=\"ltr\">The method doesn’t require advanced de-e</span><span dir=\"ltr\">mbedding, and is based on correlation of </span><span dir=\"ltr\">measured and simulated generalized modal S-</span><span dir=\"ltr\">parameters of a line segment. First, VNA </span><span dir=\"ltr\">measurements for two line segments are </span><span dir=\"ltr\">made and used to compute generalized S-</span><span dir=\"ltr\">parameters of a difference segment. Sec</span><span dir=\"ltr\">ond, 3D full-wave model of the difference </span><span dir=\"ltr\">segment with conductor model with roughness </span><span dir=\"ltr\">is used to identify the dielectric </span><span dir=\"ltr\">properties. We finalize the paper with the de</span><span dir=\"ltr\">rivation of dielectric models for low-cost </span><span dir=\"ltr\">FR4-type and for expensive low-loss high-fre</span><span dir=\"ltr\">quency materials. The advanced models can </span><span dir=\"ltr\">be used for practical electromagnetic analys</span><span dir=\"ltr\">is of interconnects for the 6-100 Gb/s realm.</span></p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2010_7-TH2_Martin_Schauer.pdf\">View or Download Paper</a></p>\r\n<h3>Measurement-Assisted Electromagnetic Extraction of Interconnect Parameters on Low-Cost FR-4 Boards for 6-20 Gb/sec Applications</h3>\r\n<p>DesignCon 2009</p>\r\n<p>Y. Shlepnev<br />A. Neves<br />T. Dagostino<br />S. McMorrow</p>\r\n<p><strong>Abstract</strong><br />Design of interconnects on PCBs for 6-10 Gb/s data rates requires electromagnetic models from DC up to 20 GHz. Manufacturers of low-cost FR-4 PCBs typically provide values for dielectric constant and loss tangent either at one frequency or without specifying frequency value at all, that is not acceptable for the broad-band models. A simple and practical methodology to extract frequency-dependent dielectric parameters on the base of correlation of measurements and simulations is proposed. A board with 30 test structures has been built to validate the extraction methodology and to verify possibilities to predict interconnect parameters with the electromagnetic analysis.</p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2009_Measurement_Assisted_Extraction_DOC.pdf\">View or Download Paper</a></p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2009_Measurement_Assisted_Extraction_PPT.pdf\">View or Download PowerPoint Presentation</a></p>\r\n<h3>alibration and De-Embedding Techniques in the Frequency Domain</h3>\r\n<p>DesignCon 2009</p>\r\n<p>Tom Dagostino<br />Alfred Neves</p>\r\n<p><strong>Abstract</strong></p>\r\n<p><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/05/DesignCon2009_Calibrate_and_DeEmbed_PPT.pdf\">View or Download PowerPoint Presentation</a></p>','High-Speed Communications White Papers','','publish','open','open','','high-speed-communications-white-papers','','','2020-05-15 17:52:41','2020-05-16 00:52:41','',0,'https://testsite.wildrivertech.com/2020/05/15/high-speed-communications-white-papers/',1,'post','',0),(82,2,'2020-07-09 16:18:35','2020-07-09 23:18:35','<p>Our discussion will focus on PAM4 systems operating at 56Gb and beyond. Topics include: challenges of high-performance communications from SemiWiki. An overview of the test fixture design from Wild River Technology. Connectivity requirements from Samtec. Bringing it all together — high-performance SerDes and test fixture, from eSilicon.</p>\r\n<p><iframe src=\"https://www.youtube.com/embed/nJU66Z9D8kM\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"></iframe></p>','High-Performance Communications, Delivered','','publish','open','open','','high-performance-communications-delivered-webinar','','','2020-07-09 16:18:35','2020-07-09 23:18:35','',0,'https://testsite.wildrivertech.com/2020/07/09/high-performance-communications-delivered-webinar/',0,'post','',0),(83,2,'2020-09-09 17:42:51','2020-09-10 07:42:51','','simberian-logo-500pxW','','inherit','open','closed','','attachment-simberian-logo-500pxw','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',84,'https://testsite.wildrivertech.com/wp-content/uploads/2020/09/simberian-logo-500pxW.png',0,'attachment','image/png',0),(84,2,'2020-09-09 17:42:51','2020-09-10 00:42:51','<p> <img class=\" size-full wp-image-83\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/09/simberian-logo-500pxW.png\" alt=\"\" width=\"500\" height=\"165\" /></p>\r\n<h3>Simberian News</h3>\r\n<p>| September 9, 2020 |<br />New Simbeor 2021.01 is now available for customers and trials. It provides a huge boost to SI engineer productivity by substantially reducing interconnect model building time. Simbeor 3DML solver is accelerated by 50-100 times on most PCB/packaging problems. Here is a quote from a Simbeor customer who tried it for the first time — “It runs 9-14s/pt instead of 12-18mins/pt!!!!!!! Unbelievable!!!”</p>\r\n<p>It is hard to believe indeed — we had the same impression when we tested our Frontal Accelerator for the first time on <a title=\"Wild River Technology channel modeling platform\" href=\"index.php/si-test-fixtures/standard-channel-modeling-platform\" target=\"_blank\" rel=\"noopener noreferrer\">Wild River Technology’s CMP-28</a> and Infinera’s EvR-1 test platforms. EM model building for microstrip launch on CMP-28 took just 7 min instead of 360 min (over 50 times acceleration) and model for microstrip launch on EvR-1 took just 4 min instead of 290 min (over 70 times acceleration). All that with exactly the same accuracy confirmed with the measurements. CMP-28 and EvR-1 Kits with the measured data are available on request — give it a try and compare. <a title=\"Simbeor 2021.01 now available\" href=\"https://www.simberian.com/PressReleases/SimberianNews_Sept9_2020.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">More...</a></p>','New Simbeor 2021.01 is Now Available for Customers and Trials','','publish','open','open','','new-simbeor-2021-01-is-now-available-for-customers-and-trials','','','2020-09-09 17:42:51','2020-09-10 00:42:51','',0,'https://testsite.wildrivertech.com/2020/09/09/new-simbeor-2021-01-is-now-available-for-customers-and-trials/',4,'post','',0),(85,2,'2020-09-14 18:01:17','2020-09-15 08:01:17','','pcb-design-007-logo-194x80px','','inherit','open','closed','','attachment-pcb-design-007-logo-194x80px','','','2021-08-02 15:26:35','2021-08-02 22:26:35','',86,'https://testsite.wildrivertech.com/wp-content/uploads/2020/09/pcb-design-007-logo-194x80px.png',0,'attachment','image/png',0),(86,2,'2020-09-14 18:01:17','2020-09-15 01:01:17','<p><img class=\" size-full wp-image-85\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/09/pcb-design-007-logo-194x80px.png\" alt=\"\" width=\"194\" height=\"80\" />&nbsp;</p>\r\n<p>Design007 Magazine/PCBDesign007 | By Yuriy Shlepnev, Simberian | September 11, 2020 |</p>\r\n<article class=\"article\">\r\n<p>Simberian has released Simbeor 2021.01, which provides a huge boost of productivity for SI engineers by substantially reducing interconnect model building time. The Simbeor 3DML solver is accelerated by 50-100x on most of PCB/packaging problems.</p>\r\n<p>We tested our Frontal Accelerator first time on Wild River Technology’s CMP-28 and Infinera’s EvR-1 test platforms. Electromagnetic model building for microstrip launch on the CMP-28 took just seven minutes instead of 360 minutes (over 50x acceleration) and model for microstrip launch on EvR-1 took just four minutes instead of 290 minutes (over 70x acceleration). All of this is accomplished with exactly the same accuracy confirmed with the measurements. CMP-28 and EvR-1 Kits with the measured data are available on request. <a href=\"https://design.iconnect007.com/index.php/article/124422/simbeor-202101-cuts-model-building-time-from-hours-to-minutes/124425/?skin=design\" target=\"_blank\" rel=\"noopener noreferrer\" title=\"Simbeor 2021.01 Cuts Model-Building Time From Hours to Minutes\">More...</a></p>\r\n</article>','Simbeor 2021.01 Cuts Model-Building Time From Hours to Minutes','','publish','open','open','','simbeor-2021-01-cuts-model-building-time-from-hours-to-minutes','','','2020-09-14 18:01:17','2020-09-15 01:01:17','',0,'https://testsite.wildrivertech.com/2020/09/14/simbeor-2021-01-cuts-model-building-time-from-hours-to-minutes/',3,'post','',0),(87,2,'2020-11-05 17:13:23','2020-11-06 09:13:23','','isi 56 56g loss modeling platform','','inherit','open','closed','','attachment-isi-56-56g-loss-modeling-platform','','','2021-08-02 15:26:38','2021-08-02 22:26:38','',89,'https://testsite.wildrivertech.com/wp-content/uploads/2020/11/isi-56-56g-loss-modeling-platform.png',0,'attachment','image/png',0),(88,2,'2020-11-05 17:13:23','2020-11-06 01:13:23','','Graph of ISI-56 loss curves','','inherit','open','closed','','attachment-graph-of-isi-56-loss-curves','','','2021-08-02 15:26:38','2021-08-02 22:26:38','',89,'https://testsite.wildrivertech.com/wp-content/uploads/2020/11/isi-56-loss-curves.png',0,'attachment','image/png',0),(89,2,'2020-11-05 17:13:23','2020-11-06 01:13:23','<p><img class=\" alignright size-full wp-image-87\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/11/isi-56-56g-loss-modeling-platform.png\" alt=\"isi 56 56g loss modeling platform\" width=\"450\" height=\"461\" style=\"margin: 10px; float: right;\" /></p>\r\n<p><strong><span style=\"color: #993300;\">NEW</span> 56 Gbpsec Advanced SerDes Testing – Channel Optimization – Tolerance Testing</strong></p>\r\n<p>The ISI-56 represents the newest generation of Wild River Technology platforms with controlled amounts of intersymbol interference (ISI) for creating jitter to 56 Gbpsec. ISI-56 is the first loss modeling platform to meet the stringent requirements of the IEEE P370 specification, which addresses items such as recommended design of signal integrity test fixtures and methods and processes for ensuring the accuracy and consistency of measured data for signals with frequency content to 50 GHz. This test fixture meets the highest IEEE P370 Class A signal integrity requirements.</p>\r\n<p>True ISI is created by loss generated with pure dielectric and conductor losses only, with very low return loss. Group delay variation, an important loss consideration for data rates exceeding 32 Gbpsec, has been minimized with special layout techniques, pristine connector launch designs, and the use of controlled-weave laminate systems from Isola. The dynamic range of 65dB matches modern SerDes sensitivity performance.</p>\r\n<p><strong>Loss Curves, Clean Down to 60db: Wild River Technology ISI-56 Intersymbol Interference </strong><strong>Loss Modeling Platform</strong></p>\r\n<p>The Wild River Technology ISI platform is composed of nine microstrip and&nbsp;nine stripline differential pairs of various lengths.&nbsp;</p>\r\n<p><strong>Features</strong></p>\r\n<ul>\r\n<li>Loss from –5dB to –40dB at\r\n<p><strong><img class=\" alignright size-full wp-image-88\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/11/isi-56-loss-curves.png\" alt=\"Graph of ISI-56 loss curves\" width=\"457\" height=\"295\" style=\"float: right;\" /></strong></p>\r\n56 Gbpsec</li>\r\n<li>Causal/passive high-quality S-parameters included</li>\r\n<li>Full channel operating margin (COM) metrics provided</li>\r\n<li>Options for ultra-low-skew cables are available</li>\r\n<li>Superb signal integrity &lt;–20dB return loss</li>\r\n<li>Pristine launch design &lt;2ohm TDR</li>\r\n<li>Assembled with next-generation Samtec 2.4mm connectors</li>\r\n</ul>\r\n<p>More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>','ISI-56 - 56G Intersymbol Interference (ISI) Loss Modeling Platform','','publish','open','open','','56g-intersymbol-interference-isi-loss-modeling-platform','','','2020-11-05 17:13:23','2020-11-06 01:13:23','',0,'https://testsite.wildrivertech.com/2020/11/05/56g-intersymbol-interference-isi-loss-modeling-platform/',0,'post','',0),(90,2,'2020-11-30 17:47:26','2020-12-01 09:47:26','','wild-river-tech-intersymbol-interference-loss-modeling-platform-20201008-700pxW','','inherit','open','closed','','attachment-wild-river-tech-intersymbol-interference-loss-modeling-platform-20201008-700pxw','','','2021-08-02 15:26:39','2021-08-02 22:26:39','',91,'https://testsite.wildrivertech.com/wp-content/uploads/2020/12/wild-river-tech-intersymbol-interference-loss-modeling-platform-20201008-700pxW.png',0,'attachment','image/png',0),(91,2,'2020-11-30 17:47:26','2020-12-01 01:47:26','<h2><em>Intersymbol interference</em> <em>loss modeling platform meets top-tier IEEE P370 standard, expands Wild River Technology portfolio</em></h2>\r\n<p><strong>HILLSBORO, Ore. — December 1, 2020</strong> — Wild River Technology, the leading supplier of signal integrity measurement and optimization test fixtures for high-speed channels at data rates of up to 224G, announced today the availability of a new <a href=\"index.php/si-test-fixtures/56g-isi-loss-modeling-platform?utm_source=www&amp;utm_medium=pr&amp;utm_campaign=isi-56-launch-20201201\" target=\"_blank\" rel=\"noopener noreferrer\">56G intersymbol interference (ISI) loss modeling platform</a>. Dubbed ISI-56, the platform upgrades the current ISI-32 loss modeling platform from Wild River Technology with enhanced accuracy and modeling for SerDes channels operating at 56G. ISI-56 is the first loss modeling platform to meet the stringent requirements of the IEEE P370 specification, which addresses items such as recommended design of signal integrity test fixtures and methods and processes for ensuring the accuracy and consistency of measured data for signals with frequency content to 50 GHz. This test fixture meets the highest IEEE P370 Class A signal integrity requirements.</p>\r\n<p>ISI is a form of signal distortion in which one symbol, or data element, interferes with subsequent symbols. This interference creates very defined time-domain jitter. The platform delivers true ISI modeling with a clean insertion loss and industry-leading signal integrity. S-parameter models are provided to support simulation analysis from popular EDA vendor tools.</p>\r\n<p><img class=\" size-full wp-image-90\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2020/12/wild-river-tech-intersymbol-interference-loss-modeling-platform-20201008-700pxW.png\" alt=\"\" width=\"745\" height=\"295\" /></p>\r\n<h3><em>Loss curves, clean down to 60db: Wild River Technology ISI-56 intersymbol interference loss modeling platform.</em></h3>\r\n<p>The ISI-56 platform mimics a pure-loss backplane with very low return loss and no resonance due to material weave. The platform can be combined with Wild River Technology’s <a title=\"crosstalk agression modeling Wild River Technology\" href=\"index.php/si-test-fixtures/crosstalk-aggression-platform?utm_source=www&amp;utm_medium=pr&amp;utm_campaign=isi-56-launch-20201201\" target=\"_blank\" rel=\"noopener noreferrer\">XTALK-32</a> platform to establish crosstalk and/or return loss degradation. Designers can test the reach of SerDes devices with the ISI-56 platform and create a very accurate design of experiment (DOE) characterization. Both platforms, used in concert, are EDA friendly and include quality-tested, measured S-parameter models for also emulating a backplane channel. Wild River Technology also provides channel operating margin (COM) metrics for all serial link test platforms like the ISI-56.</p>\r\n<p>“Wild River Technology is all about supporting signal integrity experts with the best tools and models to optimize high-speed communication channels. The IEEE P370 specification, which I had a hand in developing, sets the bar very high,” said Al Neves, founder and chief technologist at Wild River Technology. “Meeting the demands of IEEE P370 isn’t easy. I have seen products from our competitors that miss the mark by a lot. Products like that serve no one. Wild River will always provide the highest quality signal integrity test tools and models to support the demands of high-performance channel design.”</p>\r\n<p>The ISI-56 platform is available now, along with S-parameter models, options for ultra-low skew cables, and full COM metrics. Contact <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a> for more information.</p>\r\n<p><strong>About Wild River Technology<br /></strong>Wild River Technology is the leading supplier of signal integrity measurement and optimization test fixtures for high-speed channels at data rates of 224G and below. Our channel modeling platforms, adapters, cables and measurement workspace products elevate signal integrity practices and methods. We are signal integrity experts – our mission is to support signal integrity practitioners with superior products and models. For more information, please visit <a title=\"Wild River Technology signal integrity tools\" href=\"?utm_source=www&amp;utm_medium=pr&amp;utm_campaign=isi-56-launch-20201201\" target=\"_blank\" rel=\"noopener noreferrer\">wildrivertech.com.</a></p>\r\n<p style=\"text-align: center;\"><strong><em>Wild River Technology – the tools of the signal integrity trade</em></strong></p>\r\n<p style=\"text-align: center;\"><strong><em>###</em></strong></p>','Wild River Technology Sets New Standard for 56G SerDes Characterization','','publish','open','open','','wild-river-technology-sets-new-standard-for-56g-serdes-characterization','','','2020-11-30 17:47:26','2020-12-01 01:47:26','',0,'https://testsite.wildrivertech.com/2020/11/30/wild-river-technology-sets-new-standard-for-56g-serdes-characterization/',2,'post','',0),(92,2,'2021-03-01 22:57:16','2021-03-02 14:57:16','','impedance','','inherit','open','closed','','attachment-impedance','','','2021-08-02 15:26:40','2021-08-02 22:26:40','',93,'https://testsite.wildrivertech.com/wp-content/uploads/2021/03/impedance.png',0,'attachment','image/png',0),(93,2,'2021-03-01 22:57:16','2021-03-02 06:57:16','<p><img class=\" size-full wp-image-92\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2021/03/impedance.png\" alt=\"\" width=\"700\" height=\"497\" /></p>\r\n<p>LAMSIM Enterprises Inc. | By Bert Simonovich | October 29, 2020</p>\r\n<p>Signal and power integrity (SI/PI) simulations, measurements and analysis usually live in two different worlds, but occasionally these worlds collide. One such collision occurs when we refer to characteristic impedance, Z0. Traditionally the PI world lives in the frequency domain while the SI world lives in the time domain.</p>\r\n<p>When designing a power distribution network (PDN) in the PI world, we are mostly interested in engineering a flat impedance below a target impedance from DC to the highest frequency components of the transient current. Practically this is achieved with a network of capacitors with different values connected to the respective power planes. <a href=\"https://lamsimenterprises.com/Characteristc%20Impedance-%20Where%20SI-PI%20Worlds%20Collide.pdf\" target=\"_blank\" rel=\"noopener noreferrer\" title=\"Characteristic Impedance Where SI/PI Worlds Collide\">More...</a></p>','Characteristic Impedance Where SI/PI Worlds Collide: White Paper','','publish','open','open','','characteristic-impedance-where-si-pi-worlds-collideissue-white-paper','','','2021-03-01 22:57:16','2021-03-02 06:57:16','',0,'https://testsite.wildrivertech.com/2021/03/01/characteristic-impedance-where-si-pi-worlds-collideissue-white-paper/',1,'post','',0),(94,2,'2021-05-06 18:46:33','2021-05-07 08:46:33','','Al Neves, CTO, Wild River Technology','Al Neves, CTO, Wild River Technology','inherit','open','closed','','attachment-al-neves-cto-wild-river-technology','','','2021-08-02 15:26:41','2021-08-02 22:26:41','',95,'https://testsite.wildrivertech.com/wp-content/uploads/2021/05/Al_Neves_wild-river-technology-serdes-test-300x320.jpg',0,'attachment','image/jpeg',0),(95,2,'2021-05-06 18:46:33','2021-05-07 01:46:33','<p><img class=\" size-full wp-image-94\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2021/05/Al_Neves_wild-river-technology-serdes-test-300x320.jpg\" alt=\"Al Neves, CTO, Wild River Technology\" title=\"Al Neves, CTO, Wild River Technology\" width=\"300\" height=\"286\" />&nbsp;</p>\r\n<p>Design007 Magazine/PCBDesign007 | By&nbsp;Andy Shaughnessy | February 2, 2021</p>\r\n<p>I recently spoke with Al Neves, founder and CTO of Wild River Technology, about the release of their new ISI-56 loss modeling platform. Al explains why it was so critical that this tool meets the stringent requirements of the IEEE P370 specification (which he helped develop), and why he believes this is currently the best tool for 56G and above SerDes testing and characterization. <a href=\"https://design.iconnect007.com/index.php/article/126236/wild-river-isi-56-platform-accelerates-serdes-testing/126239/?skin=design#126236\" target=\"_blank\" rel=\"noopener noreferrer\" title=\"Wild River ISI-56 Platform Accelerates SerDes Testing\">More...</a></p>','Wild River ISI-56 Platform Accelerates SerDes Testing','','publish','open','open','','wild-river-isi-56-platform-accelerates-serdes-testing','','','2021-05-06 18:46:33','2021-05-07 01:46:33','',0,'https://testsite.wildrivertech.com/2021/05/06/wild-river-isi-56-platform-accelerates-serdes-testing/',0,'post','',0),(96,2,'2021-06-30 14:19:47','2021-07-01 04:19:47','','ISI-USB4 loss modeling kit, a 10-56 Gbpsec Advanced SERDES Intersymbol Interference Loss modeling board set with matched cale sets.','EDA SIMULATION AND MEASUREMENT','inherit','open','closed','','attachment-isi-usb4-loss-modeling-kit-a-10-56-gbpsec-advanced-serdes-intersymbol-interference-loss-modeling-board-set-with-matched-cale-sets','','','2021-08-02 15:26:43','2021-08-02 22:26:43','',99,'https://testsite.wildrivertech.com/wp-content/uploads/2021/06/ISI-USB4-connected-to-test-equipment.jpg',0,'attachment','image/jpeg',0),(97,2,'2021-06-30 14:19:47','2021-06-30 21:19:47','','ISI-USB4 board set with case','','inherit','open','closed','','attachment-isi-usb4-board-set-with-case','','','2021-08-02 15:26:43','2021-08-02 22:26:43','',99,'https://testsite.wildrivertech.com/wp-content/uploads/2021/06/ISI-USB4-board-set-with-case.jpg',0,'attachment','image/jpeg',0),(98,2,'2021-06-30 14:19:47','2021-06-30 21:19:47','','Matched cable pairs, with s-parameter thumb drive','','inherit','open','closed','','attachment-matched-cable-pairs-with-s-parameter-thumb-drive','','','2021-08-02 15:26:43','2021-08-02 22:26:43','',99,'https://testsite.wildrivertech.com/wp-content/uploads/2021/06/ISI-USB4_matched_cable-set.jpg',0,'attachment','image/jpeg',0),(99,2,'2021-06-30 14:19:47','2021-06-30 21:19:47','<p><img class=\" alignright size-full wp-image-96\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2021/06/ISI-USB4-connected-to-test-equipment.jpg\" alt=\"ISI-USB4 loss modeling kit, a 10-56 Gbpsec Advanced SERDES Intersymbol Interference Loss modeling board set with matched cale sets.\" width=\"40%\" style=\"margin: 0 0 30px 50px;\" title=\"EDA SIMULATION AND MEASUREMENT\" align=\"right\" /><strong>ISI-USB4 Loss Modeling Kit - A 10-56 Gbpsec Advanced SERDES Intersymbol Interference Loss Platform</strong></p>\r\n<p>The ISI-USB4 represents the next generation of Wild River Technology platforms with controlled amounts of ISI for creating jitter to 56 Gbpsec NRZ and 112 Gbpsec PAM-3 and PAM-4. True Intersymbol Interference (ISI) is created by loss generated with dielectric and skin effect only. Group delay variation, an important loss consideration for data rates exceeding 25 Gbpsec, has been minimized with special layout techniques, pristine connector launches, and the use of controlled weave dielectric material.</p>\r\n<p>The ISI-USB4 Loss Modeling Kit is composed of 24 stripline differential pairs of various lengths. Ground vias surrounding each structure preserve jitter spectral purity by suppressing unwanted resonance. More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n<p>The ISI-USB4 has the following features:</p>\r\n<ul>\r\n<li data-mce-word-list=\"1\">Designed for DisplayPort 2.0 Sink and USB4 Rx Channel Calibration</li>\r\n</ul>\r\n<p>ISI-USB4 Test Fixture &amp; Cable Kit Includes:</p>\r\n<ul>\r\n<li data-mce-word-list=\"1\"><strong>24 Low Loss to High Loss Structures</strong>\r\n<ul>\r\n<li data-mce-word-list=\"1\">*IL = Varied 2-10 dB @ 5GHz and @10GHz</li>\r\n<li data-mce-word-list=\"1\">Very low return-loss -30dB at 10GHz</li>\r\n<li data-mce-word-list=\"1\">IEEE P370 Tier 1 Signal Integrity rated</li>\r\n</ul>\r\n</li>\r\n<li data-mce-word-list=\"1\"><strong>Matched Cable Pairs for Tx &amp; Rx Testing</strong>\r\n<ul>\r\n<li data-mce-word-list=\"1\">Set of two 1m &amp; two 0.5m Matched Pairs</li>\r\n<li data-mce-word-list=\"1\">*Phase matching less than ±5º @ 40 GHz (347femto-seconds!)</li>\r\n<li data-mce-word-list=\"1\"><strong>*</strong>Max IL to 10GHz &lt; 1.5dB</li>\r\n</ul>\r\n</li>\r\n</ul>\r\n<p>Applications:</p>\r\n<ul>\r\n<li data-mce-word-list=\"1\">SERDES Receiver Tolerance Testing</li>\r\n<li data-mce-word-list=\"1\">Communication Channel Optimization using DFE, FFE, CTLE, and Gain Stage Elements</li>\r\n<li data-mce-word-list=\"1\">Jitter Analysis and Benchmarking</li>\r\n<li data-mce-word-list=\"1\">Related Products — XTALK-56 (coming Spring 2022)</li>\r\n</ul>\r\n<p><strong><a href=\"images/product-pix/ISI-USB4/ISI-USB4-Datasheet-20210630.pdf\" title=\"ISI-USB4 Datasheet\">DOWNLOAD DATASHEET</a></strong></p>\r\n<p><img class=\" alignleft size-full wp-image-97\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2021/06/ISI-USB4-board-set-with-case.jpg\" alt=\"ISI-USB4 board set with case\" width=\"500\" height=\"375\" style=\"margin: 0px; float: left;\" /><img class=\" size-full wp-image-98\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2021/06/ISI-USB4_matched_cable-set.jpg\" alt=\"Matched cable pairs, with s-parameter thumb drive\" width=\"454\" height=\"375\" style=\"margin: 40px auto 10px; display: block;\" /></p>','ISI-USB4','','publish','open','open','','isi-usb4','','','2021-06-30 14:19:47','2021-06-30 21:19:47','',0,'https://testsite.wildrivertech.com/2021/06/30/isi-usb4/',0,'post','',0),(101,2,'2021-08-02 15:27:29','2021-08-02 22:27:29','<p><img class=\" alignright size-full wp-image-33\" src=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/XTALK-28-32-crosstalk-modeling-platform.png\" alt=\"Wild River Technology XTALK-28-32 crosstalk modeling platform\" width=\"40%\" style=\"margin: 0 0 30px 50px;\" align=\"right\" /><strong>Crosstalk Testing, Channel Optimization, Tolerance Testing: <br /></strong></p>\r\n<p style=\"margin: .1pt 0in .1pt 0in;\">This is an industry-first crosstalk testing platform consisting of a family of loss and insertion-crosstalk ratio (ICR) designed to challenge 6-32 Gbpsec systems and PAM-4, 56 Gbpsec. ICR is a basic measure of signal versus crosstalk energy (similar to signal/noise) and provides 50 (very low crosstalk) to 15 (very high crosstalk) for both 10&nbsp;Gbpsec and 28 Gbpsec systems. Crosstalk energy and victim loss can further be tuned with optional pad kit. Structures can be combined with other platforms or on-board structures using optional low-skew &lt;1 psec <a href=\"https://testsite.wildrivertech.com/2018/01/21/cable-assemblies/\" title=\"Wild River Technology matched cables\">matched cable kit. </a>More information: <a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></p>\r\n<p>Features</p>\r\n<ul>\r\n<li>Industry-first crosstalk channel modeling package for creating real crosstalk, not synthesized!</li>\r\n<li>Family of ICR for common compliance specifications 802.3, CEI, USB 3.0, 10GBase-KR, SAS3, PCI Express Gen3, 40GbE, 100GbE, 16XFC</li>\r\n<li>S-parameter library for pre-silicon analysis</li>\r\n<li>Clean-pure crosstalk with no signal integrity structure set included</li>\r\n<li>Crosstalk with -5 and -10dB return loss for mimicking problem backplanechannels</li>\r\n<li>Optional <a href=\"https://testsite.wildrivertech.com/2018/01/21/cable-assemblies/\" title=\"WRT skew-matched cable pairs\">Wild River Technology skew-matched cable pairs</a> to use with ISI-28/32 for adding loss</li>\r\n</ul>\r\n<p><strong><a href=\"https://testsite.wildrivertech.com/wp-content/uploads/2018/01/XTALK-32-Data-Brief_201512111.pdf\">DOWNLOAD DATASHEET</a></strong></p>','Crosstalk Channel Modeling Platform, 6-56 Gbpsec, XTALK-32','','inherit','closed','closed','','35-revision-v1','','','2021-08-02 15:27:29','2021-08-02 22:27:29','',35,'https://testsite.wildrivertech.com/?p=101',0,'revision','',0),(102,2,'2021-08-02 15:27:29','2021-08-02 22:27:29','<p>Technical experts from Samtec, eSilicon and Wild River Technology recently co-presented a webinar around the topic of High-Performance Communications, Delivered.</p>\r\n\n<!--more-->\n\r\n<h1><img src=\"https://3hp22p4vkie16x1dv48qurbo-wpengine.netdna-ssl.com/wp-content/uploads/2019/06/esilicon-wild-river-56g-serdes-eval-board-crop-700pxW-20190125.jpg\" alt=\"High-Performance Communc\" /></h1>\r\n<h3>High-Performance Communications, Delivered</h3>\r\n<p>The webinar highlighted technical challenges system designers and engineers face on the way to 56 Gbps/112 Gbps PAM 4 data rates. What are some of those challenges? Here was the agenda:</p>\r\n<ul>\r\n<li>The challenges of high-performance communications, introduction \r\n<ul>\r\n<li>Dan Nenni, SemiWiki</li>\r\n</ul>\r\n</li>\r\n<li>Designing a test board to deliver performance — the Apollo mission model\r\n<ul>\r\n<li>Al Neves, Wild River Technology</li>\r\n</ul>\r\n</li>\r\n<li>Delivering the required connectivity\r\n<ul>\r\n<li>Matt Burns, Samtec</li>\r\n</ul>\r\n</li>\r\n<li>Putting it all together with eSilicon SerDes\r\n<ul>\r\n<li>Tim Horel, eSilicon</li>\r\n</ul>\r\n</li>\r\n</ul>\r\n<p>For those unable to attend the webinar live, here is a <a title=\"High-Performance Communications, Delivered: Webinar Video Replay\" href=\"https://youtu.be/nJU66Z9D8kM\" target=\"_blank\" rel=\"noopener noreferrer\">link to the <em>High-Performance Communications, Delivered</em> webinar recording.</a></p>\r\n<h3>Whitepaper: Meeting the Demands of PAM4 Systems at 56Gbps and Beyond</h3>\r\n<p>The webinar was a great introduction to the topic. Are other information sources available as well?</p>\r\n<p>Yes. You can <a title=\"Link to Meeting the Demands of PAM4 Systems at 56Gbps and Beyond white paper\" href=\"https://testsite.wildrivertech.com/2020/05/15/high-speed-communications-white-papers/\">download a new white paper</a> entitled <em>Meeting the Demands of PAM4 Systems at 56Gbps and Beyond</em>. Co-authored by Samtec, eSilicon and Wild River Technology, it details the collaboration and results the partners achieved.</p>','WRT partners with eSilicon and Samtec on high-performance communications webinar','','inherit','closed','closed','','62-revision-v1','','','2021-08-02 15:27:29','2021-08-02 22:27:29','',62,'https://testsite.wildrivertech.com/?p=102',0,'revision','',0),(106,2,'2021-08-03 14:45:52','2021-08-03 21:45:52','[fusion_builder_container type=\"flex\" hundred_percent=\"no\" hundred_percent_height=\"no\" hundred_percent_height_scroll=\"no\" align_content=\"stretch\" flex_align_items=\"flex-start\" flex_justify_content=\"flex-start\" hundred_percent_height_center_content=\"yes\" equal_height_columns=\"no\" container_tag=\"div\" hide_on_mobile=\"small-visibility,medium-visibility,large-visibility\" status=\"published\" spacing_medium=\"\" spacing_small=\"\" padding_dimensions_medium=\"\" padding_dimensions_small=\"\" border_sizes=\"\" border_style=\"solid\" 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animation_offset=\"\" last=\"no\" border_position=\"all\"][fusion_text columns=\"\" column_min_width=\"\" column_spacing=\"\" rule_style=\"default\" rule_size=\"\" rule_color=\"\" font_size=\"\" line_height=\"\" letter_spacing=\"\" text_color=\"\" content_alignment_medium=\"\" content_alignment_small=\"\" content_alignment=\"\" animation_type=\"\" animation_direction=\"left\" animation_speed=\"0.3\" animation_offset=\"\" hide_on_mobile=\"small-visibility,medium-visibility,large-visibility\" sticky_display=\"normal,sticky\" class=\"\" id=\"\" fusion_font_variant_text_font=\"\" fusion_font_family_text_font=\"Irish Grover\"]<h1 style=\"text-align: center; font-family: Actor; font-weight: 400;\" data-fusion-font=\"true\" data-fusion-google-font=\"Actor\" data-fusion-google-variant=\"400\">DEMAND EXTREME SIGNAL INTEGRITY</h1>[/fusion_text][/fusion_builder_column][/fusion_builder_row][/fusion_builder_container]','Home','','publish','closed','closed','','home','','','2021-08-03 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animation_speed=\"0.3\" filter_hue=\"0\" filter_saturation=\"100\" filter_brightness=\"100\" filter_contrast=\"100\" filter_invert=\"0\" filter_sepia=\"0\" filter_opacity=\"100\" filter_blur=\"0\" filter_hue_hover=\"0\" filter_saturation_hover=\"100\" filter_brightness_hover=\"100\" filter_contrast_hover=\"100\" filter_invert_hover=\"0\" filter_sepia_hover=\"0\" filter_opacity_hover=\"100\" filter_blur_hover=\"0\"][fusion_builder_row][fusion_builder_column type=\"1_1\" align_self=\"auto\" content_layout=\"column\" align_content=\"flex-start\" valign_content=\"flex-start\" content_wrap=\"wrap\" spacing=\"\" center_content=\"no\" link=\"\" target=\"_self\" min_height=\"\" hide_on_mobile=\"small-visibility,medium-visibility,large-visibility\" sticky_display=\"normal,sticky\" class=\"\" id=\"\" type_medium=\"\" type_small=\"\" type=\"1_1\" order_medium=\"0\" order_small=\"0\" dimension_spacing_medium=\"\" dimension_spacing_small=\"\" dimension_spacing=\"\" dimension_margin_medium=\"\" dimension_margin_small=\"\" dimension_margin=\"\" padding_medium=\"\" padding_small=\"\" padding=\"\" hover_type=\"none\" border_sizes=\"\" border_color=\"\" border_style=\"solid\" border_radius=\"\" box_shadow=\"no\" dimension_box_shadow=\"\" box_shadow_blur=\"0\" box_shadow_spread=\"0\" box_shadow_color=\"\" box_shadow_style=\"\" background_type=\"single\" gradient_start_color=\"\" gradient_end_color=\"\" gradient_start_position=\"0\" gradient_end_position=\"100\" gradient_type=\"linear\" radial_direction=\"center center\" linear_angle=\"180\" background_color=\"\" background_image=\"\" background_image_id=\"\" background_position=\"left top\" background_repeat=\"no-repeat\" background_blend_mode=\"none\" render_logics=\"\" filter_type=\"regular\" filter_hue=\"0\" filter_saturation=\"100\" filter_brightness=\"100\" filter_contrast=\"100\" filter_invert=\"0\" filter_sepia=\"0\" filter_opacity=\"100\" filter_blur=\"0\" filter_hue_hover=\"0\" filter_saturation_hover=\"100\" filter_brightness_hover=\"100\" filter_contrast_hover=\"100\" filter_invert_hover=\"0\" filter_sepia_hover=\"0\" filter_opacity_hover=\"100\" filter_blur_hover=\"0\" animation_type=\"\" animation_direction=\"left\" animation_speed=\"0.3\" animation_offset=\"\" last=\"no\" border_position=\"all\"][fusion_text columns=\"\" column_min_width=\"\" column_spacing=\"\" rule_style=\"default\" rule_size=\"\" rule_color=\"\" font_size=\"\" line_height=\"\" letter_spacing=\"\" text_color=\"\" content_alignment_medium=\"\" content_alignment_small=\"\" content_alignment=\"\" animation_type=\"\" animation_direction=\"left\" animation_speed=\"0.3\" animation_offset=\"\" hide_on_mobile=\"small-visibility,medium-visibility,large-visibility\" sticky_display=\"normal,sticky\" class=\"\" id=\"\"]<h1 style=\"text-align: center;\">DEMAND EXTREME SIGNAL INTEGRITY</h1>[/fusion_text][/fusion_builder_column][/fusion_builder_row][/fusion_builder_container]','Home','','inherit','closed','closed','','106-revision-v1','','','2021-08-03 15:15:22','2021-08-03 22:15:22','',106,'https://testsite.wildrivertech.com/?p=109',0,'revision','',0),(110,2,'2021-08-03 15:17:19','2021-08-03 22:17:19','[fusion_builder_container type=\"flex\" hundred_percent=\"no\" hundred_percent_height=\"no\" hundred_percent_height_scroll=\"no\" align_content=\"stretch\" flex_align_items=\"flex-start\" flex_justify_content=\"flex-start\" hundred_percent_height_center_content=\"yes\" equal_height_columns=\"no\" container_tag=\"div\" hide_on_mobile=\"small-visibility,medium-visibility,large-visibility\" status=\"published\" spacing_medium=\"\" spacing_small=\"\" padding_dimensions_medium=\"\" padding_dimensions_small=\"\" border_sizes=\"\" border_style=\"solid\" box_shadow=\"no\" box_shadow_blur=\"0\" box_shadow_spread=\"0\" gradient_start_color=\"\" gradient_end_color=\"\" 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gradient_start_color=\"\" gradient_end_color=\"\" gradient_start_position=\"0\" gradient_end_position=\"100\" gradient_type=\"linear\" radial_direction=\"center center\" linear_angle=\"180\" background_color=\"\" background_image=\"\" background_image_id=\"\" background_position=\"left top\" background_repeat=\"no-repeat\" background_blend_mode=\"none\" render_logics=\"\" filter_type=\"regular\" filter_hue=\"0\" filter_saturation=\"100\" filter_brightness=\"100\" filter_contrast=\"100\" filter_invert=\"0\" filter_sepia=\"0\" filter_opacity=\"100\" filter_blur=\"0\" filter_hue_hover=\"0\" filter_saturation_hover=\"100\" filter_brightness_hover=\"100\" filter_contrast_hover=\"100\" filter_invert_hover=\"0\" filter_sepia_hover=\"0\" filter_opacity_hover=\"100\" filter_blur_hover=\"0\" animation_type=\"\" animation_direction=\"left\" animation_speed=\"0.3\" animation_offset=\"\" last=\"no\" border_position=\"all\"][fusion_text columns=\"\" column_min_width=\"\" column_spacing=\"\" rule_style=\"default\" rule_size=\"\" rule_color=\"\" font_size=\"\" line_height=\"\" letter_spacing=\"\" text_color=\"\" content_alignment_medium=\"\" content_alignment_small=\"\" content_alignment=\"\" animation_type=\"\" animation_direction=\"left\" animation_speed=\"0.3\" animation_offset=\"\" hide_on_mobile=\"small-visibility,medium-visibility,large-visibility\" sticky_display=\"normal,sticky\" class=\"\" id=\"\" fusion_font_variant_text_font=\"\" fusion_font_family_text_font=\"Irish Grover\"]<h1 style=\"text-align: center; font-family: Actor; font-weight: 400;\" data-fusion-font=\"true\" data-fusion-google-font=\"Actor\" data-fusion-google-variant=\"400\">DEMAND EXTREME SIGNAL INTEGRITY</h1>[/fusion_text][/fusion_builder_column][/fusion_builder_row][/fusion_builder_container]','Home','','inherit','closed','closed','','106-revision-v1','','','2021-08-03 15:17:19','2021-08-03 22:17:19','',106,'https://testsite.wildrivertech.com/?p=110',0,'revision','',0),(111,2,'2021-08-03 15:34:26','2021-08-03 22:34:26','Wild River Technology hermetically sealable matched cables are specifically designed for 10-32 Gbpsec jitter analysis. Skew matched to 1ps, these flexible cable assemblies have 2.92 mm male connectors (custom configurations available, contact WRT) and unmatched phase stability, which results in repeatable measurements of jitter. These U.S.-manufactured cables accomplish low return loss up to 40 GHz.\r\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\">\r\n\r\nThis cable utilizes a silver-plated copper conductor with a very low-loss expanded-PTFE dielectric. The shield consists of two conductive layers. The first layer is a silver-plated copper flat wire, applied to yield low contact resistance, resulting in low insertion loss. The second layer is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded FEP.\r\n\r\nEach cable is individually hand tested and comes with the measured s2p Touchstone file.\r\n\r\n<strong>WHAT YOU GET WITH YOUR ORDER</strong>\r\n<ul>\r\n 	<li>Cables</li>\r\n 	<li>UV curing lamp</li>\r\n 	<li>Loctite SI 5056 light cure adhesive</li>\r\n 	<li>Spudger tool (Used for removing sealant)</li>\r\n 	<li>Thumb drive. Contents:\r\n<ul>\r\n 	<li>Video on how to seal the cable connectors</li>\r\n 	<li>Full VNA measurement results</li>\r\n 	<li>Usage procedure for sealing the cable connectors</li>\r\n</ul>\r\n</li>\r\n 	<li>Printed Documents\r\n<ul>\r\n 	<li>Certificate of compliance</li>\r\n 	<li>Graphs of VNA results</li>\r\n 	<li>Usage procedure for sealing the cable connectors</li>\r\n</ul>\r\n</li>\r\n</ul>\r\nMore information: <span id=\"cloak2802c8361bcd95e7b3f1029a9f88ed31\"><a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></span>\r\n\r\n</div>','Skew Matched Flexible Cable Assembly Pairs with 2.92mm Male Connectors, Hermetically Seal-able','','publish','open','closed','','skew-matched-flexible-cable-assembly-pairs-with-2-92mm-male-connectors-hermetically-seal-able','','','2021-08-03 15:34:27','2021-08-03 22:34:27','',0,'https://testsite.wildrivertech.com/?post_type=product&#038;p=111',0,'product','',0),(112,2,'2021-08-03 16:27:56','2021-08-03 23:27:56','Wild River Technology hermetically sealable matched cables are specifically designed for 10-32 Gbpsec jitter analysis. Skew matched to 1ps, these flexible cable assemblies have 2.92 mm male connectors (custom configurations available, contact WRT) and unmatched phase stability, which results in repeatable measurements of jitter. These U.S.-manufactured cables accomplish low return loss up to 40 GHz.\n<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\">\n\nThis cable utilizes a silver-plated copper conductor with a very low-loss expanded-PTFE dielectric. The shield consists of two conductive layers. The first layer is a silver-plated copper flat wire, applied to yield low contact resistance, resulting in low insertion loss. The second layer is a silver-plated copper-braided shield that contributes to excellent RF leakage characteristics, specified at &gt; -100 dB to 18 GHz. The standard outside jacket is a tough, resin-melt, extruded FEP.\n\nEach cable is individually hand tested and comes with the measured s2p Touchstone file.\n\n<strong>WHAT YOU GET WITH YOUR ORDER</strong>\n<ul>\n 	<li>Cables</li>\n 	<li>UV curing lamp</li>\n 	<li>Loctite SI 5056 light cure adhesive</li>\n 	<li>Spudger tool (Used for removing sealant)</li>\n 	<li>Thumb drive. Contents:\n<ul>\n 	<li>Video on how to seal the cable connectors</li>\n 	<li>Full VNA measurement results</li>\n 	<li>Usage procedure for sealing the cable connectors</li>\n</ul>\n</li>\n 	<li>Printed Documents\n<ul>\n 	<li>Certificate of compliance</li>\n 	<li>Graphs of VNA results</li>\n 	<li>Usage procedure for sealing the cable connectors</li>\n</ul>\n</li>\n</ul>\nMore information: <span id=\"cloak2802c8361bcd95e7b3f1029a9f88ed31\"><a href=\"mailto:sales@wildrivertech.com\">sales@wildrivertech.com</a></span>\n\n</div>','Skew Matched Flexible Cable Assembly Pairs with 2.92mm Male Connectors, Hermetically Seal-able','<p><br data-mce-bogus=\"1\"></p>','inherit','closed','closed','','111-autosave-v1','','','2021-08-03 16:27:56','2021-08-03 23:27:56','',111,'https://testsite.wildrivertech.com/?p=112',0,'revision','',0),(113,0,'2021-08-03 16:30:33','2021-08-03 23:30:33','','woocommerce-placeholder','','inherit','','closed','','woocommerce-placeholder','','','2021-08-03 16:30:33','2021-08-03 23:30:33','',0,'https://testsite.wildrivertech.com/wp-content/uploads/2021/08/woocommerce-placeholder.png',0,'attachment','image/png',0),(114,0,'2021-08-03 16:30:33','2021-08-03 23:30:33','','woocommerce-placeholder','','inherit','','closed','','woocommerce-placeholder','','','2021-08-03 16:30:33','2021-08-03 23:30:33','',0,'https://testsite.wildrivertech.com/wp-content/uploads/2021/08/woocommerce-placeholder.png',0,'attachment','image/png',0),(115,2,'2021-08-03 16:30:35','2021-08-03 23:30:35','','woocommerce-placeholder','','inherit','','closed','','woocommerce-placeholder-2','','','2021-08-03 16:30:35','2021-08-03 23:30:35','',0,'https://testsite.wildrivertech.com/wp-content/uploads/2021/08/woocommerce-placeholder.png',0,'attachment','image/png',0),(116,1,'2021-08-03 16:30:35','2021-08-03 23:30:35','','Shop','','publish','closed','closed','','shop','','','2021-08-03 16:30:35','2021-08-03 23:30:35','',0,'https://testsite.wildrivertech.com/shop/',0,'page','',0),(117,1,'2021-08-03 16:30:36','2021-08-03 23:30:36','<!-- wp:shortcode -->[woocommerce_cart]<!-- /wp:shortcode -->','Cart','','publish','closed','closed','','cart','','','2021-08-03 16:30:36','2021-08-03 23:30:36','',0,'https://testsite.wildrivertech.com/?page_id=117',0,'page','',0),(118,1,'2021-08-03 23:30:36','2021-08-03 23:30:36','<!-- wp:shortcode -->[woocommerce_checkout]<!-- /wp:shortcode -->','Checkout','','publish','closed','closed','','checkout','','','2021-08-03 23:30:36','2021-08-03 23:30:36','',0,'/?page_id=118',0,'page','',0),(119,1,'2021-08-03 23:30:36','2021-08-03 23:30:36','<!-- wp:shortcode -->[woocommerce_my_account]<!-- /wp:shortcode -->','My account','','publish','closed','closed','','my-account','','','2021-08-03 23:30:36','2021-08-03 23:30:36','',0,'/?page_id=119',0,'page','',0),(120,2,'2021-08-03 16:30:36','2021-08-03 23:30:36','','woocommerce-placeholder','','inherit','','closed','','woocommerce-placeholder-3','','','2021-08-03 16:30:36','2021-08-03 23:30:36','',0,'https://testsite.wildrivertech.com/wp-content/uploads/2021/08/woocommerce-placeholder.png',0,'attachment','image/png',0),(121,0,'2021-08-03 16:30:47','2021-08-03 23:30:47','','woocommerce-placeholder','','inherit','','closed','','woocommerce-placeholder-4','','','2021-08-03 16:30:47','2021-08-03 23:30:47','',0,'https://testsite.wildrivertech.com/wp-content/uploads/2021/08/woocommerce-placeholder.png',0,'attachment','image/png',0),(122,0,'2021-08-03 16:30:47','2021-08-03 23:30:47','','woocommerce-placeholder','','inherit','','closed','','woocommerce-placeholder-5','','','2021-08-03 16:30:47','2021-08-03 23:30:47','',0,'https://testsite.wildrivertech.com/wp-content/uploads/2021/08/woocommerce-placeholder.png',0,'attachment','image/png',0),(123,2,'2022-02-01 16:24:57','0000-00-00 00:00:00','','Auto Draft','','auto-draft','open','open','','','','','2022-02-01 16:24:57','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?p=123',0,'post','',0),(124,1,'2022-02-01 16:28:13','2022-02-02 00:28:13','[mailpoet_page]','MailPoet Page','','publish','closed','closed','','subscriptions','','','2022-02-01 16:28:13','2022-02-02 00:28:13','',0,'https://testsite.wildrivertech.com/?p=124',0,'mailpoet_page','',0),(125,2,'2022-02-01 16:28:45','2022-02-02 00:28:45','','woocommerce-placeholder','','inherit','open','closed','','woocommerce-placeholder-6','','','2022-02-01 16:28:45','2022-02-02 00:28:45','',0,'https://testsite.wildrivertech.com/wp-content/uploads/2022/02/woocommerce-placeholder.png',0,'attachment','image/png',0),(126,1,'2022-02-01 16:31:03','0000-00-00 00:00:00','<!-- wp:paragraph -->\n<p><b>This is a sample page.</b></p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<h3>Overview</h3>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Our refund and returns policy lasts 30 days. If 30 days have passed since your purchase, we can’t offer you a full refund or exchange.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>To be eligible for a return, your item must be unused and in the same condition that you received it. It must also be in the original packaging.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Several types of goods are exempt from being returned. Perishable goods such as food, flowers, newspapers or magazines cannot be returned. We also do not accept products that are intimate or sanitary goods, hazardous materials, or flammable liquids or gases.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Additional non-returnable items:</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:list -->\n<ul>\n<li>Gift cards</li>\n<li>Downloadable software products</li>\n<li>Some health and personal care items</li>\n</ul>\n<!-- /wp:list -->\n\n<!-- wp:paragraph -->\n<p>To complete your return, we require a receipt or proof of purchase.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Please do not send your purchase back to the manufacturer.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>There are certain situations where only partial refunds are granted:</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:list -->\n<ul>\n<li>Book with obvious signs of use</li>\n<li>CD, DVD, VHS tape, software, video game, cassette tape, or vinyl record that has been opened.</li>\n<li>Any item not in its original condition, is damaged or missing parts for reasons not due to our error.</li>\n<li>Any item that is returned more than 30 days after delivery</li>\n</ul>\n<!-- /wp:list -->\n\n<!-- wp:paragraph -->\n<h2>Refunds</h2>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Once your return is received and inspected, we will send you an email to notify you that we have received your returned item. We will also notify you of the approval or rejection of your refund.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>If you are approved, then your refund will be processed, and a credit will automatically be applied to your credit card or original method of payment, within a certain amount of days.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<b>Late or missing refunds</b>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>If you haven’t received a refund yet, first check your bank account again.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Then contact your credit card company, it may take some time before your refund is officially posted.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Next contact your bank. There is often some processing time before a refund is posted.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>If you’ve done all of this and you still have not received your refund yet, please contact us at {email address}.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<b>Sale items</b>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Only regular priced items may be refunded. Sale items cannot be refunded.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<h2>Exchanges</h2>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>We only replace items if they are defective or damaged. If you need to exchange it for the same item, send us an email at {email address} and send your item to: {physical address}.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<h2>Gifts</h2>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>If the item was marked as a gift when purchased and shipped directly to you, you’ll receive a gift credit for the value of your return. Once the returned item is received, a gift certificate will be mailed to you.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>If the item wasn’t marked as a gift when purchased, or the gift giver had the order shipped to themselves to give to you later, we will send a refund to the gift giver and they will find out about your return.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<h2>Shipping returns</h2>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>To return your product, you should mail your product to: {physical address}.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>You will be responsible for paying for your own shipping costs for returning your item. Shipping costs are non-refundable. If you receive a refund, the cost of return shipping will be deducted from your refund.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Depending on where you live, the time it may take for your exchanged product to reach you may vary.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>If you are returning more expensive items, you may consider using a trackable shipping service or purchasing shipping insurance. We don’t guarantee that we will receive your returned item.</p>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<h2>Need help?</h2>\n<!-- /wp:paragraph -->\n\n<!-- wp:paragraph -->\n<p>Contact us at {email} for questions related to refunds and returns.</p>\n<!-- /wp:paragraph -->','Refund and Returns Policy','','draft','closed','closed','','refund_returns','','','2022-02-01 16:31:03','0000-00-00 00:00:00','',0,'https://testsite.wildrivertech.com/?page_id=126',0,'page','',0);

--
